SLLS753E February   2007  – September 2016 SN65HVD1040-Q1

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Description (continued)
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics: Supply Current
    6. 7.6  Electrical Characteristics: Driver
    7. 7.7  Electrical Characteristics: Receiver
    8. 7.8  Switching Characteristics: Device
    9. 7.9  Switching Characteristics: Driver
    10. 7.10 Switching Characteristics: Receiver
    11. 7.11 STB Pin Characteristics
    12. 7.12 SPLIT Pin Characteristics
    13. 7.13 Typical Characteristics
  8. 8 Parameter Measurement Information
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Mode Control
        1. 9.3.1.1 High-Speed Mode
        2. 9.3.1.2 Low-Power Mode
      2. 9.3.2 Dominant State Time-Out
      3. 9.3.3 Thermal Shutdown
      4. 9.3.4 SPLIT
      5. 9.3.5 Operating Temperature Range
    4. 9.4 Device Functional Modes
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 CAN Nodes Using Common-Mode Chokes
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
        1. 10.2.1.1 Bus Loading, Length, and Number of Nodes
        2. 10.2.1.2 CAN Termination
        3. 10.2.1.3 Loop Propagation Delay
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 CAN Basics
          1. 10.2.2.1.1 Differential Signal
          2. 10.2.2.1.2 Common-Mode Signal
          3. 10.2.2.1.3 ESD Protection
          4. 10.2.2.1.4 Transient Voltage Suppresser (TVS) Diodes
      3. 10.2.3 Application Curve
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Receiving Notification of Documentation Updates
    2. 13.2 Community Resources
    3. 13.3 Trademarks
    4. 13.4 Electrostatic Discharge Caution
    5. 13.5 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ（パッケージ｜ピン）
  • D|8
サーマルパッド・メカニカル・データ
発注情報

8 Parameter Measurement Information

SN65HVD1040-Q1 dvr_tst_lls753.gif Figure 11. Driver Voltage, Current, and Test Definition
SN65HVD1040-Q1 bus_log_lls753.gif Figure 12. Bus Logic-State Voltage Definitions
SN65HVD1040-Q1 vod_tst_lls753.gif Figure 13. Driver VOD Test Circuit
SN65HVD1040-Q1 drv_tst_wf_lls753.gif Figure 14. Driver Test Circuit and Voltage Waveforms
SN65HVD1040-Q1 rx_v_cd_lls753.gif Figure 15. Receiver Voltage and Current Definitions
SN65HVD1040-Q1 rx_tst_cx_waves_lls753.gif
A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 125 kHz, 50% duty cycle, tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.
B. CL includes instrumentation and fixture capacitance within ±20%.
Figure 16. Receiver Test Circuit and Voltage Waveforms

Table 1. Differential Input Voltage Threshold Test

INPUT OUTPUT
VCANH VCANL |VID| R
–11.1 V –12 V 900 mV L VOL
12 V 11.1 V 900 mV L
–6 V –12 V 6 V L
12 V 6 V 6 V L
–11.5 V –12 V 500 mV H VOH
12 V 11.5 V 500 mV H
–12 V –6 V 6 V H
6 V 12 V 6 V H
Open Open X H
SN65HVD1040-Q1 ten_tc_wf_lls753.gif
A. CL = 100 pF and includes instrumentation and fixture capacitance within ±20%.
B. All VI input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 6 ns, pulse repetition rate (PRR) = 125 kHz, 50% duty cycle.
Figure 17. ten Test Circuit and Waveforms
SN65HVD1040-Q1 comonmode_lls753.gif
A. All VI input pulses are from 0 V to VCC and supplied by a generator having the following characteristics: tr or tf ≤ 6 ns, pulse repetition rate (PRR) = 125 kHz, 50% duty cycle.
Figure 18. Common-Mode Output Voltage Test and Waveforms
SN65HVD1040-Q1 tloop_tc_wf_lls753.gif
A. CL = 100 pF and includes instrumentation and fixture capacitance within ±20%.
B. All VI input pulses are from 0 V to VCC and supplied by a generator having the following characteristics: tr or tf ≤ 6 ns, pulse repetition rate (PRR) = 125 kHz, 50% duty cycle.
Figure 19. t(LOOP) Test Circuit and Waveforms
SN65HVD1040-Q1 tm_out_wf_lls753.gif
A. All VI input pulses are from 0 V to VCC and supplied by a generator having the following characteristics: tr or tf ≤ 6 ns, pulse repetition rate (PRR) = 500 Hz, 50% duty cycle.
B. CL = 100 pF includes instrumentation and fixture capacitance within ±20%.
Figure 20. Dominant Time-Out Test Circuit and Waveforms
SN65HVD1040-Q1 drv_sc_wf_lls753.gif Figure 21. Driver Short-Circuit Current Test and Waveforms
SN65HVD1040-Q1 pmi_tbus_test_wave.gif
A. For VI bit width ≤ 0.7 µs, VO = VOH. For VI bit width ≥ 5 µs, VO = VOL. VI input pulses are supplied from a generator with the following characteristics: tr/tf < 6 ns.
B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 22. tBUS Test Circuit and Waveforms
SN65HVD1040-Q1 driver_out_sym.gif
A. All VI input pulses are from 0 V to VCC and supplied by a generator having the following characteristics: tr/tf ≤ 6 ns, pulse repetition rate (PRR) = 250 kHz, 50% duty cycle.
Figure 23. Driver Output Symmetry Test Circuit