SLIS110C April 2003 – March 2015 TPIC8101
PRODUCTION DATA.
The TPIC8101 is designed for knock sensor signal conditioning in automotive applications. The device is an analog interface between the engine acoustical sensors or accelerometers and the fuel management systems of a gasoline engine. The two wide-band amplifiers process signals from the piezoelectric sensors. Outputs of the amplifiers feed a channel select MUX switch and then a third-order antialiasing filter. This signal is converted using an analog-to-digital conversion (10 bits with a sampling frequency of 200 kHz) prior to the gain stage.
The gain stage is adjustable through the SPI to compensate for the knock energies. The gain setting is selectable up to 64 values ranging from 0.111 to 2.0.
The output of the gain stage feeds a band-pass filter circuit to process the particular frequency component associated with the engine and transducer.
The band-pass filter has a gain of two and a center frequency range between 1.22 and 19.98 kHz (64-bit selection). The output from this stage is internally clamped.
The output from the band-pass filter is full-wave rectified with its output clamped below VDD.
The full-wave rectified signals are integrated using an integrator time constant set by the SPI and integration time window set by the pulse duration of INT/HOLD. At the start of each knock window, the integrator output is reset. The output of the integrator is internally clamped and the digital output may be directly interfaced to the microprocessor.
The integrated signal is converted to an analog format by a 10-bit DAC. The microprocessor may interface to this signal, read this data, and adjust the spark ignition timing to optimize fuel efficiency related to load versus engine RPM.
The VDD terminal is the input supply for the IC, typically 5-V ±5% tolerant. A noise filter capacitor of 4.7 µF (typical) is required on this terminal to ensure stability of the internal circuits.
The GND terminal is connected to the system ground rail.
The Vref is an internally generated supply reference voltage for biasing the amplifier inputs. The terminal is used to decouple any noise in the system by placing an external capacitor of 22 nF (typical).
The OUT terminal is the output of the integrated signal. This is an analog signal interfaced to the microprocessor A/D channel for data acquisition. A capacitor of 2.2 nF is used to stabilize the signal output.
The INT/HOLD is an input control signal from the microprocessor to select either to integrate the sensed signal or to hold the data for acquisition. There is an internal pulldown on this terminal (default HOLD mode).
The CS terminal allows serial communication to the IC through the SPI from a master controller. The chip select is active low with an internal pullup (default inactive).
The XIN terminal is the input to the inverter used for the oscillator circuit. An external clock signal from the MCU, crystal, or ceramic resonator is configured with resistors and capacitors. To bias the inverter, place a resistor (1 MΩ typical) across XIN and XOUT.
This clock signal is prescaled to set the internal sampling frequency of the A/D converter.
The XOUT terminal is the output of the inverter used for the oscillator circuit.
The SDO output is the SPI data bus reporting information back to the microprocessor. This is a tri-state output with the output set to high-impedance mode when CS is pulled to VDD. The high-impedance state can also be programmed by setting a bit in the prescale word, which takes precedence over the CS setting. The output is disabled when the CS terminal is pulled high (VDD).
The SDI terminal is the communication interface for data transfer between the master and slave components. The SDI has an internal pullup to VDD; the data stream is in 8-bit word format.
The SCLK output signal is used for synchronous communication of data. Typically, the output from the master clock is low with the IC having an internal pullup resistor to VDD. The data is clocked to the internal shift register on the falling clock edge.
The TEST terminal, when pulled low, allows the IC to enter the test mode. During normal operation, this terminal is left open or tied high (VDD). There is an internal pullup to VDD (default).
The CHXFB are amplifier outputs for the sensor signals. The gain of the respective amplifiers is set using the CHXFB and CHX input terminals (see Figure 1).
CH1P, CH1N, CH2P, and CH2N are the inputs for the two amplifiers which interface to the external knock sensors.
The gain is set by external resistors R1 and R2. The inputs and outputs of the amplifier are rail-to-rail compatible to the supply VDD.
An internal multiplexer selects the desired sensor signal to process, which is programmable through the SPI.
NOTE:
The series capacitor C is not mandatory and may be removed in some application circuitsThis is an 8-bit SPI protocol used to communicate with the microcontroller in the system for setting various operating parameters.
When CS is held high, the signals on the SCLK and SDI lines are ignored and SDO is forced into a high-impedance state. SCLK must be low when CS is asserted low.
On each falling edge of the SCLK pulse after CS is asserted low, the new byte is serially shifted into the register. The most significant bit (MSB) is shifted first. Only eight bits in a frame are acceptable. When a number of bits shifted varies from the value eight, the information is ignored and the register retains the old setting.
The shift register transfers the data into a latch register after the eighth SCLK clock pulse and when CS transitions from low to high (see Figure 1).
The function of the integration mode is to ignore any SPI frame transmission when the INT/HOLD bit = 1. In the hold mode with INT/HOLD = 0, all necessary bytes may be transmitted.
The output voltage may be derived from:
where
If ABP = AINT = 2 and AIN = AO = 1, then:
To enable programming in the normal mode, the TEST terminal must be high. Communication is through the SPI and the CS terminal is used to enable the IC. The information on the SDI line consists of two parts: address and data.
After power up, the SPI is in default mode (see Table 1).
The SPI is in the default mode on the power-up sequence. In this case, the SDO directly equals the SDI (echo function). In this mode, five commands can be transmitted by the master controller to configure the IC (see Table 1).
NO. | Code | Command (t) | Data | Response (t) |
---|---|---|---|---|
1 | 010 D[4:0] | Set the prescaler and SDO status | OSCIN frequency D[4:1] = 0000 → 4 MHz D[4:1] = 0001 → 5 MHz D[4:1] = 0010 → 6 MHz D[4:1] = 0011 → 8 MHz D[4:1] = 0100 → 10 MHz D[4:1] = 0101 → 12 MHz D[4:1] = 0110 → 16 MHz D[4:1] = 0111 → 20 MHz D[4:1] = 1000 → 24 MHz |
SDI (010 D[4:0]) |
D[0] = 0 → SDO active D[1] = 1 → SDO high impedance |
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2 | 1110 000 D[0] | Select the channel | D[0] = 0 → Channel 1 selected D[1] = 1 → Channel 2 selected |
SDI (1110 000 D[0]) |
3 | 00 D[5:0] | Set the band-pass center frequency | D[5:0] (see Table 3) | SDI (00 D[5:0]) |
4 | 10 D[5:0] | Set the gain | D[5:0] (see Table 3) | SDI (10 D[5:0]) |
5 | 110 D[4:0] | Set the integration time constant | D[4:0] (see Table 3) | SDI (100 D[4:0]) |
6 | 0111 0001 | Set SPI configuration to the advanced mode(1) | None | SDI (0111 0001) |
The advanced SPI mode has additional features to the default SPI mode. A control byte is written to the SDI and shifted with the MSB first. The response byte on the SDO is shifted out with the MSB first. The response byte corresponds to the previous command. Therefore, the SDI shifts in a control byte n and shifts out a response command byte n − 1. Each control/response pair of commands requires two full 8-bit shift cycles to complete a transmission. Table 2 shows the control bytes with the expected response.
In the advanced SPI mode, only a power-down condition may reset the SPI mode to the default state on the subsequent power-up cycle.
NO. | Code | Command (t) | Data | Response (t) |
---|---|---|---|---|
1 | 010 D[4:0] | Set the prescaler and SDO status | OSCIN frequency D[4:1] = 0000 → 4 MHz D[4:1] = 0001 → 5 MHz D[4:1] = 0010 → 6 MHz D[4:1] = 0011 → 8 MHz D[4:1] = 0100 → 10 MHz D[4:1] = 0101 → 12 MHz D[4:1] = 0110 → 16 MHz D[4:1] = 0111 → 20 MHz D[4:1] = 1000 → 24 MHz |
Byte 1 (D7 to D0) of the digital integrator output |
D[0] = 0 → SDO active D[1] = 1 → SDO high impedance |
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2 | 1110 000 D[0] | Select the channel | D[0] = 0 → Channel 1 selected D[1] = 1 → Channel 2 selected |
D9 to D8 of digital integrator output followed by six zeros |
3 | 00 D[5:0] | Set the band-pass center frequency | D[5:0] (see Table 3) | Byte 1 (MSB) of the 00000001 |
4 | 10 D[5:0] | Set the gain | D[5:0] (see Table 3) | Byte 2 (LSB) 11100000 |
5 | 110 D[4:0] | Set the integration time constant | D[4:0] (see Table 3) | SPI configuration (MSB) 01110001(LSB) |
6 | 0111 0001 | Set SPI configuration to the advanced mode | None | Inverted SPI configuration (MSB)10001110(LSB) |
Digital output:
Decimal Value (D4:D0) |
Integrator Time Constant (µs) |
Band-Pass Frequency (kHz) |
Gain | Decimal Value (D5:D0) |
Band-Pass Frequency (kHz) |
Gain |
---|---|---|---|---|---|---|
0 | 40 | 1.22 | 2 | 32 | 4.95 | 0.421 |
1 | 45 | 1.26 | 1.882 | 33 | 5.12 | 0.4 |
2 | 50 | 1.31 | 1.778 | 34 | 5.29 | 0.381 |
3 | 55 | 1.35 | 1.684 | 35 | 5.48 | 0.364 |
4 | 60 | 1.4 | 1.6 | 36 | 5.68 | 0.348 |
5 | 65 | 1.45 | 1.523 | 37 | 5.9 | 0.333 |
6 | 70 | 1.51 | 1.455 | 38 | 6.12 | 0.32 |
7 | 75 | 1.57 | 1.391 | 39 | 6.37 | 0.308 |
8 | 80 | 1.63 | 1.333 | 40 | 6.64 | 0.296 |
9 | 90 | 1.71 | 1.28 | 41 | 6.94 | 0.286 |
10 | 100 | 1.78 | 1.231 | 42 | 7.27 | 0.276 |
11 | 110 | 1.87 | 1.185 | 43 | 7.63 | 0.267 |
12 | 120 | 1.96 | 1.143 | 44 | 8.02 | 0.258 |
13 | 130 | 2.07 | 1.063 | 45 | 8.46 | 0.25 |
14 | 140 | 2.18 | 1 | 46 | 8.95 | 0.236 |
15 | 150 | 2.31 | 0.944 | 47 | 9.5 | 0.222 |
16 | 160 | 2.46 | 0.895 | 48 | 10.12 | 0.211 |
17 | 180 | 2.54 | 0.85 | 49 | 10.46 | 0.2 |
18 | 200 | 2.62 | 0.81 | 50 | 10.83 | 0.19 |
19 | 220 | 2.71 | 0.773 | 51 | 11.22 | 0.182 |
20 | 240 | 2.81 | 0.739 | 52 | 11.65 | 0.174 |
21 | 260 | 2.92 | 0.708 | 53 | 12.1 | 0.167 |
22 | 280 | 3.03 | 0.68 | 54 | 12.6 | 0.16 |
23 | 300 | 3.15 | 0.654 | 55 | 13.14 | 0.154 |
24 | 320 | 3.28 | 0.63 | 56 | 13.72 | 0.148 |
25 | 360 | 3.43 | 0.607 | 57 | 14.36 | 0.143 |
26 | 400 | 3.59 | 0.586 | 58 | 15.07 | 0.138 |
27 | 440 | 3.76 | 0.567 | 59 | 15.84 | 0.133 |
28 | 480 | 3.95 | 0.548 | 60 | 16.71 | 0.129 |
29 | 520 | 4.16 | 0.5 | 61 | 17.67 | 0.125 |
30 | 560 | 4.39 | 0.471 | 62 | 18.76 | 0.118 |
31 | 600 | 4.66 | 0.444 | 63 | 19.98 | 0.111 |
To enter test mode, the TEST terminal must be low. See Table 4 for the signal that may be accessed in this mode.
NO. | Test Description | SDI Command MSB, LSB | Response | Description |
---|---|---|---|---|
T1 | AAF individual test | 1111, 0000 | ADC clock | Deactivates the input and output operational amplifiers AAF input connected to CH1FB terminal AAF output connected to OUT terminal |
T2 | In-line test to AAF output | 1111, 0000 | None | Deactivates the output operational amplifier AAF output connected to OUT terminal |
T3 | Output buffer individual test | 1111, 0010 | None | Opens the feedback loop of the output buffer and deactivates the input operational amplifier and AAF CH1FB connected to positive input terminal of operational amplifier CH2FB connected to negative input terminal of operational amplifier |
T4 | ADC/DAC individual test (with the output buffer) | 1111, 0011 | ADC data | Deactivates the input operational amplifiers and AAF INT/HOLD = ADC_Sync OSCIN = ADC_SCLK DAC shifted in from SDI terminal |
T5 | ADC/DAC individual test (without the output buffer) | 1111, 0100 | ADC data | Deactivates the input operational amplifiers, AAF, and output buffer INT/HOLD = ADC_Sync OSCIN = ADC_SCLK DAC is shifted in from SDI terminal |
T6 | In-line test to ADC output | 1111, 0011 | ADC data | INT/HOLD = ADC_Sync OSCIN = ADC_SCLK DAC shifted in from SDI terminal |
T7 | Reading of digital clamp flag | 1111, 1000 | Clamp flag D[2:0] | Implies command number 6 (advanced SPI mode) D[0]: Gain stage clamp status D[1]: BPF stage clamp status D[2]: INT stage clamp status D = 0 → No clamp activated D = 1 → Clamp activated |