5.2 Handling Ratings
|
|
|
UNIT |
Storage temperature range, Tstg |
(default) |
-55 to 150 |
°C |
ESD Stress Voltage, VESD(1) |
Human Body Model (HBM)(2) |
>2000 |
V |
Charged Device Model (CDM)(3) |
>500 |
V |
(1) Electrostatic discharge (ESD) to measure device sensitivity/immunity to damage caused by electrostatic discharges into the device.
(2) Level listed above is the passing level per ANSI/ESDA/JEDEC JS-001-2010. JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process, and manufacturing with less than 500V HBM is possible if necessary precautions are taken. Pins listed as 1000V may actually have higher performance.
(3) Level listed above is the passing level per EIA-JEDEC JESD22-C101E. JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process. Pins listed as 250V may actually have higher performance.