SLLS846C May   2009  – August 2014 SN75LVDS83B

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Description (Continued)
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 Handling Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Dissipation Ratings
    6. 7.6 Electrical Characteristics
    7. 7.7 Timing Requirements
    8. 7.8 Switching Characteristics
    9. 7.9 Typical Characteristics
  8. 8 Parameter Measurement Information
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 TTL Input Data
      2. 9.3.2 LVDS Output Data
    4. 9.4 Device Functional Modes
      1. 9.4.1 Input Clock Edge
      2. 9.4.2 Low Power Mode
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 Power Up Sequence
        2. 10.2.2.2 Signal Connectivity
        3. 10.2.2.3 PCB Routing
      3. 10.2.3 Application Curve
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
      1. 12.1.1 Board Stackup
      2. 12.1.2 Power and Ground Planes
      3. 12.1.3 Traces, Vias, and Other PCB Components
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Trademarks
    2. 13.2 Electrostatic Discharge Caution
    3. 13.3 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

8 Parameter Measurement Information

set_hold_lls846.gif
All input timing is defined at IOVDD / 2 on an input signal with a 10% to 90% rise or fall time of less than 3 ns. CLKSEL = 0 V.
Figure 6. Set Up and Hold Time Definition
test_load_lls846.gifFigure 7. Test Load and Voltage Definitions for LVDS Outputs
gray_scale_lls846.gif
The 16 grayscale test pattern test device power consumption for a typical display pattern.
Figure 8. 16 Grayscale Test Pattern
worst_case_lls846.gif
The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs.
Figure 9. Worst-Case Power Test Pattern
timing_lls846.gif
CLKOUT is shown with CLKSEL at high-level.
CLKIN polarity depends on CLKSEL input level.
Figure 10. SN75LVDS83B Timing Definitions
out_clock_lls846.gifFigure 11. Output Clock Jitter Test Set Up
enable_time_lls846.gifFigure 12. Enable Time Waveforms
disable_time_lls846.gifFigure 13. Disable Time Waveforms