SBAS545A September   2011  – December 2016 TSC2007-Q1

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements: Standard Mode (SCL = 100 kHz)
    7. 6.7  Timing Requirements: Fast Mode (SCL = 400 kHz)
    8. 6.8  Timing Requirements: High-Speed Mode (SCL = 1.7 MHz)
    9. 6.9  Timing Requirements: High-Speed Mode (SCL = 3.4 MHz)
    10. 6.10 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Touch Screen Operation
      2. 7.3.2 Internal Temperature Sensor
      3. 7.3.3 Analog-to-Digital Converter
        1. 7.3.3.1 Reference
        2. 7.3.3.2 Reference Mode
        3. 7.3.3.3 Touch Screen Settling
        4. 7.3.3.4 Variable Resolution
        5. 7.3.3.5 8-Bit Conversion
        6. 7.3.3.6 Conversion Clock and Conversion Time
        7. 7.3.3.7 Data Format
        8. 7.3.3.8 Touch Detect
        9. 7.3.3.9 Preprocessing
          1. 7.3.3.9.1 MAV Filter
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power-On Reset (POR)
    5. 7.5 Programming
      1. 7.5.1 I2C Interface
        1. 7.5.1.1 I2C Fast or Standard Mode (F/S Mode)
        2. 7.5.1.2 I2C High-Speed Mode (HS Mode)
      2. 7.5.2 Digital Interface
        1. 7.5.2.1 Address Byte
        2. 7.5.2.2 Command Byte
        3. 7.5.2.3 Start a Converter Function or Write Cycle
        4. 7.5.2.4 Read a Conversion or Read Cycle
        5. 7.5.2.5 Throughput Rate and I2C Bus Traffic
          1. 7.5.2.5.1 12-Bit Operation
          2. 7.5.2.5.2 8-Bit Operation
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 4-Wire Touch Screen Coordinate Pair Measurement
        2. 8.2.2.2 Touch-Panel Driving Power
      3. 8.2.3 Application Curve
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Developmental Support
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 Community Resources
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

6 Specifications

6.1 Absolute Maximum Ratings

Over operating free-air temperature range (unless otherwise noted).(1)
MIN MAX UNIT
Analog input voltage X+, Y+, AUX to GND –0.4 VDD + 0.1 V
X–, Y– to GND –0.4 VDD + 0.1
Voltage VDD/REF pin to GND –0.3 5 V
Digital input voltage to GND –0.3 VDD + 0.3 V
Digital output voltage to GND –0.3 VDD + 0.3 V
Power dissipation (TJ(MAX) – TA) / RθJA
Operating free-air temperature, TA –40 85 °C
Junction temperature, TJ 150 °C
Storage temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

6.2 ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per AEC Q100-002(1) ±8000 V
Charged-device model (CDM), per AEC Q100-011 ±1000
IEC 61000-4-2 contact discharge(2) Pins 2, 3, 4, and 5 ±15000
IEC 61000-4-2 air-gap discharge(2) Pins 2, 3, 4, and 5 ±25000
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(2) Test method based on IEC standard 61000-4-2. Contact Texas Instruments for test details.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
VDD Power-supply voltage VDD 1.2 3.6 V

6.4 Thermal Information

THERMAL METRIC(1) TSC2007-Q1 UNIT
PW (TSSOP)
16 PINS
RθJA Junction-to-ambient thermal resistance 101.7 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 35.2 °C/W
RθJB Junction-to-board thermal resistance 47.7 °C/W
ψJT Junction-to-top characterization parameter 2.4 °C/W
ψJB Junction-to-board characterization parameter 47 °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.

6.5 Electrical Characteristics

TA = –40°C to 85°C, VDD = 1.2 V to 3.6 V (unless otherwise noted).
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AUXILIARY ANALOG INPUT
Input voltage range 0 VDD V
Input capacitance 12 pF
Input leakage current –1 1 µA
A-D CONVERTER
Resolution Programmable: 8 bits or 12 bits 12 Bits
No missing codes 12-bit resolution 11 Bits
Integral linearity ±1.5 LSB(1)
Offset error VDD = 1.8 V –1.2 LSB
VDD = 3 V –3.1 LSB
Gain error VDD = 1.8 V 0.7 LSB
VDD = 3 V 0.1 LSB
TOUCH SENSORS
PENIRQ pullup resistor, RIRQ TA = 25°C, VDD = 1.8 V, command 1011 set 0000 51 kΩ
TA = 25°C, VDD = 1.8 V, command 1011 set 0001 90 kΩ
Switch ON‑resistance Y+, X+ 6 Ω
Y–, X– 5 Ω
Switch drivers drive current(5)(2) 100-ms duration 50 mA
INTERNAL TEMPERATURE SENSOR
Temperature range –40 85 °C
Resolution Differential method(3) VDD = 3 V 1.94 °C/LSB
VDD = 1.6 V 1.04 °C/LSB
TEMP1(4) VDD = 3 V 0.35 °C/LSB
VDD = 1.6 V 0.19 °C/LSB
Accuracy Differential method(3) VDD = 3 V ±2 °C/LSB
VDD = 1.6 V ±2 °C/LSB
TEMP1(4) VDD = 3 V ±3 °C/LSB
VDD = 1.6 V ±3 °C/LSB
INTERNAL OSCILLATOR
Internal clock frequency, fCCLK 8-Bit VDD = 1.2 V 3.19 MHz
VDD = 1.8 V 3.66 MHz
VDD = 2.7 V 3.78 MHz
VDD = 3.6 V 3.82 MHz
12-Bit VDD = 1.2 V 1.6 MHz
VDD = 1.8 V 1.83 MHz
VDD = 2.7 V 1.88 MHz
VDD = 3.6 V 1.91 MHz
Frequency drift VDD = 1.6 V 0.0056 %/°C
VDD = 3 V 0.012 %/°C
DIGITAL INPUT AND OUTPUT
Logic family CMOS
Logic level VIH 1.2 V ≤ VDD < 1.6 V 0.7 × VDD VDD + 0.3 V
1.6 V ≤ VDD ≤ 3.6 V 0.7 × VDD VDD + 0.3 V
VIL 1.2 V ≤ VDD < 1.6 V –0.3 0.2 × VDD V
1.6 V ≤ VDD ≤ 3.6 V –0.3 0.3 × VDD V
IIL SCL and SDA pins –1 1 µA
CIN(5) SCL and SDA pins 10 pF
VOH IOH = 2 TTL loads VDD – 0.2 VDD V
VOL IOL = 2 TTL loads 0 0.2 V
ILEAK Floating output –1 1 µA
COUT(5) Floating output 10 pF
Data format Straight binary
POWER-SUPPLY REQUIREMENTS
Quiescent supply current
(VDD with sensor off)		 12-bit Fast mode
(clock = 400 kHz)
PD[1:0] = 0,0		 VDD = 1.2 V, 32.56k eq rate 128 190 µA
VDD = 1.2 V, 8.2k eq rate 32.24 µA
VDD = 1.8 V, 34.42k eq rate 165 240 µA
VDD = 1.8 V, 8.2k eq rate 39.31 µA
VDD = 2.7 V, 34.79k eq rate 226.2 335 µA
VDD = 2.7 V, 8.2k eq rate 53.32 µA
Power down supply current Not addressed, SCL = SDA = 1 0 0.8 µA
POWER-ON AND OFF SLOPE REQUIREMENTS(5)
VDD off ramp TA = –40°C to 85°C 2 kV/s
VDD off time TA = –40°C to 85°C, VDD = 0 V 1.2 s
TA = –20°C to 85°C, VDD = 0 V 0.3 s
VDD on ramp TA = –40°C to 85°C 12 kV/s
(1) LSB means Least Significant Bit. With VDD/REF pin = 1.6 V, one LSB is 391 µV.
(2) Exceeding 50-mA source current may result in device degradation.
(3) Difference between TEMP1 and TEMP2 measurement; no calibration necessary.
(4) Temperature drift is –2.1 mV/°C.
(5) Not production tested. Specified by design.

6.6 Timing Requirements: Standard Mode (SCL = 100 kHz)

TA = –40°C to 85°C, VDD = 1.6 V (unless otherwise noted).
MIN NOM MAX UNIT
fSCL SCL clock frequency 0 100 kHz
tBUF Bus free time between a STOP and START condition 4.7 µs
tHD, STA Hold time (repeated) START condition 4 µs
tLOW Low period of SCL clock 4.7 µs
tHIGH High period of the SCL clock 4 µs
tSU, STA Setup time for a repeated START condition 4.7 µs
tHD, DAT Data hold time 0 3.45 µs
tSU, DAT Data setup time 250 ns
tR Rise time for both SDA and SCL signals (receiving) Cb = total bus capacitance 1000 ns
tF Fall time for both SDA and SCL signals Receiving Cb = total bus capacitance 300 ns
Transmitting Cb = total bus capacitance 250 ns
tSU, STO Setup time for STOP condition 4 µs
Cb Capacitive load for each bus line Cb = total capacitance of one bus line in pF 400 pF
Cycle time 8 bits 40 SCL + 127 CCLK, VDD = 1.8 V 434.7 µs
12 bits 49 SCL + 148 CCLK, VDD = 1.8 V 570.9 µs
Effective throughput 8 bits VDD = 1.8 V 2.3 kSPS
12 bits VDD = 1.8 V 1.75 kSPS
Equivalent rate = effective throughput × 7 8 bits VDD = 1.8 V 16.1 kHz
12 bits VDD = 1.8 V 12.26 kHz

6.7 Timing Requirements: Fast Mode (SCL = 400 kHz)

All specifications typical at –40°C to 85°C, VDD = 1.6 V (unless otherwise noted).
MIN NOM MAX UNIT
fSCL SCL clock frequency 0 400 kHz
tBUF Bus free time between a STOP and START condition 1.3 µs
tHD, STA Hold time (repeated) START condition 0.6 µs
tLOW Low period of SCL clock 1.3 µs
tHIGH High period of the SCL clock 0.6 µs
tSU, STA Setup time for a repeated START condition 0.6 µs
tHD, DAT Data hold time 0 0.9 µs
tSU, DAT Data setup time 100 ns
tR Rise time for both SDA and SCL signals (receiving) Cb = total bus capacitance 20 + 0.1 × Cb 300 ns
tF Fall time for both SDA and SCL signals Receiving Cb = total bus capacitance 20 + 0.1 × Cb 300 ns
Transmitting Cb = total bus capacitance 20 + 0.1 × Cb 250 ns
tSU, STO Setup time for STOP condition 0.6 µs
Cb Capacitive load for each bus line Cb = total capacitance of one bus line in pF 400 pF
Cycle time 8 bits 40 SCL + 127 CCLK, VDD = 1.8 V 134.7 µs
12 bits 49 SCL + 148 CCLK, VDD = 1.8 V 203.4 µs
Effective throughput 8 bits VDD = 1.8 V 7.42 kSPS
12 bits VDD = 1.8 V 4.92 kSPS
Equivalent rate = effective throughput × 7 8 bits VDD = 1.8 V 51.97 kHz
12 bits VDD = 1.8 V 34.42 kHz

6.8 Timing Requirements: High-Speed Mode (SCL = 1.7 MHz)

All specifications typical at –40°C to 85°C, VDD = 1.6 V (unless otherwise noted).
MIN NOM MAX UNIT
fSCL SCL clock frequency 0 1.7 MHz
tHD, STA Hold time (repeated) START condition 160 ns
tLOW Low period of SCL clock 320 ns
tHIGH High period of the SCL clock 120 ns
tSU, STA Setup time for a repeated START condition 160 ns
tHD, DAT Data hold time 0 150 ns
tSU, DAT Data setup time 10 ns
tR Rise time for a signal (receiving) SCL Cb = total bus capacitance 20 80 ns
SDA Cb = total bus capacitance 20 160 ns
tF Fall time for a signal (receiving) SCL Cb = total bus capacitance 20 80 ns
SDA Cb = total bus capacitance 20 160 ns
tF Fall time for both SDA and SCL signals (transmitting) Cb = total bus capacitance 20 160 ns
tSU, STO Setup time for STOP condition 160 ns
Cb Capacitive load for each bus line Cb = total capacitance of one bus line in pF 400 pF
Cycle time 8 bits 40 SCL + 127 CCLK, VDD = 1.8 V 58.2 µs
12 bits 49 SCL + 148 CCLK, VDD = 1.8 V 109.7 µs
Effective throughput 8 bits VDD = 1.8 V 17.17 kSPS
12 bits VDD = 1.8 V 9.12 kSPS
Equivalent rate = effective throughput × 7 8 bits VDD = 1.8 V 120.22 kHz
12 bits VDD = 1.8 V 63.81 kHz

6.9 Timing Requirements: High-Speed Mode (SCL = 3.4 MHz)

All specifications typical at –40°C to 85°C, VDD = 1.6 V (unless otherwise noted).
MIN NOM MAX UNIT
fSCL SCL clock frequency 0 3.4 MHz
tHD, STA Hold time (repeated) START condition 160 ns
tLOW Low period of SCL clock 160 ns
tHIGH High period of the SCL clock 60 ns
tSU, STA Setup time for a repeated START condition 160 ns
tHD, DAT Data hold time 0 70 ns
tSU, DAT Data setup time 10 ns
tR Rise time for a signal (receiving) SCL Cb = total bus capacitance 10 40 ns
SDA Cb = total bus capacitance 10 80 ns
tF Fall time for a signal (receiving) SCL Cb = total bus capacitance 10 40 ns
SDA Cb = total bus capacitance 10 80 ns
tF Fall time for both SDA and SCL signals (transmitting) Cb = total bus capacitance 10 80 ns
tSU, STO Setup time for STOP condition 160 ns
Cb Capacitive load for each bus line Cb = total capacitance of one bus line in pF 100 pF
Cycle time 8 bits 40 SCL + 127 CCLK, VDD = 1.8 V 46.5 µs
12 bits 49 SCL + 148 CCLK, VDD = 1.8 V 95.3 µs
Effective throughput 8 bits VDD = 1.8 V 21.52 kSPS
12 bits VDD = 1.8 V 10.49 kSPS
Equivalent rate = effective throughput × 7 8 bits VDD = 1.8 V 150.65 kHz
12 bits VDD = 1.8 V 73.46 kHz
TSC2007-Q1 timing_bas405.gif Figure 1. Detailed I/O Timing

6.10 Typical Characteristics

At TA = –40°C to 85°C, VDD = 1.2 V to 3.6 V, PD1 = PD0 = 0, Fast mode, 12-bit mode, non-continuous AUX measurement, and MAV filter enabled (see MAV Filter section), unless otherwise noted.
TSC2007-Q1 tc_ipd-tmp_bas405.gif Figure 2. Power-Down Supply Current vs Temperature
TSC2007-Q1 tc_idd_aux_conv_bas405.gif Figure 4. Supply Current vs
Supply Voltage (AUX Conversion)
TSC2007-Q1 tc_idd_no_addr-tmp_bas405.gif Figure 6. Supply Current (Part Not Addressed) vs Temperature
TSC2007-Q1 tc_gain-tmp_bas405.gif Figure 8. Change in Gain vs Temperature
TSC2007-Q1 tc_ron-vdd_bas405.gif Figure 10. Switch ON-Resistance vs Supply Voltage
TSC2007-Q1 tc_ron-tmp_18v_bas405.gif Figure 12. Switch ON-Resistance vs Temperature
TSC2007-Q1 tc_temp1_diode-vdd_bas405.gif Figure 14. TEMP1 Diode Voltage vs Supply Voltage
TSC2007-Q1 tc_freq-tmp_12v_bas405.gif Figure 16. Internal Oscillator Clock Frequency vs Temperature
TSC2007-Q1 tc_freq-tmp_30v_bas405.gif Figure 18. Internal Oscillator Clock Frequency vs Temperature
TSC2007-Q1 tc_idd-tmp_bas405.gif Figure 3. Supply Current vs Temperature
TSC2007-Q1 tc_idd-vdd_bas405.gif Figure 5. Supply Current vs Supply Voltage
TSC2007-Q1 tc_idd_no_addr-vdd_bas405.gif Figure 7. Supply Current (Part Not Addressed) vs
Supply Voltage
TSC2007-Q1 tc_offset-tmp_bas405.gif Figure 9. Change in Gain vs Temperature
TSC2007-Q1 tc_ron-tmp_3v_bas405.gif Figure 11. Switch ON-Resistance vs Temperature
TSC2007-Q1 tc_temp_diode-tmp_bas405.gif Figure 13. TEMP Diode Voltage vs Temperature
TSC2007-Q1 tc_temp2_diode-vdd_bas405.gif Figure 15. TEMP2 Diode Voltage vs Supply Voltage
TSC2007-Q1 tc_freq-tmp_18v_bas405.gif Figure 17. Internal Oscillator Clock Frequency vs Temperature