JAJS198L October   2006  – January 2020 OPA211

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      入力電圧ノイズ密度と周波数との関係
  4. 4 改訂履歴
  5. 5 概要（続き）
  6. 6 Pin Configuration and Functions
    1.     Pin Functions: OPA211
    2.     Pin Functions: OPA2211
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information: OPA211 and OPA211A
    5. 7.5 Thermal Information: OPA2211 and OPA2211A
    6. 7.6 Electrical Characteristics: Standard Grade OPAx211A
    7. 7.7 Electrical Characteristics: High-Grade OPAx211
    8. 7.8 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Total Harmonic Distortion Measurements
    4. 8.4 Device Functional Modes
      1. 8.4.1 Shutdown
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Operating Voltage
      2. 9.1.2 Input Protection
      3. 9.1.3 Noise Performance
      4. 9.1.4 Basic Noise Calculations
      5. 9.1.5 EMI Rejection
      6. 9.1.6 EMIRR +IN Test Configuration
      7. 9.1.7 Electrical Overstress
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 SON Layout Guidelines
    2. 11.2 Layout Example
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 デバイス・サポート
      1. 12.1.1 開発サポート
        1. 12.1.1.1 TINA-TI™ (無料のダウンロード・ソフトウェア)
        2. 12.1.1.2 TI Precision Designs
        3. 12.1.1.3 WEBENCH® Filter Designer
    2. 12.2 ドキュメントのサポート
      1. 12.2.1 関連資料
    3. 12.3 関連リンク
    4. 12.4 ドキュメントの更新通知を受け取る方法
    5. 12.5 サポート・リソース
    6. 12.6 商標
    7. 12.7 静電気放電に関する注意事項
    8. 12.8 Glossary
  13. 13メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

9.1.6 EMIRR +IN Test Configuration

Figure 47shows the circuit configuration for testing the EMIRR IN+. An RF source is connected to the operational amplifier noninverting input terminal using a transmission line. The operational amplifier is configured in a unity-gain buffer topology with the output connected to a low-pass filter (LPF) and a digital multimeter (DMM).

NOTE

A large impedance mismatch at the operational amplifier input causes a voltage reflection; however, this effect is characterized and accounted for when determining the EMIRR IN+. The resulting DC offset voltage is sampled and measured by the multimeter.

The LPF isolates the multimeter from residual RF signals that may interfere with multimeter accuracy.

OPA211 OPA2211 EMIRR_Test_CKT_SBOS079.gifFigure 47. EMIRR +IN Test Configuration