SBOS850 December   2017 OPA192-Q1 , OPA2192-Q1

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information: OPA192-Q1
    5. 6.5 Thermal Information: OPA2192-Q1
    6. 6.6 Electrical Characteristics: VS = ±4 V to ±18 V (VS = 8 V to 36 V)
    7. 6.7 Electrical Characteristics: VS = ±2.25 V to ±4 V (VS = 4.5 V to 8 V)
    8. 6.8 Typical Characteristics
    9. 6.9 Typical Characteristics
  7. Parameter Measurement Information
    1. 7.1 Input Offset Voltage Drift
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Input Protection Circuitry
      2. 8.3.2 EMI Rejection
      3. 8.3.3 Phase Reversal Protection
      4. 8.3.4 Thermal Protection
      5. 8.3.5 Capacitive Load and Stability
      6. 8.3.6 Common-Mode Voltage Range
      7. 8.3.7 Electrical Overstress
      8. 8.3.8 Overload Recovery
    4. 8.4 Device Functional Modes
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 16-Bit Precision Multiplexed Data-Acquisition System
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curve
      2. 9.2.2 Slew Rate Limit for Input Protection
      3. 9.2.3 Precision Reference Buffer
  10. 10Power-Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Development Support
        1. 12.1.1.1 TINA-TI (Free Software Download)
        2. 12.1.1.2 TI Precision Designs
    2. 12.2 Related Links
    3. 12.3 Receiving Notification of Documentation Updates
    4. 12.4 Community Resources
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Parameter Measurement Information

Input Offset Voltage Drift

The OPAx192-Q1 family of operational amplifiers is manufactured using TI’s e-trim technology. Each amplifier input offset voltage and input offset voltage drift is trimmed in production, thereby minimizing errors associated with input offset voltage and input offset voltage drift. The e-trim technology is a TI proprietary method of trimming internal device parameters during either wafer probing or final testing. When trimming input offset voltage drift the systematic or linear drift error on each device is trimmed to zero. This results in the remaining errors associated with input offset drift are minimal and are the result from only nonlinear error sources. Figure 47 illustrates this concept.

OPA192-Q1 OPA2192-Q1 D002_SBOS620.gif Figure 47. Input Offset Before and After Drift Trim

Figure 48 shows six typical units.

OPA192-Q1 OPA2192-Q1 C039_OT.png Figure 48. Input Offset Voltage Drift vs Temperature for Six Typical Units