JAJSEG7 December   2017 TMS320F28377D-EP

PRODUCTION DATA.  

  1. 1デバイスの概要
    1. 1.1 特長
    2. 1.2 アプリケーション
    3. 1.3 概要
    4. 1.4 機能ブロック図
  2. 2改訂履歴
  3. 3Terminal Configuration and Functions
    1. 3.1 Pin Diagrams
    2. 3.2 Signal Descriptions
      1. Table 3-1 Signal Descriptions
    3. 3.3 Pins With Internal Pullup and Pulldown
    4. 3.4 Pin Multiplexing
      1. 3.4.1 GPIO Muxed Pins
      2. 3.4.2 Input X-BAR
      3. 3.4.3 Output X-BAR and ePWM X-BAR
      4. 3.4.4 USB Pin Muxing
      5. 3.4.5 High-Speed SPI Pin Muxing
    5. 3.5 Connections for Unused Pins
  4. 4Specifications
    1. 4.1  Absolute Maximum Ratings
    2. 4.2  ESD Ratings
    3. 4.3  Recommended Operating Conditions
    4. 4.4  Power Consumption Summary
      1. Table 4-1 Device Current Consumption at 200-MHz SYSCLK
      2. 4.4.1      Current Consumption Graphs
      3. 4.4.2      Reducing Current Consumption
    5. 4.5  Electrical Characteristics
    6. 4.6  Thermal Resistance Characteristics
      1. 4.6.1 GWT Package
      2. 4.6.2 PTP Package
    7. 4.7  System
      1. 4.7.1 Power Sequencing
        1. Table 4-3 Supply Ramp Rate
      2. 4.7.2 Reset Timing
        1. 4.7.2.1 Reset Sources
        2. 4.7.2.2 Reset Electrical Data and Timing
          1. Table 4-4 Reset (XRS) Timing Requirements
          2. Table 4-5 Reset (XRS) Switching Characteristics
      3. 4.7.3 Clock Specifications
        1. 4.7.3.1 Clock Sources
        2. 4.7.3.2 Clock Frequencies, Requirements, and Characteristics
          1. 4.7.3.2.1 Input Clock Frequency and Timing Requirements, PLL Lock Times
            1. Table 4-7   Input Clock Frequency
            2. Table 4-8   X1 Input Level Characteristics When Using an External Clock Source (Not a Crystal)
            3. Table 4-9   X1 Timing Requirements
            4. Table 4-10 AUXCLKIN Timing Requirements
            5. Table 4-11 PLL Lock Times
          2. 4.7.3.2.2 Internal Clock Frequencies
            1. Table 4-12 Internal Clock Frequencies
          3. 4.7.3.2.3 Output Clock Frequency and Switching Characteristics
            1. Table 4-13 Output Clock Frequency
            2. Table 4-14 XCLKOUT Switching Characteristics (PLL Bypassed or Enabled)
        3. 4.7.3.3 Input Clocks and PLLs
        4. 4.7.3.4 Crystal Oscillator
          1. Table 4-15 Crystal Oscillator Parameters
          2. Table 4-17 Crystal Oscillator Electrical Characteristics
        5. 4.7.3.5 Internal Oscillators
          1. Table 4-18 Internal Oscillator Electrical Characteristics
      4. 4.7.4 Flash Parameters
        1. Table 4-20 Flash Parameters
      5. 4.7.5 Emulation/JTAG
        1. 4.7.5.1 JTAG Electrical Data and Timing
          1. Table 4-21 JTAG Timing Requirements
          2. Table 4-22 JTAG Switching Characteristics
      6. 4.7.6 GPIO Electrical Data and Timing
        1. 4.7.6.1 GPIO - Output Timing
          1. Table 4-23 General-Purpose Output Switching Characteristics
        2. 4.7.6.2 GPIO - Input Timing
          1. Table 4-24 General-Purpose Input Timing Requirements
        3. 4.7.6.3 Sampling Window Width for Input Signals
      7. 4.7.7 Interrupts
        1. 4.7.7.1 External Interrupt (XINT) Electrical Data and Timing
          1. Table 4-25 External Interrupt Timing Requirements
          2. Table 4-26 External Interrupt Switching Characteristics
      8. 4.7.8 Low-Power Modes
        1. 4.7.8.1 Clock-Gating Low-Power Modes
        2. 4.7.8.2 Power-Gating Low-Power Modes
        3. 4.7.8.3 Low-Power Mode Wakeup Timing
          1. Table 4-29 IDLE Mode Timing Requirements
          2. Table 4-30 IDLE Mode Switching Characteristics
          3. Table 4-31 STANDBY Mode Timing Requirements
          4. Table 4-32 STANDBY Mode Switching Characteristics
          5. Table 4-33 HALT Mode Timing Requirements
          6. Table 4-34 HALT Mode Switching Characteristics
          7. Table 4-35 HIBERNATE Mode Timing Requirements
          8. Table 4-36 HIBERNATE Mode Switching Characteristics
      9. 4.7.9 External Memory Interface (EMIF)
        1. 4.7.9.1 Asynchronous Memory Support
        2. 4.7.9.2 Synchronous DRAM Support
        3. 4.7.9.3 EMIF Electrical Data and Timing
          1. 4.7.9.3.1 Asynchronous RAM
            1. Table 4-37 EMIF Asynchronous Memory Timing Requirements
            2. Table 4-38 EMIF Asynchronous Memory Switching Characteristics
          2. 4.7.9.3.2 Synchronous RAM
            1. Table 4-39 EMIF Synchronous Memory Timing Requirements
            2. Table 4-40 EMIF Synchronous Memory Switching Characteristics
    8. 4.8  Analog Peripherals
      1. 4.8.1 Analog-to-Digital Converter (ADC)
        1. 4.8.1.1 ADC Electrical Data and Timing
          1. Table 4-41 ADC Operating Conditions (16-Bit Differential Mode)
          2. Table 4-42 ADC Characteristics (16-Bit Differential Mode)
          3. Table 4-43 ADC Operating Conditions (12-Bit Single-Ended Mode)
          4. Table 4-44 ADC Characteristics (12-Bit Single-Ended Mode)
          5. Table 4-45 ADCEXTSOC Timing Requirements
          6. 4.8.1.1.1   ADC Input Models
            1. Table 4-46 Single-Ended Input Model Parameters
            2. Table 4-47 Differential Input Model Parameters
          7. 4.8.1.1.2   ADC Timing Diagrams
            1. Table 4-49 ADC Timings in 12-Bit Mode (SYSCLK Cycles)
            2. Table 4-50 ADC Timings in 16-Bit Mode
        2. 4.8.1.2 Temperature Sensor Electrical Data and Timing
          1. Table 4-51 Temperature Sensor Electrical Characteristics
      2. 4.8.2 Comparator Subsystem (CMPSS)
        1. 4.8.2.1 CMPSS Electrical Data and Timing
          1. Table 4-52 Comparator Electrical Characteristics
          2. Table 4-53 CMPSS DAC Static Electrical Characteristics
      3. 4.8.3 Buffered Digital-to-Analog Converter (DAC)
        1. 4.8.3.1 Buffered DAC Electrical Data and Timing
          1. Table 4-54 Buffered DAC Electrical Characteristics
    9. 4.9  Control Peripherals
      1. 4.9.1 Enhanced Capture (eCAP)
        1. 4.9.1.1 eCAP Electrical Data and Timing
          1. Table 4-55 eCAP Timing Requirement
          2. Table 4-56 eCAP Switching Characteristics
      2. 4.9.2 Enhanced Pulse Width Modulator (ePWM)
        1. 4.9.2.1 Control Peripherals Synchronization
        2. 4.9.2.2 ePWM Electrical Data and Timing
          1. Table 4-57 ePWM Timing Requirements
          2. Table 4-58 ePWM Switching Characteristics
          3. 4.9.2.2.1   Trip-Zone Input Timing
            1. Table 4-59 Trip-Zone Input Timing Requirements
        3. 4.9.2.3 External ADC Start-of-Conversion Electrical Data and Timing
          1. Table 4-60 External ADC Start-of-Conversion Switching Characteristics
      3. 4.9.3 Enhanced Quadrature Encoder Pulse (eQEP)
        1. 4.9.3.1 eQEP Electrical Data and Timing
          1. Table 4-61 eQEP Timing Requirements
          2. Table 4-62 eQEP Switching Characteristics
      4. 4.9.4 High-Resolution Pulse Width Modulator (HRPWM)
        1. 4.9.4.1 HRPWM Electrical Data and Timing
          1. Table 4-63 High-Resolution PWM Characteristics
      5. 4.9.5 Sigma-Delta Filter Module (SDFM)
        1. 4.9.5.1 SDFM Electrical Data and Timing
          1. Table 4-64 SDFM Timing Requirements
    10. 4.10 Communications Peripherals
      1. 4.10.1 Controller Area Network (CAN)
      2. 4.10.2 Inter-Integrated Circuit (I2C)
        1. 4.10.2.1 I2C Electrical Data and Timing
          1. Table 4-65 I2C Timing Requirements
          2. Table 4-66 I2C Switching Characteristics
      3. 4.10.3 Multichannel Buffered Serial Port (McBSP)
        1. 4.10.3.1 McBSP Electrical Data and Timing
          1. 4.10.3.1.1 McBSP Transmit and Receive Timing
            1. Table 4-67 McBSP Timing Requirements
            2. Table 4-68 McBSP Switching Characteristics
          2. 4.10.3.1.2 McBSP as SPI Master or Slave Timing
            1. Table 4-69 McBSP as SPI Master or Slave Timing Requirements (CLKSTP = 10b, CLKXP = 0)
            2. Table 4-70 McBSP as SPI Master or Slave Switching Characteristics (CLKSTP = 10b, CLKXP = 0)
            3. Table 4-71 McBSP as SPI Master or Slave Timing Requirements (CLKSTP = 11b, CLKXP = 0)
            4. Table 4-72 McBSP as SPI Master or Slave Switching Characteristics (CLKSTP = 11b, CLKXP = 0)
            5. Table 4-73 McBSP as SPI Master or Slave Timing Requirements (CLKSTP = 10b, CLKXP = 1)
            6. Table 4-74 McBSP as SPI Master or Slave Switching Characteristics (CLKSTP = 10b, CLKXP = 1)
            7. Table 4-75 McBSP as SPI Master or Slave Timing Requirements (CLKSTP = 11b, CLKXP = 1)
            8. Table 4-76 McBSP as SPI Master or Slave Switching Characteristics (CLKSTP = 11b, CLKXP = 1)
      4. 4.10.4 Serial Communications Interface (SCI)
      5. 4.10.5 Serial Peripheral Interface (SPI)
        1. 4.10.5.1 SPI Electrical Data and Timing
          1. 4.10.5.1.1 Non-High-Speed Master Mode Timings
            1. Table 4-77 SPI Master Mode Switching Characteristics (Clock Phase = 0)
            2. Table 4-78 SPI Master Mode Switching Characteristics (Clock Phase = 1)
            3. Table 4-79 SPI Master Mode Timing Requirements
          2. 4.10.5.1.2 Non-High-Speed Slave Mode Timings
            1. Table 4-80 SPI Slave Mode Switching Characteristics
            2. Table 4-81 SPI Slave Mode Timing Requirements
          3. 4.10.5.1.3 High-Speed Master Mode Timings
            1. Table 4-82 SPI High-Speed Master Mode Switching Characteristics (Clock Phase = 0)
            2. Table 4-83 SPI High-Speed Master Mode Switching Characteristics (Clock Phase = 1)
            3. Table 4-84 SPI High-Speed Master Mode Timing Requirements
          4. 4.10.5.1.4 High-Speed Slave Mode Timings
            1. Table 4-85 SPI High-Speed Slave Mode Switching Characteristics
            2. Table 4-86 SPI High-Speed Slave Mode Timing Requirements
      6. 4.10.6 Universal Serial Bus (USB) Controller
        1. 4.10.6.1 USB Electrical Data and Timing
          1. Table 4-87 USB Input Ports DP and DM Timing Requirements
          2. Table 4-88 USB Output Ports DP and DM Switching Characteristics
      7. 4.10.7 Universal Parallel Port (uPP) Interface
        1. 4.10.7.1 uPP Electrical Data and Timing
          1. Table 4-89 uPP Timing Requirements
          2. Table 4-90 uPP Switching Characteristics
  5. 5Detailed Description
    1. 5.1  Overview
    2. 5.2  Functional Block Diagram
    3. 5.3  Memory
      1. 5.3.1 C28x Memory Map
      2. 5.3.2 Flash Memory Map
      3. 5.3.3 EMIF Chip Select Memory Map
      4. 5.3.4 Peripheral Registers Memory Map
      5. 5.3.5 Memory Types
        1. 5.3.5.1 Dedicated RAM (Mx and Dx RAM)
        2. 5.3.5.2 Local Shared RAM (LSx RAM)
        3. 5.3.5.3 Global Shared RAM (GSx RAM)
        4. 5.3.5.4 CPU Message RAM (CPU MSGRAM)
        5. 5.3.5.5 CLA Message RAM (CLA MSGRAM)
    4. 5.4  Identification
    5. 5.5  Bus Architecture – Peripheral Connectivity
    6. 5.6  C28x Processor
      1. 5.6.1 Floating-Point Unit
      2. 5.6.2 Trigonometric Math Unit
      3. 5.6.3 Viterbi, Complex Math, and CRC Unit II (VCU-II)
    7. 5.7  Control Law Accelerator
    8. 5.8  Direct Memory Access
    9. 5.9  Interprocessor Communication Module
    10. 5.10 Boot ROM and Peripheral Booting
      1. 5.10.1 EMU Boot or Emulation Boot
      2. 5.10.2 WAIT Boot Mode
      3. 5.10.3 Get Mode
      4. 5.10.4 Peripheral Pins Used by Bootloaders
    11. 5.11 Dual Code Security Module
    12. 5.12 Timers
    13. 5.13 Nonmaskable Interrupt With Watchdog Timer (NMIWD)
    14. 5.14 Watchdog
    15. 5.15 Configurable Logic Block (CLB)
  6. 6Applications, Implementation, and Layout
    1. 6.1 TI Design or Reference Design
  7. 7デバイスおよびドキュメントのサポート
    1. 7.1 デバイスおよび開発ツールの項目表記
    2. 7.2 ツールとソフトウェア
    3. 7.3 デバイスの項目表記
    4. 7.4 ドキュメントのサポート
    5. 7.5 Community Resources
    6. 7.6 商標
    7. 7.7 静電気放電に関する注意事項
    8. 7.8 Export Control Notice
    9. 7.9 Glossary
  8. 8メカニカル、パッケージ、および注文情報
    1. 8.1 ビア・チャネル
    2. 8.2 パッケージ情報

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

Table 4-44 ADC Characteristics (12-Bit Single-Ended Mode)

over recommended operating conditions (unless otherwise noted)(5)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ADC conversion cycles(1) 10.1 11 ADCCLKs
Power-up time 500 µs
Gain error –5 ±3 5 LSBs
Offset error –4 ±2 4 LSBs
Channel-to-channel gain error ±4 LSBs
Channel-to-channel offset error ±2 LSBs
ADC-to-ADC gain error Identical VREFHI and VREFLO for all ADCs ±4 LSBs
ADC-to-ADC offset error Identical VREFHI and VREFLO for all ADCs ±2 LSBs
DNL(2) > –1 ±0.5 1 LSBs
INL –2 ±1.0 2 LSBs
SNR(3)(10) VREFHI = 2.5 V, fin = 100 kHz 68.8 dB
THD(3)(10) VREFHI = 2.5 V, fin = 100 kHz –78.4 dB
SFDR(3)(10) VREFHI = 2.5 V, fin = 100 kHz 79.2 dB
SINAD(3)(10) VREFHI = 2.5 V, fin = 100 kHz 68.4 dB
ENOB(3)(10) VREFHI = 2.5 V, fin = 100 kHz,
single ADC(6), all packages		 11.1 bits
VREFHI = 2.5 V, fin = 100 kHz, synchronous ADCs(7), all packages 11.1
VREFHI = 2.5 V, fin = 100 kHz, asynchronous ADCs(8),
100-pin PZP package		 Not supported
VREFHI = 2.5 V, fin = 100 kHz, asynchronous ADCs(8),
176-pin PTP package		 9.7
VREFHI = 2.5 V, fin = 100 kHz, asynchronous ADCs(8),
337-ball ZWT package		 10.9
PSRR VDDA = 3.3-V DC + 200 mV
DC up to Sine at 1 kHz		 60 dB
PSRR VDDA = 3.3-V DC + 200 mV
Sine at 800 kHz		 57 dB
ADC-to-ADC isolation(10)(4)(9) VREFHI = 2.5 V, synchronous ADCs(7), all packages –1 1 LSBs
VREFHI = 2.5 V, asynchronous ADCs(8), 100-pin PZP package Not supported
VREFHI = 2.5 V, asynchronous ADCs(8), 176-pin PTP package –9 9
VREFHI = 2.5 V, asynchronous ADCs(8), 337-ball ZWT package –2 2
VREFHI input current 130 µA
(2) No missing codes.
(3) AC parameters will be impacted by clock source accuracy and jitter, this should be taken into account when selecting the clock source for the system. The clock source used for these parameters was a high-accuracy external clock fed through the PLL. The on-chip Internal Oscillator has higher jitter than an external crystal and these parameters will degrade if it is used as a clock source.
(4) Maximum DC code deviation due to operation of multiple ADCs simultaneously.
(5) Typical values are measured with VREFHI = 2.5 V and VREFLO = 0 V. Minimum and Maximum values are tested or characterized with VREFHI = 2.5 V and VREFLO = 0 V.
(6) One ADC operating while all other ADCs are idle.
(7) All ADCs operating with identical ADCCLK, S+H durations, triggers, and resolution.
(8) Any ADCs operating with heterogeneous ADCCLK, S+H durations, triggers, or resolution.
(9) Value based on characterization.
(10) I/O activity is minimized on pins adjacent to ADC input and VREFHI pins as part of best practices to reduce capacitive coupling and crosstalk.