4 Revision History
Changes from D Revision (December 2013) to E Revision
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Added WQFN package to the Device Information tableGo
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Changed Typical Application Circuit diagramGo
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Changed ordering of the OUTxy pin numbers in the Pin Functions table to match the pinout diagram Go
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Deleted ESD rating specifications from the Absolute Maximum Ratings table Go
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Added ESD Ratings table to the data sheetGo
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Added Thermal Information table to the data sheetGo
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Deleted Dissipation Ratings table from the data sheetGo
Changes from C Revision (August 2013) to D Revision
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Added ΔIOLC5 and ΔIOLC6 parameters to Electrical Characteristics tableGo
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Added footnote 6 to footnote 9 in Electrical Characteristics tableGo
Changes from B Revision (December 2009) to C Revision
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Changed AC Characteristics, tWH0 and tWL0 parameter associated pin names Go
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Updated Figure 3Go
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Updated Figure 4Go
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Updated Figure 7Go
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Updated Figure 33Go
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Updated Figure 48Go
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Changed description of Continuous Base LOD, LSD, and TEF sectionGo
Changes from A Revision (April 2009) to B Revision
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Changed product status from mixed to production dataGo
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Deleted footnote 1 from RHA pinoutGo
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Changed test conditions of tD8 in Switching Characteristics tableGo
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Changed header for second column in Table 9Go
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Changed description for bits 175–168, 183–176, and 191–184 in Table 13Go
Changes from * Revision (March 2009) to A Revision
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Changed TSU3 minimum specification to 40 ns in the Recommended Operating Conditions tableGo
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Changed VO minimum specification to maximum specification in the Recommended Operating Conditions tableGo
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Changed IOH minimum specification to maximum specification in the Recommended Operating Conditions tableGo
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Changed IOL minimum specification to maximum specification in the Recommended Operating Conditions tableGo
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Changed IOLC minimum specification to maximum specification in the Recommended Operating Conditions tableGo
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Changed fCLK (SCLK) minimum specification to maximum specification in the Recommended Operating Conditions tableGo
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Changed fCLK (GSCKR/G/B) minimum specification to maximum specification in the Recommended Operating Conditions tableGo
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Changed ICC2 typical value to 6 mA in the Electrical Characteristics tableGo
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Changed ICC3 typical value to 12 mA and maximum value to 27 mA in the Electrical Characteristics tableGo
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Changed ICC4 typical value to 21 mA and maximum value to 55 mA in the Electrical Characteristics tableGo
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Changed ΔIOLC2 typical value to ±1% in the Electrical Characteristics tableGo
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Changed ΔIOLC3 typical value to ±0.5% in the Electrical Characteristics tableGo
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Changed fourth paragraph of Maximum Constant Sink Current Value section to reference correct graphGo
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Changed DC function adjustment range description to reflect proper adjustment range for each control in Dot Correction (DC) Function sectionGo
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Changed brightness control to dot correction data in 288-Bit Common Shift Register sectionGo
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Corrected number of bits contained within the DC, BC, FC, and UD shift register in the DC, BC, FC, and UD Shift Register sectionGo
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Corrected typo about which bits are written in the DC, BC, FC, and UD Data Latch sectionGo
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Corrected percentage of adjustment rage selected in the Dot Correction Data Latch sectionGo
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Deleted second paragraph of Status Information Data (SID) sectionGo
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Updated LOD bit = 1 condition description in the Continuous Base LOD, LSD, and TEF sectionGo