6.4 Thermal Information
THERMAL METRIC |
TS3USBCA4 |
UNIT |
RSV (R-PUQFN-N16) |
16 PINS |
RθJA |
Junction-to-ambient thermal resistance (1) |
107.1 |
°C/W |
RθJC(top) |
Junction-to-case (top) thermal resistance (2) |
41.2 |
°C/W |
RθJB |
Junction-to-board thermal resistance (3) |
43.6 |
°C/W |
ΨJT |
Junction-to-top characterization parameter (4) |
1.1 |
°C/W |
ΨJB |
Junction-to-board characterization parameter (5) |
43.6 |
°C/W |
RθJC(bot) |
Junction-to-case (bottom) thermal resistance (6) |
N/A |
°C/W |
(1) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a.
(2) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(3) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8.
(4) The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(5) The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.