JAJSFD0C September 2014 – March 2021
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | VCC | MIN | MAX | UNIT | |
---|---|---|---|---|---|---|
tSTE,LEAD | STE lead time, STE active to clock | UCSTEM = 1, UCMODEx = 01 or 10 | 2.2 V, 3 V | 150 | ns | |
tSTE,LAG | STE lag time, Last clock to STE inactive | UCSTEM = 1, UCMODEx = 01 or 10 | 2.2 V, 3 V | 200 | ns | |
tSTE,ACC | STE access time, STE active to SIMO data out | UCSTEM = 0, UCMODEx = 01 or 10 | 2.2 V | 40 | ns | |
3 V | 30 | |||||
tSTE,DIS | STE disable time, STE inactive to SIMO high impedance | UCSTEM = 0, UCMODEx = 01 or 10 | 2.2 V | 40 | ns | |
3 V | 30 | |||||
tSU,MI | SOMI input data setup time | 2.2 V | 50 | ns | ||
3 V | 30 | |||||
tHD,MI | SOMI input data hold time | 2.2 V, 3 V | 0 | ns | ||
tVALID,MO | SIMO output data valid time(2) | UCLK edge to SIMO valid, CL = 20 pF | 2.2 V | 7 | ns | |
3 V | 5 | |||||
tHD,MO | SIMO output data hold time(3) | CL = 20 pF | 2.2 V, 3 V | 0 | ns |