JAJSUZ5A July   2007  – July 2024 TRS208

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Electrical Characteristics, Driver
    7. 5.7 Electrical Characteristics, Receiver
    8. 5.8 Switching Characteristics, Driver
    9. 5.9 Switching Characteristics, Receiver
  7. 6 Parameter Measurement Information
  8. 7 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Capacitor Selection
      2. 8.1.2 Electrostatic Discharge (ESD) Protection
      3. 8.1.3 ESD Test Conditions
      4. 8.1.4 Human-Body Model (HBM)
      5. 8.1.5 Machine Model (MM)
      6. 8.1.6 Typical Application
  10. 9 Device and Documentation Support
    1. 9.1 ドキュメントの更新通知を受け取る方法
    2. 9.2 サポート・リソース
    3. 9.3 商標
    4. 9.4 静電気放電に関する注意事項
    5. 9.5 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

5.8 Switching Characteristics, Driver

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 8-3)
PARAMETERTEST CONDITIONS(3)MINTYP(1)MAXUNIT
Maximum data rateCL = 50pF to 1000pF,
One DOUT switching,		RL = 3kΩ to 7kΩ,
See Figure 6-1		120kbit/s
tPLH(D)Propagation delay time,
low- to high-level output		CL = 2500pF,
All drivers loaded,		RL = 3kΩ,
See Figure 6-1		2μs
tPHL(D)Propagation delay time,
high- to low-level output		CL = 2500pF,
All drivers loaded,		RL = 3kΩ,
See Figure 6-1		2μs
tsk(p)Pulse skew(2)CL = 150pF to 2500pF,
See Figure 6-2		RL = 3kΩ to 7kΩ,300ns
SR(tr)Slew rate, transition region
(see Figure 6-1)		CL = 50pF to 1000pF,
VCC = 5V		RL = 3kΩ to 7kΩ,3630V/μs
(1) All typical values are at VCC = 5V, and TA = 25°C.
(2) Pulse skew is defined as |tPLH – tPHL| of each channel of the same device.
(3) Test conditions are C1–C4 = 0.1μF at VCC = 5V ± 0.5V.