JAJSF03K September   2011  – December 2023 LMK03806

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Requirements
    7. 5.7 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Differential Voltage Measurement Terminology
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagrams
    3. 7.3 Features Description
      1. 7.3.1 Serial MICROWIRE Timing Diagram and Terminology
      2. 7.3.2 Crystal Support With Buffered Outputs
      3. 7.3.3 Integrated Loop Filter Poles
      4. 7.3.4 Integrated VCO
      5. 7.3.5 Clock Distribution
        1. 7.3.5.1 CLKout DIvider
        2. 7.3.5.2 Programmable Output Type
        3. 7.3.5.3 Clock Output Synchronization
      6. 7.3.6 Default Start-Up Clocks
    4. 7.4 Device Functional Modes
    5. 7.5 Programming
      1. 7.5.1 General Information
        1. 7.5.1.1 Special Programming Case for R0 to R5 for CLKoutX_Y_DIV > 25
        2. 7.5.1.2 Recommended Initial Programming Sequence
        3. 7.5.1.3 READBACK
          1. 7.5.1.3.1 Readback Example
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Crystal Interface
      2. 8.1.2 Driving OSCin Pins With a Single-Ended Source
      3. 8.1.3 Driving OSCin Pins With a Differential Source
      4. 8.1.4 Frequency Planning With the LMK03806
      5. 8.1.5 Configuring the PLL
        1. 8.1.5.1 Example PLL Configuration
      6. 8.1.6 Digital Lock Detect
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Device Selection
          1. 8.2.2.1.1 Clock Architect
          2. 8.2.2.1.2 Clock Design Tool
          3. 8.2.2.1.3 Calculation Using LCM
        2. 8.2.2.2 Device Configuration
        3. 8.2.2.3 PLL Loop Filter Design
          1. 8.2.2.3.1 Example Loop Filter Design
        4. 8.2.2.4 Other Device Specific Configuration
          1. 8.2.2.4.1 Digital Lock Detect
        5. 8.2.2.5 Device Programming
      3. 8.2.3 Application Curves
    3. 8.3 System Examples
      1. 8.3.1 System Level Diagram
    4. 8.4 Best Design Practices
      1. 8.4.1 LVCMOS Complementary vs. Non-Complementary Operation
      2. 8.4.2 LVPECL Outputs
      3. 8.4.3 Sharing MICROWIRE (SPI) Lines
      4. 8.4.4 SYNC Pin
      5. 8.4.5 CLKout Vcc Pins
    5. 8.5 Power Supply Recommendations
      1. 8.5.1 Current Consumption and Power Dissipation Calculations
    6. 8.6 Layout
      1. 8.6.1 Layout Guidelines
      2. 8.6.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Development Support
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 ドキュメントの更新通知を受け取る方法
    4. 9.4 サポート・リソース
    5. 9.5 Trademarks
    6. 9.6 静電気放電に関する注意事項
    7. 9.7 用語集
  11. 10Register Maps
    1. 10.1  Default Device Register Settings After Power On Reset
    2. 10.2  Register R0 TO R5
      1. 10.2.1 CLKoutX_Y_PD, Powerdown CLKoutX_Y Output Path
      2. 10.2.2 RESET
      3. 10.2.3 POWERDOWN
      4. 10.2.4 CLKoutX_Y_DIV, Clock Output Divide
    3. 10.3  Registers R6 TO R8
      1. 10.3.1 CLKoutX_TYPE
    4. 10.4  REGISTER R9
    5. 10.5  REGISTER R10
      1. 10.5.1 OSCout1_TYPE, LVPECL Output Amplitude Control
      2. 10.5.2 OSCout0_TYPE
      3. 10.5.3 EN_OSCoutX, OSCout Output Enable
      4. 10.5.4 OSCoutX_MUX, Clock Output Mux
      5. 10.5.5 OSCout_DIV, Oscillator Output Divide
    6. 10.6  REGISTER R11
      1. 10.6.1 NO_SYNC_CLKoutX_Y
      2. 10.6.2 SYNC_POL_INV
      3. 10.6.3 SYNC_TYPE
      4. 10.6.4 EN_PLL_XTAL
    7. 10.7  REGISTER R12
      1. 10.7.1 LD_MUX
      2. 10.7.2 LD_TYPE
      3. 10.7.3 SYNC_PLL_DLD
    8. 10.8  REGISTER R13
      1. 10.8.1 READBACK_TYPE
      2. 10.8.2 GPout0
    9. 10.9  REGISTER 14
      1. 10.9.1 GPout1
    10. 10.10 REGISTER 16
    11. 10.11 REGISTER 24
      1. 10.11.1 PLL_C4_LF, PLL Integrated Loop Filter Component
      2. 10.11.2 PLL_C3_LF, PLL Integrated Loop Filter Component
      3. 10.11.3 PLL_R4_LF, PLL Integrated Loop Filter Component
      4. 10.11.4 PLL_R3_LF, PLL Integrated Loop Filter Component
    12. 10.12 REGISTER 26
      1. 10.12.1 EN_PLL_REF_2X, PLL Reference Frequency Doubler
      2. 10.12.2 PLL_CP_GAIN, PLL Charge Pump Current
      3. 10.12.3 PLL_DLD_CNT
    13. 10.13 REGISTER 28
      1. 10.13.1 PLL_R, PLL R Divider
    14. 10.14 REGISTER 29
      1. 10.14.1 OSCin_FREQ, PLL Oscillator Input Frequency Register
      2. 10.14.2 PLL_N_CAL, PLL N Calibration Divider
    15. 10.15 REGISTER 30
      1. 10.15.1 PLL_P, PLL N Prescaler Divider
      2. 10.15.2 PLL_N, PLL N Divider
    16. 10.16 REGISTER 31
      1. 10.16.1 READBACK_ADDR
      2. 10.16.2 uWire_LOCK
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

8.1.1 Crystal Interface

The LMK03806 has an integrated crystal oscillator circuit on that supports a fundamental mode, AT-cut crystal. The crystal interface is shown in Figure 8-1.

GUID-79DABB87-A810-4737-A688-0B126AB94A1E-low.gifFigure 8-1 Crystal Interface

The load capacitance (CL) is specific to the crystal, but usually on the order of 18 - 20 pF. While CL is specified for the crystal, the OSCin input capacitance (CIN = 6 pF typical) of the device and PCB stray capacitance (CSTRAY approximately 1 pF to 3 pF) can affect the discrete load capacitor values, C1 and C2.

For the parallel resonant circuit, the discrete capacitor values can be calculated as follows:

Equation 1. CL = (C1 × C2) / (C1 + C2) + CIN + CSTRAY

Typically, C1 = C2 for optimum symmetry, so Equation 1 can be rewritten in terms of C1 only:

Equation 2. CL = C12 / (2 × C1) + CIN + CSTRAY

Finally, solve for C1:

Equation 3. C1 = (CL – CIN – CSTRAY) × 2

Electrical Characteristics provides crystal interface specifications with conditions that ensure start-up of the crystal, but it does not specify crystal power dissipation. The designer will need to ensure the crystal power dissipation does not exceed the maximum drive level specified by the crystal manufacturer. Overdriving the crystal can cause premature aging, frequency shift, and eventual failure. Drive level should be held at a sufficient level necessary to start-up and maintain steady-state operation.

The power dissipated in the crystal, PXTAL, can be computed by:

Equation 4. PXTAL = IRMS2 × RESR × (1 + C0/CL)2

where

  • IRMS is the RMS current through the crystal.
  • RESR is the maximum equivalent series resistance specified for the crystal
  • CL is the load capacitance specified for the crystal
  • C0 is the minimum shunt capacitance specified for the crystal

IRMS can be measured using a current probe (for example, Tektronix CT-6 or equivalent) placed on the leg of the crystal connected to OSCin* with the oscillation circuit active.

As shown in Figure 8-1, an external resistor, RLIM, can be used to limit the crystal drive level, if necessary. If the power dissipated in the selected crystal is higher than the drive level specified for the crystal with RLIM shorted, then a larger resistor value is mandatory to avoid overdriving the crystal. However, if the power dissipated in the crystal is less than the drive level with RLIM shorted, then a zero value for RLIM can be used. As a starting point, a suggested value for RLIM is 1.5 kΩ.