Figure 7-1 LVDS Output DC Configuration During Device Test
Figure 7-2 LVDS Output AC Configuration During Device Test
Figure 7-3 DC-Coupled LVCMOS Input During Device Test
Figure 7-4 Output Voltage and Rise/Fall Time
Output skew is calculated as the greater of the following: the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn (n = 0, 1, 2, ..7)
Part-to-part skew is calculated as the greater of the following: the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn across multiple devices (n = 0, 1, 2, ..7)