JAJSJV7C december 2020 – may 2023 TPS272C45
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
INPUT VOLTAGE AND CURRENT | |||||||
VDS,Clamp | VDS clamp voltage | FET current = 10 mA, VS = 24 V | 49 | 53 | 61 | V | |
VS,OVPR | VS overvoltage protection rising | Measured with respect to the GND pin of the device, ENx = HI | 41.5 | 45.5 | 50 | V | |
VS,OVPRF | VS overvoltage protection recovery falling | Measured with respect to the GND pin of the device, ENx = HI | 40 | 43.5 | 48 | V | |
VS,OVPRD | VS overvoltage protection deglitch time | Time from triggering the OVP fault to FET turn-off | 30 | 72 | 85 | µs | |
VS,UVLOR | VS undervoltage lockout rising | Measured with respect to the GND pin of the device | 3.5 | 4.0 | 4.5 | V | |
VS,UVLOF | VS undervoltage lockout falling | Measured with respect to the GND pin of the device | 2.4 | 2.6 | 2.9 | V | |
VDD,UVLOF | VDD undervoltage lockout falling | Measured with respect to the GND pin of the device | 2.63 | 2.8 | 2.9 | V | |
VDD,UVLOR | VDD undervoltage lockout rising | Measured with respect to the GND pin of the device | 2.74 | 2.90 | 3.0 | V | |
ILNOM | Continuous load current, per channel | One channel enabled, TAMB = 85°C | 4.0 | A | |||
Two channels enabled, TAMB = 85°C | 3.0 | A | |||||
IOUT(OFF) | Output leakage current (per channel) | VS <= 36 V, TJ = 85°C VENx = VDIA_EN = 0 V, VOUT = 0 V |
0.5 | 3.0 | µA | ||
IQ_VS_DS | VS quiescent current, Dual Supply input, both channels enabled, diagnostics disabled. | VS ≤ 36 V, VDD = 5 V VENx = HI VDIA_EN = 0 V, IOUTx = 0 |
1.05 | 1.4 | mA | ||
IQ_VDD_DS | VDD quiescent current, both channels enabled, diagnostics disabled. | VS ≤ 36 V, VDD = 3.3 V VENx = 3.3 V VDIA_EN = 0, IOUTx = 0 |
2.0 | mA | |||
IQ_VDD_DS | VDD quiescent current, both channels enabled, diagnostics disabled. | VS ≤ 36 V, VDD = 5 V VENx = 5 V VDIA_EN = 0, IOUTx = 0 A |
2.1 | mA | |||
IQ_VS_DIA_DS | VS quiescent current, Dual Supply input, both channels diagnostics enabled | VS ≤ 36 V, VDD = 5 V VENx = VDIA_EN = 5 V, IOUTx = 0 A |
2.8 | mA | |||
IQ_VS_SS | VS quiescent current, single (VS only) supply input, both channels ON diagnostics disabled | VENx = HI VDIA_EN = 0 V, IOUTx = 0 | 4.4 | mA | |||
IQ_VS_DIA_SS | VS quiescent current, single VS supply input, both channels ON diagnostics enabled | VENx = VDIA_EN = HI, IOUTx = 0 | 4.9 | mA | |||
RON CHARACTERISTICS | |||||||
RON | On-resistance (Includes MOSFET and package) |
6 V ≤ VS ≤ 36 V, IOUTx < 4 A | TJ = 25°C | 45 | mΩ | ||
TJ = 85°C | 68 | mΩ | |||||
TJ = 125°C | 78 | mΩ | |||||
On-resistance when channels are paralleled (Includes MOSFET and package) |
6 V ≤ VS ≤ 36 V, IOUTx < 4 A VEN1 tied to VEN2, VOUT1 tied to VOUT2 |
TJ = 25°C | 23 | 27 | mΩ | ||
TJ = 85°C | 34 | mΩ | |||||
TJ = 125°C | 39 | mΩ | |||||
CURRENT SENSE CHARACTERISTICS | |||||||
KSNS | Current sense ratio IOUTx / ISNS |
IOUTX = 1 A | IOUTX = 1 A | 1200 | |||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 4 A | 3.33 | mA | ||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 4 A | –4.4 | 4.4 | % | |
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 2 A | 1.67 | mA | ||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 2 A | –4.4 | 4.4 | % | |
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 1 A | 0.83 | mA | ||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 1 A | –4 | 4 | % | |
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 500 mA | 0.425 | mA | ||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 500 mA | –6 | 6 | % | |
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 200 mA | 0.17 | mA | ||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 200 mA | –10 | 10 | % | |
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 100 mA | 0.083 | mA | ||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 100 mA | –18 | 18 | % | |
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 50 mA | 0.0416 | mA | ||
ISNSI | Current sense current and accuracy | VEN = VDIA_EN = 5 V | IOUT = 50 mA | -25 | 25 | % | |
ISNSI Paralleled | Paralleled channels current sense accuracy multiplier | VEN1 tied to VEN2, VOUT1 tied to VOUT2 and I_Load > 1 A | Multiply percentage accuracy specification by this factor | 1.2 | times | ||
SNS CHARACTERISTICS | |||||||
ISNSFH | ISNS fault high-level | VDIA_EN = HI device in FLT state of CH selected, Vs>10V | VDIA_EN = HI, device in FLT state of CH selected, Vs>10V | 3.333 | 4.5 | 5.5 | mA |
ISNS_HR | VS - VSNS headroom needed for current sense functionality | VS = 6V, ISNS = 3.4 mA | 2.35 | V | |||
ISNSleak | ISNS leakage, with no load | VDIA_EN = HI, VEN = HI, IL = 0 mA | 10 | µA | |||
CURRENT LIMIT CHARACTERISTICS | |||||||
ICL | Current limitation Level | Heavy overload or short circuit condition | RILIMx = GND, open, or out of range (<4.3 kΩ, and > 80 kΩ) | 4.3 | 5.8 | 6.95 | A |
ICL | Current limitation Level | Heavy overload or short circuit condition | RILIMx = 5 kΩ, VVS-VOUT > 2 V | 3.15 | 4.1 | 4.7 | A |
ICL_LINPK | Overcurrent limit threshold(1) | Overload condition(1) | RILIMx = 5 kΩ VVS-VVOUT < 1V | 4.78 | A | ||
ICL | Current limitation Level | Heavy overload or short circuit condition | RILIMx = 10 kΩ, VVS-VOUT > 2 V | 1.58 | 2.05 | 2.3 | A |
ICL_LINPK | Overcurrent limit threshold(1) | Overload condition | RILIMx = 10 kΩ VVS-VOUT < 1V | 2.42 | A | ||
ICL | ICL Current Limitation Level | Heavy overload or short circuit condition | RILIMx = 28.7 kΩ, VVS-VVOUT > 2 V | 0.52 | 0.71 | 0.82 | A |
ICL_LINPK | Overcurrent limit threshold(1) | Overload condition(1) | RILIMx = 28.7 kΩ, VVS-VOUT < 1 V | 0.9 | A | ||
KCL | Current Limit Ratio | 20.5 | A * kΩ | ||||
ICL_match12 | ICL Current Limitation Level - Matching between CH1 and CH2 | Heavy overload or short circuit condition | RILIMx = 10 kΩ, VVS-VOUT = 24V | –10 | 10 | % | |
ICL_ENPS | Peak current before regulation while enabling switch into 100 mohm load | RILIMx = 5 kΩ to 20 kΩ, VS = 24V | 2.7 times ICL | A | |||
ICL | Current limitation level during inrush delay period | Regulated current @ Short circuit when Enabled | RILIMx = 5 kΩ, RILIMD > 40 kΩ VVS-VOUT> 20V | 1.3 | 1.5 | 1.7 | A |
tDELAY | Nominal Higher Inrush Current limit time delay range | Set by resistor on ILIMD pin in discrete steps | 0 | 22 | ms | ||
tDELAY_VAR | Variation in ILIMD pin set delay time | –250 | 250 | µs | |||
ICL,PRLL | Paralled Channels Current Limitation Level - Multiplier compared to one channel | VEN1 tied to VEN2, VOUT1 tied to VOUT2 | RILIMx = 5 kΩ to 20 kΩ | 1.1 | |||
FAULT CHARACTERISTICS | |||||||
Rpu_OL | Open-load (OL, wire break) detection internal pull-up resistor | VENx = 0 V, VDIA_EN = 5 V | 125 | 150 | 180 | kΩ | |
VOL_off | Open-load (OL, wire break) detection voltage VS - VOUT | VENx = 0 V, VDIA_EN = 5 V | 1.4 | 2.0 | 2.5 | V | |
tOL1 | Open Load (wire-break) indication-time from ENx falling | VENx HI to LO, VDIA_EN = 5 V, VSEL = X(2) IOUT = 0 mA, Open load condition |
170 | 300 | 440 | µs | |
tOL2 | Open load (wire-break) indication-time from DIA_EN rising | VENx = 0 V, VDIA_EN = LO to HI, VSEL = X(2) IOUT = 0 mA, Open Load Condition |
650 | µs | |||
tOL3 | Open load (wire-break) indication-time from VOUT rising beyond open load threshold | VENx = 0 V, VDIA_EN = 5 V, VSEL = X(2) IOUT = 0 mA, VS - VOUTx = < 2V |
600 | µs | |||
TABS | Thermal shutdown | 160 | 185 | 210 | °C | ||
TREL | Relative thermal shutdown threshold | 93 | 118 | 143 | °C | ||
THYS | Thermal shutdown hysteresis | 18 | 24 | 30 | °C | ||
Vol_FLT | Fault low-output voltage (Versions A, B, C) | IFLT = 2 mA, sink current into the pin | 0.4 | V | |||
Vol_FLTx | Fault low-output voltage Version D | IFLT1 , IFLT2= 2 mA, sink current into the pin | 0.4 | V | |||
tRETRY | Retry time | Time from fault shutdown until switch re-enable (thermal shutdown or current limit). | 1 | 2 | 3 | ms | |
EN1 AND EN2 PIN CHARACTERISTICS | |||||||
VIL, ENx | Input voltage low-level | 0.8 | V | ||||
VIH, ENx | Input voltage high-level | 2 | V | ||||
VIHYS, ENx | Input voltage hysteresis | 350 | mV | ||||
RENx | Internal pulldown resistor | 0.8 | 1.5 | 2.5 | MΩ | ||
IIH, EN | Input current high-level | VEN = 5 V | 5 | µA | |||
DIA_EN PIN CHARACTERISTICS | |||||||
VIL, DIA_EN | Input voltage low-level | 0.8 | V | ||||
VIH, DIA_EN | Input voltage high-level | 2 | V | ||||
VIHYS, DIA_EN | Input voltage hysteresis | 200 | 350 | 530 | mV | ||
RDIA_EN | Internal pulldown resistor | 0.8 | 1.5 | 2.5 | MΩ | ||
IIH, DIA_EN | Input current high-level | VDIA_EN = 5 V | 2.5 | 5.0 | 10.0 | µA | |
SEL Characteristics | |||||||
VIL, SEL | Input voltage low-level | 0.8 | V | ||||
VIH, SEL | Input voltage high-level | 2 | V | ||||
VIHYS, SEL | Input voltage hysteresis | 200 | 350 | 530 | mV | ||
RSEL | Internal pulldown resistor | 0.8 | 1.5 | 2.5 | MΩ | ||
IIH, SEL | Input current high-level | VDIA_EN = 5 V | VDIA_EN = 5 V | 2.5 | 5.0 | 10.0 | µA |
LATCH PIN CHARACTERISTICS | |||||||
VIL, LATCH | Input voltage low-level | 0.8 | V | ||||
VIH, LATCH | Input voltage high-level | 2 | V | ||||
VIHYS, LATCH | Input voltage hysteresis | 200 | 350 | 530 | mV | ||
RLATCH | Internal pulldown resistor | 0.8 | 1.5 | 2.5 | MΩ | ||
IIH, LATCH | Input current high-level | VLATCH = 5 V | 2.5 | 5.0 | 10.0 | µA |