SNOSCX0A June 2013 – December 2014 LMP92064
PRODUCTION DATA.
MIN | MAX | UNIT | ||
---|---|---|---|---|
Analog Supply Voltage (VDD) | –0.3 | 6.0 | V | |
Digital Supply Voltage (VDIG) | VDD-0.3 | VDD+0.3 | ||
Voltage at Input Pins(3) | –0.3 | VDD+0.3 | V | |
Junction Temperature | 150 | °C | ||
Mounting temperature | Infrared or convection (20 sec) | 260 | °C | |
Storage temperature, Tstg | −65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1000 |
MIN | MAX | UNIT | ||
---|---|---|---|---|
Analog Supply Voltage (VDD) | 4.5 | 5.5 | V | |
Digital Supply Voltage (VDIG) | VDD | VDD | V | |
Temperature Range | –40 | 105 | ºC |
THERMAL METRIC(1) | LMP92064 | UNIT | |
---|---|---|---|
NHR | |||
16 PINS | |||
RθJA | Package thermal resistance(2) | 44 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
CURRENT SENSE INPUT CHANNEL | ||||||
VOS | Input-referred Offset Voltage | ±15 | μV | |||
Temperature extremes | -60 | 60 | ||||
TCVOS | Input-referred Offset Voltage Drift | ±280 | nV/ºC | |||
Long-term Stability | 0.3 | μV/mo | ||||
Resolution | 12 20 |
Bits μV |
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INL | Integral Non-Linearity Error | ±1% ±0.025% |
LSB |
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DNL | Differential Non-Linearity Error | ±0.5 | LSB | |||
DC CMRR | Common-Mode Rejection Ratio | –0.2 V ≤ VCM ≤ 2 V | 110 | dB | ||
DC PSRR | Power Supply Rejection Ratio | 4.5 V ≤ VDD ≤ 5.5 V | 100 | dB | ||
CMVR | Common-Mode Voltage Range | Low VCM | –0.2 | V | ||
High VCM | 2 | |||||
VDIFF(MAX) | Maximum Differential Input Voltage Range | 75 | mV | |||
AV | Current Shunt Amplifier Gain | 25 | V/V | |||
Current Sense Channel Gain | 50 | kCode/V | ||||
GE | Gain Error (CSA, VREF and ADC) | Temperature extremes | -0.75% | 0.75 % | ||
GD | Gain Drift | ±25 | ppm/°C | |||
RIN | Input Impedance | 100 | GΩ | |||
BW | –3dB Bandwidth | 70 | kHz | |||
VOLTAGE INPUT CHANNEL | ||||||
Offset Error (Buffer and ADC) | Temperature extremes | -2 | 2 | mV | ||
Resolution | 12 | Bits | ||||
INL | Integral Non-Linearity Error | ±1% ±0.025% |
LSB |
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DC PSRR | Power Supply Rejection Ratio | 70 | dB | |||
VCHVP | Full-Scale Input Voltage | 2.048 | V | |||
AV | Buffer Amplifier Gain | 1 | V/V | |||
Voltage Sense Channel Gain | 2 | kCode/V | ||||
GE | Gain Error (Buffer, VREF and ADC) | Temperature extremes | -0.75% | 0.75 % | ||
RIN | Input Impedance | 100 | GΩ | |||
BW | Bandwidth(1) | 100 | kHz | |||
DIGITAL INPUT/OUTPUT CHARACTERISTICS | ||||||
VIH | Logical “1” Input Voltage | Temperature extreme | 0.7*VDIG | V | ||
VIL | Logical “0” Input Voltage | Temperature extreme | 0.3*VDIG | V | ||
VOH | Logical “1” Output Voltage | ISOURCE = 300 μA | V | |||
Temperature extreme | VDIG –0.15 |
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VOL | Logical “0” Output Voltage | ISINK = 300 μA | V | |||
Temperature extreme | DGND +0.15 |
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SUPPLY CHARACTERISTICS | ||||||
IVDD | Analog Supply Current | 11 | mA | |||
IVDIG | Digital Supply Current | 2 | mA |
MIN | MAX | UNIT | ||
---|---|---|---|---|
tDS | SDI to SCLK rising edge setup time | 10 | ns | |
tDH | SCLK rising edge to SDI hold time | 10 | ns | |
fCLK | Frequency of SCLK | 100 | Hz | |
20 | MHz | |||
tHIGH | High width of SPI clock | 25 | ns | |
tLOW | Low width of SPI clock | 25 | ns | |
tS | CSB falling edge to SCLK rising edge setup time | 10 | ns | |
tC | SCLK rising edge to CSB rising edge hold time | 30 | ns | |
tDV | SCLK falling edge to valid SDO readback data | 20 | ns | |
tRST | Reset pin pulse width | 3.5 | ns | |
tCONV | Conversion rate of all channels | 125 | kSps |