Note:
The current devices marked XSE5126 have
the following limitations. The next silicon sampling early Q2 2025 resolves the
limitations:
Diode Emulation Mode (DEM) does not
work at light load.
- Boot refreshing does not function as
intended in DEM operation. Boot undervoltage event initiates low-side FET switching, but
boot switch blocks boot capacitor charging. Repeated boot undervoltage trigger may cause
VOUT runaway. Boot refreshing does not operate in DEM therfore device
cannot turn on the high-side switch at light load.
- DEM can only be used (activated) for
loads high enough so boot refresh is not needed (usually for IOUT >50mA).
- It is recommended to keep the device in
FPWM operation mode (MODE-pin = high).
High-side FET is not turning on for low
inductor peak currents
- For inductor peak currents between 1A
and about 5A (VOUT dependant) the high side FET does not turn on causing
higher losses.
- It is recommended to connect the
BIAS-pin to 5V. This narrows down the peak current range where the high-side FET does
not turn on.
- For efficiency measurements, it is
recommended to connect the BIAS-pin to ≥5V (e.g.VI ).
- For VI = 12V and
VOUT = 24V a load >1A is recommended to get valid efficiency
measurements.
- For VI = 12V and
VOUT = 48V a load >0.5A is recommended to get valid efficiency
measurements.
Automatic BIAS supply switchover
BIAS-pin to VOUT-pin is disabled.
- As a result BIAS-pin voltage must be
>4.5V.
Do not trigger thermal shutdown. Limit
device temperature to 150°C max.
- The device can get damaged when thermal
shutdown is triggered and a constant current load is applied. The device stops switching
at thermal shutdown causing VOUT to collapse to VI. The around
2.5V reverse conduction threshold of the high-side FET then generates significant losses
as the load is still applied. The high-side FET rapidly heats up and can get
damaged.
- It is recommended to evaluate the
device with assembled top-side heat sink only.
Do not trigger ICL latch feature as the
device behaves as described for thermal shutdown.
When VI is close to
VOUT (e.g. Bypass-Mode) a timing violation inside the device can
happen.
- When the device operates at min
tON a timing violation can cause the low-side FET to turn on but not off
for one cycle. This results in cross conduction for one cycle.
- It is recommended to avoid min
tON operation. The min. tON time should be >150ns.