SCBS904 August 2014 TRPGR30ATGC
PRODUCTION DATA.
The following documents describe the TRPGR30ATGC device. Copies of these documents are available on the Internet at www.ti.com.
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
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SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.