4 Revision History
Changes from I Revision (November 2013) to J Revision
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Added Device Information table, Typical Application Diagram title to front-page diagram, ESD Ratings table, Thermal Information table, Feature Description section, Device Functional Modes section, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
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Changed SON to WSON throughout document Go
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Deleted pin out drawings from Typical Application Diagram figureGo
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Changed I/O status to I from O in D1B row of Pin Functions table Go
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Deleted Dissipation Ratings tableGo
Changes from H Revision (January 2010) to I Revision
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Changed test conditions for ground current parameter in the Electrical CharacteristicsGo
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Deleted Figure 14; duplicate mechanical image.Go
Changes from G Revision (March 2009) to H Revision
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Revised ground current parameter, Electrical Characteristics; changed symbol from IQ to IGND; added specifications for YFF and DSK packagesGo
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Added YFF and DSK package specifications for current matching parameter, Electrical CharacteristicsGo
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Changed diode current accuracy parameter, Electrical Characteristics, to reflect YFF and DSK package specificationsGo
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Deleted operating junction temperature range specification from Electrical Characteristics table to eliminate redundancyGo