JAJSQV1A July 2023 – October 2023 TPS7H2140-SEP
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
OPERATING VOLTAGE | |||||||
INUVLOR | Internal VIN UVLO rising | 3.5 | 3.7 | 4 | V | ||
INUVLOF | Internal VIN UVLO falling | 3 | 3.2 | 3.4 | |||
HYSTIN-UVLO | Internal VIN UVLO hysteresis | 0.5 | |||||
OPERATING CURRENT | |||||||
IQ | Quiescent current with diagnostics disabled | ENx = 5 V, DIAG_EN = 0 V, IOUTx = 0 A, current limit = 2 A, all channels on | 7.0 | mA | |||
IQ_DIAG | Quiescent current with diagnostics enabled | ENx = DIAG_EN = 5 V, IOUTx = 0 A, current limit = 2 A, all channels on | 6.2 | ||||
ISD | Shutdown current with diagnostics disabled | ENx = DIAG_EN = OUTx = THER = 0 V |
TA=25°C | 0.5 | µA | ||
TA=125°C | 5 | ||||||
ISD_DIAG | Shutdown current with diagnostic enabled | ENx = 0 V, DIAG_EN = 5 V, VIN – VOUTx < VOL_OFF, not in open-load mode | 5 | mA | |||
tLOW_OFF | ENx signal low time during cycling | ENx from high to low, if elapsed time > tLOW_OFF, the device enters into standby mode | 10 | 12.5 | 15 | ms | |
IF | IN to OUTx forward leakage current | ENx = DIAG_EN = OUTx = 0 | TA = 25°C | 0.5 | µA | ||
ENx = DIAG_EN = OUTx = 0 | TA = 125°C | 8 | |||||
POWER STAGE | |||||||
RON | On-state resistance | TA = 25°C | 165 | mΩ | |||
TA = 125°C | 280 | ||||||
ΔRON | Percentage Difference in On-state resistance between channels (RON_CHx – RON_CHy ) | TA = 25°C | 6% | ||||
ICL_INTERNAL | Internal current limit | Internal current limit value, CL pin connected to GND | 11 | A | |||
ICL_INTERNAL_TSD | Current limit during thermal shutdown | Internal current limit value under thermal shutdown | 6.5 | ||||
ICL_TSD | Current limit during thermal shutdown | External current limit value under thermal shutdown. The percentage of the external current limit setting value |
70% | ||||
VDS_CLAMP | Source-to-drain body diode voltage | 50 | 70 | V | |||
OUTPUT DIODE CHARACTERISTICS | |||||||
VF | Drain−source diode voltage | ENx = 0, IOUTX = −0.15 A. | 0.3 | 0.7 | 0.9 | V | |
IR1 | Continuous reverse current from source to drain | t < 60 s, VIN = 24 V, ENx = 0 V. Single channel reversed current to supply |
TA = 25°C | 2.5 | A | ||
IR2 | Continuous reverse current from source to drain | t < 60 s, VIN = 24 V, ENx = 0 V. GND pin 1-kΩ resistor in parallel with diode. Reverse-current condition, All channels reversed |
TA = 25°C | 2.0 | |||
LOGIC INPUT (ENx, DIAG_EN, SEL, SEH, THER) | |||||||
VIH | Logic high-level voltage | 2 | V | ||||
VIL | Logic low-level voltage | 0.8 | |||||
RPULL_DOWN | Logic-pin pulldown resistor | VIN = VDIAG_EN = 5 V | 200 | 275 | 350 | kΩ | |
VIN = VENx = VSEL = VSEH = VTHER = 5 V | 100 | 175 | 250 | ||||
DIAGNOSTICS | |||||||
IGND_LOSS | Output leakage current under GND loss condition | 100 | µA | ||||
VOL_OFF | Open load detection threshold | VENx = 0 V, when VIN – VOUTx > VOL_OFF. Duration longer than tOL_OFF, then open load is detected, off state. |
1.6 | 2.6 | V | ||
tOL_OFF | Open-load detection threshold deglitch time | VENx = 0 V, when VIN – VOUTx> VOL_OFF. Duration longer than tOL_OFF, then open load is detected, off state |
300 | 550 | 800 | µs | |
IOL_OFF | Off-state output sink current | VENx = 0 V, VDIAG_EN= 5 V, VIN – VOUTx = 24 V, open load | TA = 125°C | 100 | µA | ||
VOL_FAULT | Fault low-output voltage | IFAULT = 2 mA | 0.2 | V | |||
tCL_DEGLITCH | Deglitch time when current limit occurs | ENx = DIAG_EN = 5 V. The deglitch time from current limit event to FAULT = Low and VCS_FAULT |
220 | µs | |||
TSD | Thermal shutdown threshold | 160 | 175 | °C | |||
TSD_RST | Thermal shutdown status reset threshold | 155 | |||||
Tsw | Thermal swing shutdown threshold | 60 | |||||
THYS | Hysteresis for resetting the thermal shutdown or thermal swing | 10 | |||||
CURRENT SENSE AND CURRENT LIMIT | |||||||
KCS | Current sense ratio | 300 | |||||
KCL | Current limit ratio | 2500 | |||||
VCL_TH | Current limit internal threshold voltage(3) | 0.8 | V | ||||
dKCS / KCS | Current sense accuracy, (ICS × KCS – IOUT) / IOUT × 100 | VIN = 13.5 V, IOUTx ≥ 5 mA | –65% | 65% | |||
dKCS / KCS | VIN = 13.5 V, IOUTx ≥ 25 mA | –15% | 15% | ||||
dKCS / KCS | VIN = 13.5 V, IOUTx ≥ 50 mA | –8% | 8% | ||||
dKCS / KCS | VIN = 13.5 V, IOUTx ≥ 100 mA | –4% | 4% | ||||
dKCL / KCL | External current limit accuracy, (IOUTx – ICL × KCL) × 100 / (ICL × KCL) | VIN = 13.5 V, ILIMIT ≥ 250 mA | –20% | 20% | |||
VIN = 13.5 V, 2 A ≤ ILIMIT ≤ 4 A | –15% | 15% | |||||
VCS_LINEAR | Current-sense voltage linear range | VIN ≥ 6.5 V | 0 | 4 | V | ||
5 V ≤ VIN < 6.5 V | 0 | VIN – 2.5 | |||||
IOUTx_LINEAR | Output-current linear range | VIN ≥ 6.5 V, VCS_LINEAR ≤ 4 V | 0 | 2.5 | A | ||
5 V ≤ VIN < 6.5 V, VCS_LINEAR ≤ VIN – 2.5 V | 0 | 2.5 | |||||
VCS_FAULT | Current sense pin output voltage | VIN ≥ 7 V, FAULT mode | 4.5 | 6.5 | V | ||
5 V ≤ VIN < 7 V, FAULT mode | Min(VIN – 2.3, 4.5) | 6.5 | |||||
ICS_FAULT | Current-sense pin output current available in fault mode | VCS = 4.5 V, VIN > 7 V | 15 | mA | |||
ICS_LEAK | Current-sense leakage current in disabled mode | VDIAG_EN = 0 V | TA = 125ºC | 0.5 | µA |