JAJSJ71A June   2020  – December 2021 TMAG5170-Q1

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 説明
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Thermal Information
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Electrical Characteristics
    6. 6.6 Magnetic Characteristics
    7. 6.7 Power up Timing
    8. 6.8 SPI Interface Timing
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Magnetic Flux Direction
      2. 7.3.2 Sensor Location
      3. 7.3.3 Magnetic Range Selection
      4. 7.3.4 Update Rate Settings
      5. 7.3.5 ALERT Function
        1. 7.3.5.1 Interrupt and Trigger Mode
        2. 7.3.5.2 Magnetic Switch Mode
      6. 7.3.6 Threshold Count
      7. 7.3.7 Diagnostics
        1. 7.3.7.1  Memory CRC Check
        2. 7.3.7.2  ALERT Integrity Check
        3. 7.3.7.3  VCC Check
        4. 7.3.7.4  Internal LDO Under Voltage Check
        5. 7.3.7.5  Digital Core Power-on Reset Check
        6. 7.3.7.6  SDO Output Check
        7. 7.3.7.7  Communication CRC Check
        8. 7.3.7.8  Oscillator Integrity Check
        9. 7.3.7.9  Magnetic Field Threshold Check
        10. 7.3.7.10 Temperature Alert Check
        11. 7.3.7.11 Analog Front-End (AFE) Check
        12. 7.3.7.12 Hall Resistance and Switch Matrix Check
        13. 7.3.7.13 Hall Offset Check
        14. 7.3.7.14 ADC Check
    4. 7.4 Device Functional Modes
      1. 7.4.1 Operating Modes
        1. 7.4.1.1 Active Mode
        2. 7.4.1.2 Standby Mode
        3. 7.4.1.3 Configuration Mode (DEFAULT)
        4. 7.4.1.4 Sleep Mode
        5. 7.4.1.5 Wake-Up and Sleep Mode
        6. 7.4.1.6 Deep-Sleep Mode
    5. 7.5 Programming
      1. 7.5.1 Data Definition
        1. 7.5.1.1 Magnetic Sensor Data
        2. 7.5.1.2 Temperature Sensor Data
        3. 7.5.1.3 Magnetic Sensor Offset Correction
        4. 7.5.1.4 Angle and Magnitude Data Definition
      2. 7.5.2 SPI Interface
        1. 7.5.2.1 SCK
        2. 7.5.2.2 CS
        3. 7.5.2.3 SDI
        4. 7.5.2.4 SDO
          1. 7.5.2.4.1 Regular 32-Bit SDO Read
          2. 7.5.2.4.2 Special 32-Bit SDO Read
        5. 7.5.2.5 SPI CRC
        6. 7.5.2.6 SPI Frame
          1. 7.5.2.6.1 32-Bit Read Frame
          2. 7.5.2.6.2 32-Bit Write Frame
    6. 7.6 Register Map
      1. 7.6.1 TMAG5170 Registers
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Selecting the Sensitivity Option
      2. 8.1.2 Temperature Compensation for Magnets
      3. 8.1.3 Sensor Conversion
        1. 8.1.3.1 Continuous Conversion
        2. 8.1.3.2 Trigger Conversion
        3. 8.1.3.3 Pseudo-Simultaneous Sampling
      4. 8.1.4 Error Calculation During Linear Measurement
      5. 8.1.5 Error Calculation During Angular Measurement
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
        1. 8.2.1.1 Gain Adjustment for Angle Measurement
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Do's and Don'ts
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 サポート・リソース
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.1 Overview

The TMAG5170-Q1 IC is based on the Hall-effect technology and precision mixed signal circuitry from Texas Instruments. The output signals (raw X, Y, Z Magnetic data and Die temperature data) is provided through the SPI. The device can be configured in multiple settings through user access registers through the SPI.

The IC consists of the following functional and building blocks:

  • The Power Management & Oscillator block contains a low-power oscillator, biasing circuitry, undervoltage and overvoltage detection circuitry, and a fast oscillator.
  • The sensing and temperature measurement block contains the Hall biasing, Hall sensors with multiplexers, noise filters, integrator circuit, temperature sensor, and the ADC. The Hall sensor data and temperature data are multiplexed through the same ADC.
  • The Interface block contains the SPI control circuitry, ESD protection circuits, and all the I/O circuits. The TMAG5170-Q1 supports SPI along with integrated cyclic redundancy check (CRC).
  • The diagnostic blocks are embedded in the circuitry to enable mandatory and user-enabled diagnostic checks.