SLAS508K April 2006 – May 2020 MSP430FG4616 , MSP430FG4617 , MSP430FG4618 , MSP430FG4619
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | VCC | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|---|
EI | Integral linearity error | 1.4 V ≤ (VeREF+ – VREF–/VeREF–) min ≤ 1.6 V | 2.2 V, 3 V | ±2 | LSB | ||
1.6 V < (VeREF+ – VREF–/VeREF–) min ≤ [VAVCC] | ±1.7 | ||||||
ED | Differential linearity error | (VeREF+ – VREF–/VeREF–) min ≤ (VeREF+ – VREF–/VeREF–),
CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±1 | LSB | ||
EO | Offset error | (VeREF+ – VREF–/VeREF–) min ≤ (VeREF+ – VREF–/VeREF–),
Internal impedance of source RS < 100 Ω, CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±2 | ±4 | LSB | |
EG | Gain error | (VeREF+ – VREF–/VeREF–)min ≤ (VeREF+ – VREF–/VeREF–),
CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±1.1 | ±2 | LSB | |
ET | Total unadjusted error | (VeREF+ -– VREF–/VeREF– )min ≤ (VeREF+ –VREF–/VeREF–),
CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±2 | ±5 | LSB |