JAJSGN1F December   2016  – December 2018 TDA2P-ABZ

ADVANCE INFORMATION for pre-production products; subject to change without notice.  

  1. 1デバイスの概要
    1. 1.1 特長
    2. 1.2 アプリケーション
    3. 1.3 概要
    4. 1.4 機能ブロック図
  2. 2改訂履歴
  3. 3Device Comparison
    1. 3.1 Device Comparison Table
    2. 3.2 Related Products
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Diagram
    2. 4.2 Pin Attributes
    3. 4.3 Signal Descriptions
      1. 4.3.1  VIP
      2. 4.3.2  DSS
      3. 4.3.3  HDMI
      4. 4.3.4  EMIF
      5. 4.3.5  GPMC
      6. 4.3.6  Timers
      7. 4.3.7  I2C
      8. 4.3.8  UART
      9. 4.3.9  McSPI
      10. 4.3.10 QSPI
      11. 4.3.11 McASP
      12. 4.3.12 USB
      13. 4.3.13 SATA
      14. 4.3.14 PCIe
      15. 4.3.15 DCAN and MCAN
      16. 4.3.16 GMAC_SW
      17. 4.3.17 eMMC/SD/SDIO
      18. 4.3.18 GPIO
      19. 4.3.19 PWM
      20. 4.3.20 System and Miscellaneous
        1. 4.3.20.1 Sysboot Interface
        2. 4.3.20.2 PRCM
        3. 4.3.20.3 RTC
        4. 4.3.20.4 SDMA
        5. 4.3.20.5 INTC
        6. 4.3.20.6 Observability
        7. 4.3.20.7 Power Supplies
      21. 4.3.21 Test Interfaces
    4. 4.4 Pin Multiplexing
    5. 4.5 Connections for Unused Pins
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Power-On Hours (POH) Limits
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Operating Performance Points
      1. 5.5.1 AVS and ABB Requirements
      2. 5.5.2 Voltage And Core Clock Specifications
      3. 5.5.3 Maximum Supported Frequency
    6. 5.6  Power Consumption Summary
    7. 5.7  Electrical Characteristics
      1. Table 5-6  LVCMOS DDR DC Electrical Characteristics
      2. Table 5-7  Dual Voltage LVCMOS I2C DC Electrical Characteristics
      3. Table 5-8  IQ1833 Buffers DC Electrical Characteristics
      4. Table 5-9  IHHV1833 Buffers DC Electrical Characteristics
      5. Table 5-10 LVCMOS OSC Buffers DC Electrical Characteristics
      6. Table 5-11 BC1833IHHV Buffers DC Electrical Characteristics
      7. Table 5-12 Dual Voltage SDIO1833 DC Electrical Characteristics
      8. Table 5-13 Dual Voltage LVCMOS DC Electrical Characteristics
      9. 5.7.1      HDMIPHY DC Electrical Characteristics
      10. 5.7.2      SATAPHY DC Electrical Characteristics
      11. 5.7.3      USBPHY DC Electrical Characteristics
      12. 5.7.4      PCIEPHY DC Electrical Characteristics
    8. 5.8  VPP Specifications for One-Time Programmable (OTP) eFuses
      1. Table 5-14 Recommended Operating Conditions for OTP eFuse Programming
      2. 5.8.1      Hardware Requirements
      3. 5.8.2      Programming Sequence
      4. 5.8.3      Impact to Your Hardware Warranty
    9. 5.9  Thermal Resistance Characteristics
      1. 5.9.1 Package Thermal Characteristics
    10. 5.10 Timing Requirements and Switching Characteristics
      1. 5.10.1 Timing Parameters and Information
        1. 5.10.1.1 Parameter Information
          1. 5.10.1.1.1 1.8V and 3.3V Signal Transition Levels
          2. 5.10.1.1.2 1.8V and 3.3V Signal Transition Rates
          3. 5.10.1.1.3 Timing Parameters and Board Routing Analysis
      2. 5.10.2 Interface Clock Specifications
        1. 5.10.2.1 Interface Clock Terminology
        2. 5.10.2.2 Interface Clock Frequency
      3. 5.10.3 Power Supply Sequences
      4. 5.10.4 Clock Specifications
        1. 5.10.4.1 Input Clocks / Oscillators
          1. 5.10.4.1.1 OSC0 External Crystal
          2. 5.10.4.1.2 OSC0 Input Clock
          3. 5.10.4.1.3 Auxiliary Oscillator OSC1 Input Clock
            1. 5.10.4.1.3.1 OSC1 External Crystal
            2. 5.10.4.1.3.2 OSC1 Input Clock
          4. 5.10.4.1.4 RTC Oscillator Input Clock
            1. 5.10.4.1.4.1 RTC Oscillator External Crystal
            2. 5.10.4.1.4.2 RTC Oscillator Input Clock
        2. 5.10.4.2 RC On-die Oscillator Clock
        3. 5.10.4.3 Output Clocks
        4. 5.10.4.4 DPLLs, DLLs
          1. 5.10.4.4.1 DPLL Characteristics
          2. 5.10.4.4.2 DLL Characteristics
          3. 5.10.4.4.3 DPLL and DLL Noise Isolation
      5. 5.10.5 Recommended Clock and Control Signal Transition Behavior
      6. 5.10.6 Peripherals
        1. 5.10.6.1  Timing Test Conditions
        2. 5.10.6.2  Virtual and Manual I/O Timing Modes
        3. 5.10.6.3  VIP
        4. 5.10.6.4  DSS
        5. 5.10.6.5  HDMI
        6. 5.10.6.6  EMIF
        7. 5.10.6.7  GPMC
          1. 5.10.6.7.1 GPMC/NOR Flash Interface Synchronous Timing
          2. 5.10.6.7.2 GPMC/NOR Flash Interface Asynchronous Timing
          3. 5.10.6.7.3 GPMC/NAND Flash Interface Asynchronous Timing
        8. 5.10.6.8  Timers
        9. 5.10.6.9  I2C
          1. Table 5-63 Timing Requirements for I2C Input Timings
          2. Table 5-64 Timing Requirements for I2C HS-Mode (I2C3/4/5 Only)
          3. Table 5-65 Switching Characteristics Over Recommended Operating Conditions for I2C Output Timings
        10. 5.10.6.10 UART
          1. Table 5-66 Timing Requirements for UART
          2. Table 5-67 Switching Characteristics Over Recommended Operating Conditions for UART
        11. 5.10.6.11 McSPI
        12. 5.10.6.12 QSPI
        13. 5.10.6.13 McASP
          1. Table 5-74 Timing Requirements for McASP1
          2. Table 5-75 Timing Requirements for McASP2
          3. Table 5-76 Timing Requirements for McASP3/4/5/6/7/8
          4. Table 5-77 Switching Characteristics Over Recommended Operating Conditions for McASP1
          5. Table 5-78 Switching Characteristics Over Recommended Operating Conditions for McASP2
          6. Table 5-79 Switching Characteristics Over Recommended Operating Conditions for McASP3/4/5/6/7/8
        14. 5.10.6.14 USB
          1. 5.10.6.14.1 USB1 DRD PHY
          2. 5.10.6.14.2 USB2 PHY
          3. 5.10.6.14.3 USB3 and USB4 DRD ULPI—SDR—Slave Mode—12-pin Mode
        15. 5.10.6.15 SATA
        16. 5.10.6.16 PCIe
        17. 5.10.6.17 CAN
          1. 5.10.6.17.1 DCAN
          2. 5.10.6.17.2 MCAN-FD
          3. Table 5-94  Timing Requirements for CANx Receive
          4. Table 5-95  Switching Characteristics Over Recommended Operating Conditions for CANx Transmit
        18. 5.10.6.18 GMAC_SW
          1. 5.10.6.18.1 GMAC MII Timings
            1. Table 5-96 Timing Requirements for miin_rxclk - MII Operation
            2. Table 5-97 Timing Requirements for miin_txclk - MII Operation
            3. Table 5-98 Timing Requirements for GMAC MIIn Receive 10/100 Mbit/s
            4. Table 5-99 Switching Characteristics Over Recommended Operating Conditions for GMAC MIIn Transmit 10/100 Mbits/s
          2. 5.10.6.18.2 GMAC MDIO Interface Timings
          3. 5.10.6.18.3 GMAC RMII Timings
            1. Table 5-104 Timing Requirements for GMAC REF_CLK - RMII Operation
            2. Table 5-105 Timing Requirements for GMAC RMIIn Receive
            3. Table 5-106 Switching Characteristics Over Recommended Operating Conditions for GMAC REF_CLK - RMII Operation
            4. Table 5-107 Switching Characteristics Over Recommended Operating Conditions for GMAC RMIIn Transmit 10/100 Mbits/s
          4. 5.10.6.18.4 GMAC RGMII Timings
            1. Table 5-111 Timing Requirements for rgmiin_rxc - RGMIIn Operation
            2. Table 5-112 Timing Requirements for GMAC RGMIIn Input Receive for 10/100/1000 Mbps
            3. Table 5-113 Switching Characteristics Over Recommended Operating Conditions for rgmiin_txctl - RGMIIn Operation for 10/100/1000 Mbit/s
            4. Table 5-114 Switching Characteristics for GMAC RGMIIn Output Transmit for 10/100/1000 Mbps
        19. 5.10.6.19 eMMC/SD/SDIO
          1. 5.10.6.19.1 MMC1—SD Card Interface
            1. 5.10.6.19.1.1 Default speed, 4-bit data, SDR, half-cycle
            2. 5.10.6.19.1.2 High speed, 4-bit data, SDR, half-cycle
            3. 5.10.6.19.1.3 SDR12, 4-bit data, half-cycle
            4. 5.10.6.19.1.4 SDR25, 4-bit data, half-cycle
            5. 5.10.6.19.1.5 UHS-I SDR50, 4-bit data, half-cycle
            6. 5.10.6.19.1.6 UHS-I SDR104, 4-bit data, half-cycle
            7. 5.10.6.19.1.7 UHS-I DDR50, 4-bit data
          2. 5.10.6.19.2 MMC2 — eMMC
            1. 5.10.6.19.2.1 Standard JC64 SDR, 8-bit data, half cycle
            2. 5.10.6.19.2.2 High-Speed JC64 SDR, 8-bit data, half cycle
            3. 5.10.6.19.2.3 High-Speed HS200 JC64 SDR, 8-bit data, half cycle
            4. 5.10.6.19.2.4 High-Speed JC64 DDR, 8-bit data
          3. 5.10.6.19.3 MMC3 and MMC4—SDIO/SD
            1. 5.10.6.19.3.1 MMC3 and MMC4, SD Default Speed
            2. 5.10.6.19.3.2 MMC3 and MMC4, SD High Speed
            3. 5.10.6.19.3.3 MMC3 and MMC4, SD and SDIO SDR12 Mode
            4. 5.10.6.19.3.4 MMC3 and MMC4, SD SDR25 Mode
            5. 5.10.6.19.3.5 MMC3 SDIO High-Speed UHS-I SDR50 Mode, Half Cycle
        20. 5.10.6.20 GPIO
        21. 5.10.6.21 System and Miscellaneous interfaces
      7. 5.10.7 Emulation and Debug Subsystem
        1. 5.10.7.1 JTAG
          1. 5.10.7.1.1 JTAG Electrical Data/Timing
            1. Table 5-163 Timing Requirements for IEEE 1149.1 JTAG
            2. Table 5-164 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG
            3. Table 5-165 Timing Requirements for IEEE 1149.1 JTAG With RTCK
            4. Table 5-166 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG With RTCK
        2. 5.10.7.2 Trace Port Interface Unit (TPIU)
          1. 5.10.7.2.1 TPIU PLL DDR Mode
  6. 6Detailed Description
    1. 6.1  Description
    2. 6.2  Functional Block Diagram
    3. 6.3  MPU
    4. 6.4  DSP Subsystem
    5. 6.5  ISS
    6. 6.6  IVA
    7. 6.7  EVE
    8. 6.8  IPU
    9. 6.9  VPE
    10. 6.10 GPU
    11. 6.11 Memory Subsystem
      1. 6.11.1 EMIF
      2. 6.11.2 GPMC
      3. 6.11.3 ELM
      4. 6.11.4 OCMC
    12. 6.12 Interprocessor Communication
      1. 6.12.1 Mailbox
      2. 6.12.2 Spinlock
    13. 6.13 Interrupt Controller
    14. 6.14 EDMA
    15. 6.15 Peripherals
      1. 6.15.1  VIP
      2. 6.15.2  DSS
      3. 6.15.3  Timers
      4. 6.15.4  I2C
      5. 6.15.5  UART
        1. 6.15.5.1 UART Features
        2. 6.15.5.2 IrDA Features
        3. 6.15.5.3 CIR Features
      6. 6.15.6  McSPI
      7. 6.15.7  QSPI
      8. 6.15.8  McASP
      9. 6.15.9  USB
      10. 6.15.10 SATA
      11. 6.15.11 PCIe
      12. 6.15.12 CAN
      13. 6.15.13 GMAC_SW
      14. 6.15.14 eMMC/SD/SDIO
      15. 6.15.15 GPIO
      16. 6.15.16 ePWM
      17. 6.15.17 eCAP
      18. 6.15.18 eQEP
    16. 6.16 On-Chip Debug
  7. 7Applications, Implementation, and Layout
    1. 7.1 Introduction
      1. 7.1.1 Initial Requirements and Guidelines
    2. 7.2 Power Optimizations
      1. 7.2.1 Step 1: PCB Stack-up
      2. 7.2.2 Step 2: Physical Placement
      3. 7.2.3 Step 3: Static Analysis
        1. 7.2.3.1 PDN Resistance and IR Drop
      4. 7.2.4 Step 4: Frequency Analysis
      5. 7.2.5 System ESD Generic Guidelines
        1. 7.2.5.1 System ESD Generic PCB Guideline
        2. 7.2.5.2 Miscellaneous EMC Guidelines to Mitigate ESD Immunity
      6. 7.2.6 EMI / EMC Issues Prevention
        1. 7.2.6.1 Signal Bandwidth
        2. 7.2.6.2 Signal Routing
          1. 7.2.6.2.1 Signal Routing—Sensitive Signals and Shielding
          2. 7.2.6.2.2 Signal Routing—Outer Layer Routing
        3. 7.2.6.3 Ground Guidelines
          1. 7.2.6.3.1 PCB Outer Layers
          2. 7.2.6.3.2 Metallic Frames
          3. 7.2.6.3.3 Connectors
          4. 7.2.6.3.4 Guard Ring on PCB Edges
          5. 7.2.6.3.5 Analog and Digital Ground
    3. 7.3 Core Power Domains
      1. 7.3.1 General Constraints and Theory
      2. 7.3.2 Voltage Decoupling
      3. 7.3.3 Static PDN Analysis
      4. 7.3.4 Dynamic PDN Analysis
      5. 7.3.5 Power Supply Mapping
      6. 7.3.6 DPLL Voltage Requirement
      7. 7.3.7 Loss of Input Power Event
      8. 7.3.8 Example PCB Design
        1. 7.3.8.1 Example Stack-up
        2. 7.3.8.2 vdd_mpu Example Analysis
    4. 7.4 Single-Ended Interfaces
      1. 7.4.1 General Routing Guidelines
      2. 7.4.2 QSPI Board Design and Layout Guidelines
    5. 7.5 Differential Interfaces
      1. 7.5.1 General Routing Guidelines
      2. 7.5.2 USB 2.0 Board Design and Layout Guidelines
        1. 7.5.2.1 Background
        2. 7.5.2.2 USB PHY Layout Guide
          1. 7.5.2.2.1 General Routing and Placement
          2. 7.5.2.2.2 Specific Guidelines for USB PHY Layout
            1. 7.5.2.2.2.1  Analog, PLL, and Digital Power Supply Filtering
            2. 7.5.2.2.2.2  Analog, Digital, and PLL Partitioning
            3. 7.5.2.2.2.3  Board Stackup
            4. 7.5.2.2.2.4  Cable Connector Socket
            5. 7.5.2.2.2.5  Clock Routings
            6. 7.5.2.2.2.6  Crystals/Oscillator
            7. 7.5.2.2.2.7  DP/DM Trace
            8. 7.5.2.2.2.8  DP/DM Vias
            9. 7.5.2.2.2.9  Image Planes
            10. 7.5.2.2.2.10 JTAG Interface
            11. 7.5.2.2.2.11 Power Regulators
        3. 7.5.2.3 Electrostatic Discharge (ESD)
          1. 7.5.2.3.1 IEC ESD Stressing Test
            1. 7.5.2.3.1.1 Test Mode
            2. 7.5.2.3.1.2 Air Discharge Mode
            3. 7.5.2.3.1.3 Test Type
          2. 7.5.2.3.2 TI Component Level IEC ESD Test
          3. 7.5.2.3.3 Construction of a Custom USB Connector
          4. 7.5.2.3.4 ESD Protection System Design Consideration
        4. 7.5.2.4 References
      3. 7.5.3 USB 3.0 Board Design and Layout Guidelines
        1. 7.5.3.1 USB 3.0 interface introduction
        2. 7.5.3.2 USB 3.0 General routing rules
      4. 7.5.4 HDMI Board Design and Layout Guidelines
        1. 7.5.4.1 HDMI Interface Schematic
        2. 7.5.4.2 TMDS General Routing Guidelines
        3. 7.5.4.3 TPD5S115
        4. 7.5.4.4 HDMI ESD Protection Device (Required)
        5. 7.5.4.5 PCB Stackup Specifications
        6. 7.5.4.6 Grounding
      5. 7.5.5 SATA Board Design and Layout Guidelines
        1. 7.5.5.1 SATA Interface Schematic
        2. 7.5.5.2 Compatible SATA Components and Modes
        3. 7.5.5.3 PCB Stackup Specifications
        4. 7.5.5.4 Routing Specifications
      6. 7.5.6 PCIe Board Design and Layout Guidelines
        1. 7.5.6.1 PCIe Connections and Interface Compliance
          1. 7.5.6.1.1 Coupling Capacitors
          2. 7.5.6.1.2 Polarity Inversion
        2. 7.5.6.2 Non-standard PCIe connections
          1. 7.5.6.2.1 PCB Stackup Specifications
          2. 7.5.6.2.2 Routing Specifications
            1. 7.5.6.2.2.1 Impedance
            2. 7.5.6.2.2.2 Differential Coupling
            3. 7.5.6.2.2.3 Pair Length Matching
        3. 7.5.6.3 LJCB_REFN/P Connections
    6. 7.6 Clock Routing Guidelines
      1. 7.6.1 32-kHz Oscillator Routing
      2. 7.6.2 Oscillator Ground Connection
    7. 7.7 DDR2/DDR3 Board Design and Layout Guidelines
      1. 7.7.1 DDR2/DDR3 General Board Layout Guidelines
      2. 7.7.2 DDR2 Board Design and Layout Guidelines
        1. 7.7.2.1 Board Designs
        2. 7.7.2.2 DDR2 Interface
          1. 7.7.2.2.1  DDR2 Interface Schematic
          2. 7.7.2.2.2  Compatible JEDEC DDR2 Devices
          3. 7.7.2.2.3  PCB Stackup
          4. 7.7.2.2.4  Placement
          5. 7.7.2.2.5  DDR2 Keepout Region
          6. 7.7.2.2.6  Bulk Bypass Capacitors
          7. 7.7.2.2.7  High-Speed Bypass Capacitors
          8. 7.7.2.2.8  Net Classes
          9. 7.7.2.2.9  DDR2 Signal Termination
          10. 7.7.2.2.10 VREF Routing
        3. 7.7.2.3 DDR2 CK and ADDR_CTRL Routing
      3. 7.7.3 DDR3 Board Design and Layout Guidelines
        1. 7.7.3.1  Board Designs
        2. 7.7.3.2  DDR3 EMIF
        3. 7.7.3.3  DDR3 Device Combinations
        4. 7.7.3.4  DDR3 Interface Schematic
          1. 7.7.3.4.1 32-Bit DDR3 Interface
          2. 7.7.3.4.2 16-Bit DDR3 Interface
        5. 7.7.3.5  Compatible JEDEC DDR3 Devices
        6. 7.7.3.6  PCB Stackup
        7. 7.7.3.7  Placement
        8. 7.7.3.8  DDR3 Keepout Region
        9. 7.7.3.9  Bulk Bypass Capacitors
        10. 7.7.3.10 High-Speed Bypass Capacitors
          1. 7.7.3.10.1 Return Current Bypass Capacitors
        11. 7.7.3.11 Net Classes
        12. 7.7.3.12 DDR3 Signal Termination
        13. 7.7.3.13 VREF_DDR Routing
        14. 7.7.3.14 VTT
        15. 7.7.3.15 CK and ADDR_CTRL Topologies and Routing Definition
          1. 7.7.3.15.1 Four DDR3 Devices
            1. 7.7.3.15.1.1 CK and ADDR_CTRL Topologies, Four DDR3 Devices
            2. 7.7.3.15.1.2 CK and ADDR_CTRL Routing, Four DDR3 Devices
          2. 7.7.3.15.2 Two DDR3 Devices
            1. 7.7.3.15.2.1 CK and ADDR_CTRL Topologies, Two DDR3 Devices
            2. 7.7.3.15.2.2 CK and ADDR_CTRL Routing, Two DDR3 Devices
          3. 7.7.3.15.3 One DDR3 Device
            1. 7.7.3.15.3.1 CK and ADDR_CTRL Topologies, One DDR3 Device
            2. 7.7.3.15.3.2 CK and ADDR/CTRL Routing, One DDR3 Device
        16. 7.7.3.16 Data Topologies and Routing Definition
          1. 7.7.3.16.1 DQS and DQ/DM Topologies, Any Number of Allowed DDR3 Devices
          2. 7.7.3.16.2 DQS and DQ/DM Routing, Any Number of Allowed DDR3 Devices
        17. 7.7.3.17 Routing Specification
          1. 7.7.3.17.1 CK and ADDR_CTRL Routing Specification
          2. 7.7.3.17.2 DQS and DQ Routing Specification
  8. 8Device and Documentation Support
    1. 8.1 Device Nomenclature and Orderable Information
      1. 8.1.1 Standard Package Symbolization
      2. 8.1.2 Device Naming Convention
    2. 8.2 Tools and Software
    3. 8.3 Documentation Support
      1. 8.3.1 FCC Warning
      2. 8.3.2 Information About Cautions and Warnings
    4. 8.4 Receiving Notification of Documentation Updates
    5. 8.5 Community Resources
    6. 8.6 商標
    7. 8.7 静電気放電に関する注意事項
    8. 8.8 Export Control Notice
    9. 8.9 Glossary
  9. 9Mechanical Packaging Information
    1. 9.1 Mechanical Data

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

QSPI

The Quad SPI (QSPI) module is a type of SPI module that allows single, dual or quad read access to external SPI devices. This module has a memory mapped register interface, which provides a direct interface for accessing data from external SPI devices and thus simplifying software requirements. It works as a master only. There is one QSPI module in the device and it is primary intended for fast booting from quad-SPI flash memories.

General SPI features:

  • Programmable clock divider
  • Six pin interface (DCLK, CS_N, DOUT, DIN, QDIN1, QDIN2)
  • 4 external chip select signals
  • Support for 3-, 4- or 6-pin SPI interface
  • Programmable CS_N to DOUT delay from 0 to 3 DCLKs
  • Programmable signal polarities
  • Programmable active clock edge
  • Software controllable interface allowing for any type of SPI transfer

NOTE

For more information, see the Quad Serial Peripheral Interface section of the Device TRM.

CAUTION

The IO Timings provided in this section are only valid for some QSPI usage modes when the corresponding Virtual IO Timings or Manual IO Timings are configured as described in the tables found in this section.

CAUTION

The IO Timings provided in this section are only valid when all QSPI Chip Selects used in a system are configured to use the same Clock Mode (either Clock Mode 0 or Clock Mode3).

Table 5-71 and Table 5-72 present timing and switching characteristics for Quad SPI interface.

Table 5-71 Switching Characteristics for QSPI

No PARAMETER DESCRIPTION Mode MIN MAX UNIT
Q1 tc(SCLK) Cycle time, sclk Manual IO Timing Modes, Clock Mode 0 10.41 ns
Manual IO Timing Modes, Clock Mode 3 13.02 ns
Bootmode, Clock Mode 3 20.8
Q2 tw(SCLKL) Pulse duration, sclk low All Y×P-1 (1) ns
Q3 tw(SCLKH) Pulse duration, sclk high All Y×P-1 (1) ns
Q4 td(CS-SCLK) Delay time, sclk falling edge to cs active edge, CS3:0 Manual IO Timing Modes -M×P-1 (2)(3) -M×P+2 (2)(3) ns
Bootmode -M×P-2.5 (2)(3) -M×P+2.5 (2)(3)
Q5 td(SCLK-CS) Delay time, sclk falling edge to cs inactive edge, CS3:0 Manual IO Timing Modes N×P-1 (2)(3) N×P+2 (2)(3) ns
Bootmode N×P-2.5 (2)(3) N×P+2.5 (2)(3)
Q6 td(SCLK-D1) Delay time, sclk falling edge to d[0] transition Manual IO Timing Modes -1 2 ns
Bootmode -2.5 2.5
Q7 tena(CS-D1LZ) Enable time, cs active edge to d[0] driven (lo-z) All -P-3.5 -P+2.5 ns
Q8 tdis(CS-D1Z) Disable time, cs active edge to d[0] tri-stated (Hi-Z) All -P-2.5 -P+2.0 ns
Q9 td(SCLK-D0) Delay time, sclk first falling edge to first d[0] transition Manual IO Timing Modes, PHA=0 Only -1-P 2-P ns
Bootmode, PHA=0 Only -2.5-P 2.5-P
  1. The Y parameter is defined as follows:
    If DCLK_DIV is 0 or ODD then, Y equals 0.5.
    If DCLK_DIV is EVEN then, Y equals (DCLK_DIV/2) / (DCLK_DIV+1).
    For best performance, it is recommended to use a DCLK_DIV of 0 or ODD to minimize the duty cycle distortion. The HSDIVIDER on CLKOUTX2_H13 output of DPLL_PER can be used to achieve the desired clock divider ratio. All required details about clock division factor DCLK_DIV can be found in the Device TRM.
  2. P = SCLK period.
  3. M = QSPI_SPI_DC_REG.DDx + 1 when Clock Mode 0.
    M = QSPI_SPI_DC_REG.DDx when Clock Mode 3.
    N = 2 when Clock Mode 0.
    N = 3 when Clock Mode 3.

TDA2P-ABZ SPRS85v_TIMING_QSPI1_01.gifFigure 5-51 QSPI Read (Clock Mode 3)
TDA2P-ABZ SPRS85v_TIMING_QSPI1_02.gifFigure 5-52 QSPI Read (Clock Mode 0)

CAUTION

The IO Timings provided in this section are only valid for some QSPI usage modes when the corresponding Virtual IO Timings or Manual IO Timings are configured as described in the tables found in this section.

Table 5-72 Timing Requirements for QSPI(2)(3)

No PARAMETER DESCRIPTION Mode MIN MAX UNIT
Q12 tsu(D-RTCLK) Setup time, d[3:0] valid before falling rtclk edge Manual IO Timing Modes, Clock Mode 0 2.9 ns
tsu(D-SCLK) Setup time, d[3:0] valid before falling sclk edge Manual IO Timing Modes, Clock Mode 3 5.7 ns
Boot Mode, Clock Mode 3 12.3 ns
Q13 th(RTCLK-D) Hold time, d[3:0] valid after falling rtclk edge Manual IO Timing Mode, Clock Mode 0 -0.1 ns
th(SCLK-D) Hold time, d[3:0] valid after falling sclk edge Manual IO Timing Mode, Clock Mode 3 0.1 ns
Boot Mode, Clock Mode 3 0.1 ns
Q14 tsu(D-SCLK) Setup time, final d[3:0] bit valid before final falling sclk edge Manual IO Timing Mode, Clock Mode 3 5.7-P (1) ns
Boot Mode, Clock Mode 3 12.3-P (1) ns
Q15 th(SCLK-D) Hold time, final d[3:0] bit valid after final falling sclk edge Manual IO Timing Mode, Clock Mode 3 0.1+P (1) ns
Boot Mode, Clock Mode 3 0.1+P (1) ns
  1. P = SCLK period.
  2. Clock Modes 1 and 2 are not supported.
  3. The Device captures data on the falling clock edge in Clock Mode 0 and 3, as opposed to the traditional rising clock edge. Although non-standard, the falling-edge-based setup and hold time timings have been designed to be compatible with standard SPI devices that launch data on the falling edge in Clock Modes 0 and 3.
TDA2P-ABZ SPRS85v_TIMING_QSPI1_03.gifFigure 5-53 QSPI Write (Clock Mode 3)
TDA2P-ABZ SPRS85v_TIMING_QSPI1_04.gifFigure 5-54 QSPI Write (Clock Mode 0)

NOTE

To configure the desired Manual IO Timing Mode the user must follow the steps described in section Manual IO Timing Modes of the Device TRM.

The associated registers to configure are listed in the CFG REGISTER column. For more information see the Control Module chapter in the Device TRM.

Manual IO Timings Modes must be used to guarantee some IO timings for QSPI. See Table 5-32, Modes Summary for a list of IO timings requiring the use of Manual IO Timings Modes. See Table 5-73, Manual Functions Mapping for QSPI for a definition of the Manual modes.

Table 5-73 lists the A_DELAY and G_DELAY values needed to calculate the correct values to be set in the CFG_x registers.

Table 5-73 Manual Functions Mapping for QSPI

BALL BALL NAME QSPI_MODE0_MANUAL1 QSPI_MODE3_MANUAL1 CFG REGISTER MUXMODE
A_DELAY (ps) G_DELAY (ps) A_DELAY (ps) G_DELAY (ps) 1
R3 gpmc_a13 0 0 0 0 CFG_GPMC_A13_IN qspi1_rtclk
T2 gpmc_a14 2149 1052 0 0 CFG_GPMC_A14_IN qspi1_d3
U2 gpmc_a15 2121 997 0 0 CFG_GPMC_A15_IN qspi1_d2
U1 gpmc_a16 2159 1134 0 0 CFG_GPMC_A16_IN qspi1_d0
U1 gpmc_a16 0 0 0 0 CFG_GPMC_A16_OUT qspi1_d0
P3 gpmc_a17 2135 1085 0 0 CFG_GPMC_A17_IN qspi1_d1
R2 gpmc_a18 0 0 151 0 CFG_GPMC_A18_OUT qspi1_sclk
T7 gpmc_a3 0 0 0 0 CFG_GPMC_A3_OUT qspi1_cs2
P6 gpmc_a4 0 0 0 0 CFG_GPMC_A4_OUT qspi1_cs3
P2 gpmc_cs2 0 0 0 0 CFG_GPMC_CS2_OUT qspi1_cs0
P1 gpmc_cs3 0 0 22 0 CFG_GPMC_CS3_OUT qspi1_cs1