SLASF36A January   2024  – December 2024 TAC5311-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements: I2C Interface
    7. 5.7  Switching Characteristics: I2C Interface
    8. 5.8  Timing Requirements: SPI Interface
    9. 5.9  Switching Characteristics: SPI Interface
    10. 5.10 Timing Requirements: TDM, I2S or LJ Interface
    11. 5.11 Switching Characteristics: TDM, I2S or LJ Interface
    12. 5.12 Timing Requirements: PDM Digital Microphone Interface
    13. 5.13 Switching Characteristics: PDM Digial Microphone Interface
    14. 5.14 Timing Diagrams
    15. 5.15 Typical Charactaristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1  Serial Interfaces
        1. 6.3.1.1 Control Serial Interfaces
        2. 6.3.1.2 Audio Serial Interfaces
          1. 6.3.1.2.1 Time Division Multiplexed Audio (TDM) Interface
          2. 6.3.1.2.2 Inter IC Sound (I2S) Interface
          3. 6.3.1.2.3 Left-Justified (LJ) Interface
        3. 6.3.1.3 Using Multiple Devices With Shared Buses
      2. 6.3.2  Phase-Locked Loop (PLL) and Clock Generation
      3. 6.3.3  Input Channel Configuration
      4. 6.3.4  Reference Voltage
      5. 6.3.5  Microphone Bias
      6. 6.3.6  Digital PDM Microphone Record Channel
      7. 6.3.7  Signal-Chain Processing
        1. 6.3.7.1 ADC Signal-Chain
          1. 6.3.7.1.1 Programmable Channel Gain and Digital Volume Control
          2. 6.3.7.1.2 Programmable Channel Gain Calibration
          3. 6.3.7.1.3 Programmable Channel Phase Calibration
          4. 6.3.7.1.4 Programmable Digital High-Pass Filter
          5. 6.3.7.1.5 Programmable Digital Biquad Filters
          6. 6.3.7.1.6 Programmable Channel Summer and Digital Mixer
          7. 6.3.7.1.7 Configurable Digital Decimation Filters
            1. 6.3.7.1.7.1 Linear-phase filters
              1. 6.3.7.1.7.1.1 Sampling Rate: 8kHz or 7.35kHz
              2. 6.3.7.1.7.1.2 Sampling Rate: 16kHz or 14.7kHz
              3. 6.3.7.1.7.1.3 Sampling Rate: 24kHz or 22.05kHz
              4. 6.3.7.1.7.1.4 Sampling Rate: 32kHz or 29.4kHz
              5. 6.3.7.1.7.1.5 Sampling Rate: 48kHz or 44.1kHz
              6. 6.3.7.1.7.1.6 Sampling Rate: 96kHz or 88.2kHz
              7. 6.3.7.1.7.1.7 Sampling Rate: 192kHz or 176.4kHz
              8. 6.3.7.1.7.1.8 Sampling Rate: 384kHz or 352.8kHz
              9. 6.3.7.1.7.1.9 Sampling Rate: 768kHz or 705.6kHz
            2. 6.3.7.1.7.2 Low-latency Filters
              1. 6.3.7.1.7.2.1 Sampling Rate: 24kHz or 22.05kHz
              2. 6.3.7.1.7.2.2 Sampling Rate: 32kHz or 29.4kHz
              3. 6.3.7.1.7.2.3 Sampling Rate: 48kHz or 44.1kHz
              4. 6.3.7.1.7.2.4 Sampling Rate: 96kHz or 88.2kHz
              5. 6.3.7.1.7.2.5 Sampling Rate: 192kHz or 176.4kHz
            3. 6.3.7.1.7.3 Ultra-Low-Latency Filters
              1. 6.3.7.1.7.3.1 Sampling Rate: 24kHz or 22.05kHz
              2. 6.3.7.1.7.3.2 Sampling Rate: 32kHz or 29.4kHz
              3. 6.3.7.1.7.3.3 Sampling Rate: 48kHz or 44.1kHz
              4. 6.3.7.1.7.3.4 Sampling Rate: 96kHz or 88.2kHz
              5. 6.3.7.1.7.3.5 Sampling Rate: 192kHz or 176.4kHz
        2. 6.3.7.2 DAC Signal-Chain
          1. 6.3.7.2.1 Programmable Channel Gain and Digital Volume Control
          2. 6.3.7.2.2 Programmable Channel Gain Calibration
          3. 6.3.7.2.3 Programmable Digital High-Pass Filter
          4. 6.3.7.2.4 Programmable Digital Biquad Filters
          5. 6.3.7.2.5 Programmable Digital Mixer
          6. 6.3.7.2.6 Configurable Digital Interpolation Filters
            1. 6.3.7.2.6.1 Linear-phase filters
              1. 6.3.7.2.6.1.1 Sampling Rate: 8kHz or 7.35kHz
              2. 6.3.7.2.6.1.2 Sampling Rate: 16kHz or 14.7kHz
              3. 6.3.7.2.6.1.3 Sampling Rate: 24kHz or 22.05kHz
              4. 6.3.7.2.6.1.4 Sampling Rate: 32kHz or 29.4kHz
              5. 6.3.7.2.6.1.5 Sampling Rate: 48kHz or 44.1kHz
              6. 6.3.7.2.6.1.6 Sampling Rate: 96kHz or 88.2kHz
              7. 6.3.7.2.6.1.7 Sampling Rate: 192kHz or 176.4kHz
            2. 6.3.7.2.6.2 Low-latency Filters
              1. 6.3.7.2.6.2.1 Sampling Rate: 24kHz or 22.05kHz
              2. 6.3.7.2.6.2.2 Sampling Rate: 32kHz or 29.4kHz
              3. 6.3.7.2.6.2.3 Sampling Rate: 48kHz or 44.1kHz
              4. 6.3.7.2.6.2.4 Sampling Rate: 96kHz or 88.2kHz
              5. 6.3.7.2.6.2.5 Sampling Rate: 192kHz or 176.4kHz
      8. 6.3.8  Interrupts, Status, and Digital I/O Pin Multiplexing
      9. 6.3.9  Input DC Fault Diagnostics
      10. 6.3.10 Power Tune Mode
    4. 6.4 Device Functional Modes
      1. 6.4.1 Sleep Mode or Software Shutdown
      2. 6.4.2 Software Reset
      3. 6.4.3 Active Mode
    5. 6.5 Programming
      1. 6.5.1 Control Serial Interfaces
        1. 6.5.1.1 I2C Control Interface
          1. 6.5.1.1.1 General I2C Operation
          2. 6.5.1.1.2 I2C Single-Byte and Multiple-Byte Transfers
            1. 6.5.1.1.2.1 I2C Single-Byte Write
            2. 6.5.1.1.2.2 I2C Multiple-Byte Write
            3. 6.5.1.1.2.3 I2C Single-Byte Read
            4. 6.5.1.1.2.4 I2C Multiple-Byte Read
        2. 6.5.1.2 SPI Control Interface
  8. 7 Register Maps
    1. 7.1 Device Configuration Registers
      1. 7.1.1 TAC5311-Q1_B0_P0 Registers
      2. 7.1.2 TAC5311-Q1_B0_P1 Registers
    2. 7.2 Programmable Coefficienct Registers
      1. 7.2.1  Programmable Coefficient Registers: Page 8
      2. 7.2.2  Programmable Coefficient Registers: Page 9
        1. 7.2.2.1 TAC5311-Q1_B0_P3 Registers
      3. 7.2.3  Programmable Coefficient Registers: Page 10
      4. 7.2.4  Programmable Coefficient Registers: Page 11
      5. 7.2.5  Programmable Coefficient Registers: Page 15
      6. 7.2.6  Programmable Coefficient Registers: Page 16
      7. 7.2.7  Programmable Coefficient Registers: Page 17
      8. 7.2.8  Programmable Coefficient Registers: Page 18
      9. 7.2.9  Programmable Coefficient Registers: Page 19
      10. 7.2.10 Programmable Coefficient Registers: Page 25
      11. 7.2.11 Programmable Coefficient Registers: Page 26
      12. 7.2.12 Programmable Coefficient Registers: Page 27
      13. 7.2.13 Programmable Coefficient Registers: Page 28
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Application
      2. 8.2.2 Design Requirements
      3. 8.2.3 Detailed Design Procedure
      4. 8.2.4 Application Performance Plots
      5. 8.2.5 Example Device Register Configuration Scripts for EVM Setup
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 IOVDD_IO_MODE for 1.8V and 1.2V Operation
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

6.3.9 Input DC Fault Diagnostics

Each input of the TAC5311-Q1 features highly comprehensive DC fault diagnostics that can be configured to detect fault conditions in the DC-coupled input configuration and trigger an interrupt request to a host processor. Diagnostics are enabled for each channel by configuring DIAG_CFG0 (P1_R70). For channels with diagnostics enabled, the input pins are scanned automatically by an integrated SAR ADC with a programmable repetition rate. The diagnostic processor averages eight consecutive samples per test to improve noise performance. The DC fault diagnostics is not supported in the AC-coupled input configuration.

The device features various programmable threshold registers, P1_R71 to P1_R72, which can by configured by the host processor to define the fault region for a different category of fault condition detection. Additionally, there is also a debounce feature, configured with FAULT_DBNCE_SEL (P1_R74_D[3:2]). This feature sets the number of consecutive scan counts where the fault condition occurs before the latched status register is tripped, thus reducing false triggers by transient events.

See the TAx5xxx-Q1 Fault Diagnostic Features application report for more details.