JAJSG08E November 2015 – December 2019 MSP430FR2532 , MSP430FR2533 , MSP430FR2632 , MSP430FR2633
PRODUCTION DATA.
Table 6-21 lists the Device IDs of the devices. Table 6-22 lists the contents of the device descriptor tag-length-value (TLV) structure for the devices.
DEVICE | DEVICE ID | |
---|---|---|
1A05h | 1A04h | |
MSP430FR2633 | 82h | 3Ch |
MSP430FR2533 | 82h | 3Dh |
MSP430FR2632 | 82h | 3Eh |
MSP430FR2532 | 82h | 3Fh |
DESCRIPTION | MSP430FR2633, MSP430FR2632, MSP430FR2533, MSP430FR2532 | ||
---|---|---|---|
ADDRESS | VALUE | ||
Information Block | Info length | 1A00h | 06h |
CRC length | 1A01h | 06h | |
CRC value(1) | 1A02h | Per unit | |
1A03h | Per unit | ||
Device ID | 1A04h | See Table 6-21. | |
1A05h | |||
Hardware revision | 1A06h | Per unit | |
Firmware revision | 1A07h | Per unit | |
Die Record | Die record tag | 1A08h | 08h |
Die record length | 1A09h | 0Ah | |
Lot wafer ID | 1A0Ah | Per unit | |
1A0Bh | Per unit | ||
1A0Ch | Per unit | ||
1A0Dh | Per unit | ||
Die X position | 1A0Eh | Per unit | |
1A0Fh | Per unit | ||
Die Y position | 1A10h | Per unit | |
1A11h | Per unit | ||
Test result | 1A12h | Per unit | |
1A13h | Per unit | ||
ADC Calibration | ADC calibration tag | 1A14h | Per unit |
ADC calibration length | 1A15h | Per unit | |
ADC gain factor | 1A16h | Per unit | |
1A17h | Per unit | ||
ADC offset | 1A18h | Per unit | |
1A19h | Per unit | ||
ADC 1.5-V reference temperature 30°C | 1A1Ah | Per unit | |
1A1Bh | Per unit | ||
ADC 1.5-V reference temperature 85°C | 1A1Ch | Per unit | |
1A1Dh | Per unit | ||
Reference and DCO Calibration | Calibration tag | 1A1Eh | 12h |
Calibration length | 1A1Fh | 04h | |
1.5-V reference factor | 1A20h | Per unit | |
1A21h | Per unit | ||
DCO tap setting for 16 MHz, temperature 30°C(2) | 1A22h | Per unit | |
1A23h | Per unit |