SBVS266 May 2015 TLV713P-Q1
PRODUCTION DATA.
Three evaluation modules (EVMs) are available to assist in the initial circuit performance evaluation using the TLV713P-Q1:
These EVMs come populated with the commercial version of the device in the DQN package; however, they can be used for parametric evaluation. These EVMs can be requested at the Texas Instruments website through the device product folders or purchased directly from the TI eStore.
Computer simulation of circuit performance using SPICE is often useful when analyzing the performance of analog circuits and systems. A SPICE model for the TLV713P-Q1 is available through the product folders under Tools & Software.
PRODUCT | VOUT |
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TLV713PxxPQyyyzQ1 | xx is the nominal output voltage. For output voltages with a resolution of 100 mV, two digits are used in the ordering number (for example, 28 = 2.8 V). P is optional; devices with P have an LDO regulator with an active output discharge. yyy is the package designator. z is the package quantity. R is for reel (3000 pieces), T is for tape (250 pieces). |
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.