2 改訂履歴
リビジョン D からリビジョン E への変更点
Changes from August 29, 2018 to December 9, 2019
- Updated Section 3.1, Related ProductsGo
- Changed the note that begins "Supply voltage changes faster than 0.2 V/µs can trigger a BOR reset..." in Section 5.3, Recommended Operating ConditionsGo
- Added the note that begins "TI recommends that power to the DVCC pin must not exceed the limits..." in Section 5.3, Recommended Operating ConditionsGo
- Changed the note that begins "A capacitor tolerance of ±20% or better is required..." in Section 5.3, Recommended Operating ConditionsGo
- Corrected "SVS Enabled" test condition on Figure 5-2, LPM3.5 Supply Current vs TemperatureGo
- Added the note "See MSP430 32-kHz Crystal Oscillators for details on crystal section, layout, and testing" to Table 5-3, XT1 Crystal Oscillator (Low Frequency)Go
- Changed the note that begins "Requires external capacitors at both terminals..." in Table 5-3, XT1 Crystal Oscillator (Low Frequency)Go
- Changed the parameter symbol from RI to RI,MUX in Table 5-20, ADC, Power Supply and Input Range ConditionsGo
- Corrected the test conditions for the RI,MUX parameter in Table 5-20, ADC, Power Supply and Input Range ConditionsGo
- Added RI,Misc TYP value of 34 kΩ in Table 5-20, ADC, Power Supply and Input Range ConditionsGo
- Added formula for RI in Table 5-21, ADC, 10-Bit Timing ParametersGo
- Added the note that begins "tSample = ln(2n+1) × τ ..." in Table 5-21, ADC, 10-Bit Timing ParametersGo
- Corrected bitfield from RTCCLK to RTCCKSEL in Table 6-8, Clock DistributionGo
- Corrected bitfield from IRDSEL to IRDSSEL in Section 6.11.8, Timers (Timer0_B3, Timer1_B3) , in the description that starts "The interconnection of Timer0_B3 and ..."Go
- Added P1SELC information in Table 6-31, Port P1, P2 Registers (Base Address: 0200h)Go
- Added P2SELC information in Table 6-31, Port P1, P2 Registers (Base Address: 0200h)Go
- Added note to "ADC calibration" in Table 6-46, Device DescriptorsGo
Changes from September 12, 2017 to August 28, 2018
- Updated Section 3.1, Related ProductsGo
- Added note to VSVSH- and VSVSH+ parameters in Table 5-1, PMM, SVS and BORGo
- Corrected ADCINCHx column heading in Table 6-16, ADC Channel ConnectionsGo
- Section 8.2「デバイスの項目表記」のテキストおよび図を更新Go
Changes from June 1, 2016 to September 11, 2017
- 特長の項目「シャットダウン (LPM4.5)」の電流を訂正Go
- テスト・データに基づき低リーク電流入力を 50pA から 5pA に改善Go
- Added Section 3.1, Related ProductsGo
- Removed ADCDIV from the formula for the TYP value in the second row of the tCONVERT parameter in Table 5-21, ADC, 10-Bit Timing Parameters (removed because ADCCLK is after division)Go
- Changed the entries for eUSCI_A0 and eUSCI_B0 in the LPM3 column from Off to Optional in Table 6-1, Operating ModesGo
- Added the sentence that begins "This device supports blank device detection..." in Section 6.6, Bootloader (BSL)Go
- Added the note "Controlled by the RTCCLK bit in the SYSCFG2 register" on Table 6-8, Clock DistributionGo
- Added Figure 6-1, Clock Distribution Block DiagramGo
- Added Figure 6-2, Timer_B ConnectionsGo
- Removed SYSBERRIV register (not supported) in Table 6-26, SYS RegistersGo
- Changed from "If the RST/NMI pin is unused...with a 2.2-nF pulldown capacitor" to "If the RST/NMI pin is unused...with a 10-nF pulldown capacitor"Go
Changes from March 30, 2016 to May 31, 2016
- デバイスのステータスを「製品プレビュー」から「量産データ」に変更 Go
- Changed the value of fXT1 in the table note that starts "Low-power mode 4, VLO,..."Go
- Added Test Conditions to module Timer_B in Section 5.10, Typical Characteristics – Current Consumption Per ModuleGo
- Added "16 MHz" to the parameter description of tFLL, lock in Table 5-5, DCO FLLGo
- Removed ±3℃ from calibration temperatures in the table note that starts "The device descriptor structure contains calibration values..."Go
- Changed the unit on the ENI parameter in Table 5-24, SAC0 (SAC-L1, OA)Go
- Changed the unit on the ENI parameter in Table 5-25, TIA0Go
Changes from February 23, 2016 to March 29, 2016
- ドキュメント全体で、TIAモジュールの名称をTRI0からTIA0に変更Go
- Changed TYP values for the IAM, FRAM(0%) parameter in Section 5.4, Active Mode Supply Current Into VCC Excluding External CurrentGo
- Changed MAX values of the tVALID,SO parameter in Table 5-18, eUSCI (SPI Slave Mode) Switching CharacteristicsGo
- Changed the TYP value of the CMRR parameter with Test Conditions of "TRIPM = 0" from 70 dB to 80 dB in Table 5-25, TIA0Go
- Changed the TYP value of the PSRR parameter with Test Conditions of "TRIPM = 0" from 70 dB to 80 dB in Table 5-25, TIA0Go
- 以前の「開発ツールのサポート」セクションを、Section 8.3「ツールとソフトウェア」に置き換えGo