The TUSB3410 device provides bridging between a USB port and an enhanced UART serial port. The device contains an 8052 microcontroller unit (MCU) with 16KB of RAM that can be loaded from the host or from the external onboard memory through an I2C. The device also contains 10KB of ROM that allows the MCU to configure the USB port at boot time. The ROM code also contains an I2C bootloader. All device functions (such as the USB command decoding, UART setup, and error reporting) are managed by the internal MCU firmware in unison with the PC host.
PART NUMBER | PACKAGE | BODY SIZE |
---|---|---|
TUSB3410 | VQFN (32) | 5.00 mm × 5.00 mm |
LQFP (32) | 7.00 mm × 7.00 mm |
Changes from I Revision (November 2015) to J Revision
Changes from H Revision (April 2013) to I Revision
PIN | I/O | DESCRIPTION | |
---|---|---|---|
NAME | NO. | ||
CLKOUT | 22 | O | Clock output (controlled by bits 2 (CLKOUTEN) and 3(CLKSLCT) in the MODECNFG register (see (1) and Section 5.5.5.5) |
CTS | 13 | I | UART: Clear to send(4) |
DCD | 15 | I | UART: Data carrier detect(4) |
DM | 7 | I/O | Upstream USB port differential data minus |
DP | 6 | I/O | Upstream USB port differential data plus |
DSR | 14 | I | UART: Data set ready(4) |
DTR | 21 | O | UART: Data terminal ready(1) |
GND | 8, 18, 28 | GND | Digital ground |
P3.0 | 32 | I/O | General-purpose I/O 0 (port 3, terminal 0)(3)(5)(8) |
P3.1 | 31 | I/O | General-purpose I/O 1 (port 3, terminal 1)(3)(5)(8) |
P3.3 | 30 | I/O | General-purpose I/O 3 (port 3, terminal 3)(3)(5)(8) |
P3.4 | 29 | I/O | General-purpose I/O 4 (port 3, terminal 4)(3)(5)(8) |
PUR | 5 | O | Pullup resistor connection(2) |
RESET | 9 | I | Device master reset input(4) |
RI/CP | 16 | I | UART: Ring indicator(4) |
RTS | 20 | O | UART: Request to send(1) |
SCL | 11 | O | Master I2C controller: clock signal(1) |
SDA | 10 | I/O | Master I2C controller: data signal(1)(5) |
SIN/IR_SIN | 17 | I | UART: Serial input data / IR Serial data input(6) |
SOUT/IR_SOUT | 19 | O | UART: Serial output data / IR Serial data output(7) |
SUSPEND | 2 | O | Suspend indicator terminal(3). When this terminal is asserted high, the device is in suspend mode. |
TEST0 | 23 | I | Test input (for factory test only). This terminal must be tied to VCC through a 10-kΩ resistor. |
TEST1 | 24 | I | Test input (for factory test only)(5). This terminal must be tied to VCC through a 10-kΩ resistor. |
VCC | 3, 25 | PWR | 3.3 V |
VDD18 | 4 | PWR | 1.8-V supply. An internal voltage regulator generates this supply voltage when terminal VREGEN is low. When VREGEN is high, 1.8 V must be supplied externally. |
VREGEN | 1 | I | This active-low terminal is used to enable the 3.3-V to 1.8-V voltage regulator. |
WAKEUP | 12 | I | Remote wake-up request terminal. When low, wakes up system(5) |
X1/CLKI | 27 | I | 12-MHz crystal input or clock input |
X2 | 26 | O | 12-MHz crystal output |
MIN | MAX | UNIT | |||
---|---|---|---|---|---|
VCC | Supply voltage | −0.5 | 3.6 | V | |
VI | Input voltage | −0.5 | VCC + 0.5 | V | |
VO | Output voltage | −0.5 | VCC + 0.5 | V | |
IIK | Input clamp current | ±20 | mA | ||
IOK | Output clamp current | ±20 | mA | ||
Tstg | Storage temperature | Industrial | –65 | 150 | °C |
Standard | –55 | 150 |
VALUE | UNIT | ||||
---|---|---|---|---|---|
VESD | Electrostatic discharge (ESD) performance | Human Body Model (HBM), per ANSI/ESDA/JEDEC JS001(1) | ±2000 | V | |
Charged Device Model (CDM), per JESD22-C101(2) |
All pins | ±500 | V |
MIN | TYP | MAX | UNIT | |||
---|---|---|---|---|---|---|
VCC | Supply voltage | 3 | 3.3 | 3.6 | V | |
VI | Input voltage | 0 | VCC | V | ||
VIH | High-level input voltage | TTL | 2 | VCC | V | |
CMOS | 0.7 × VCC | VCC | ||||
VIL | Low-level input voltage | TTL | 0 | 0.8 | V | |
CMOS | 0 | 0.2 × VCC | ||||
TA | Operating temperature | Commercial range | 0 | 70 | °C | |
Industrial range | –40 | 85 | °C |
THERMAL METRIC(1) | TUSB3410 | UNIT | ||
---|---|---|---|---|
RHB (VQFN) | VF (LQFP) | |||
32 PINS | ||||
RθJA | Junction-to-ambient thermal resistance | 32.1 | 70.5 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 24.6 | 31.4 | °C/W |
RθJB | Junction-to-board thermal resistance | 6.5 | 28.3 | °C/W |
ψJT | Junction-to-top characterization parameter | 0.2 | 2.2 | °C/W |
ψJB | Junction-to-board characterization parameter | 6.5 | 28.2 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | 24.6 | 31.4 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
VOH | High-level output voltage | TTL | IOH = –4 mA | VCC – 0.5 | V | ||
CMOS | VCC – 0.5 | ||||||
VOL | Low-level output voltage | TTL | IOL = 4 mA | 0.5 | V | ||
CMOS | 0.5 | ||||||
VIT+ | Positive threshold voltage | TTL | VI = VIH | 1.8 | V | ||
CMOS | 0.7 × VCC | ||||||
VIT− | Negative threshold voltage | TTL | VI = VIH | 0.8 | 1.8 | V | |
CMOS | 0.2 × VCC | ||||||
Vhys | Hysteresis (VIT+ − VIT−) | TTL | VI = VIH | 0.3 | 0.7 | V | |
CMOS | 0.17 × VCC | 0.3 × VCC | |||||
IIH | High-level input current | TTL | VI = VIH | ±20 | µA | ||
CMOS | ±1 | ||||||
IIL | Low-level input current | TTL | VI = VIL | ±20 | µA | ||
CMOS | ±1 | ||||||
IOZ | Output leakage current (Hi-Z) | VI = VCC or VSS | ±20 | µA | |||
IOL | Output low drive current | 0.1 | mA | ||||
IOH | Output high drive current | 0.1 | mA | ||||
ICC | Supply current (operating) | Serial data at 921.6 k | 15 | mA | |||
Supply current (suspended) | 200 | µA | |||||
Clock duty cycle(1) | 50% | ||||||
Jitter specification(1) | ±100 | ppm | |||||
CI | Input capacitance | 18 | pF | ||||
CO | Output capacitance | 10 | pF |
The TUSB3410 device can be brought out of the suspended state, or woken up, by a command from the host. The TUSB3410 device also supports remote wakeup and can be awakened by either of two input signals. A low pulse on the WAKEUP terminal or a low-to-high transition on the RI/CP terminal wakes up the device.
NOTE
For reliable operation, either condition must persist for approximately 3-ms minimum, which allows time for the crystal to power up because in the suspend mode, the crystal interface is powered down. The state of the WAKEUP or RI/CP terminal is then sampled by the clock to verify there was a valid wake-up event.
There are three requirements for the reset signal timing. First, the minimum reset pulse duration is 100 μs. At power up, this time is measured from the time the power ramps up to 90% of the nominal VCC until the reset signal exceeds 1.2 V. The second requirement is that the clock must be valid during the last 60 µs of the reset window. The third requirement is that, according to the USB specification, the device must be ready to respond to the host within 100 ms. This means that within the 100-ms window, the device must come out of reset, load any pertinent data from the I2C EEPROM device, and transfer execution to the application firmware if any is present. Because the latter two events can require significant time, the amount of which can change from system to system, TI recommends having the device come out of reset within 30 ms, leaving 70 ms for the other events to complete. This means the reset signal must rise to
1.8 V within 30 ms.
These requirements are depicted in Figure 4-1. When using a 12-MHz crystal, the clock signal may take several milliseconds to ramp up and become valid after power up. Therefore, the reset window may need to be elongated up to 10 ms or more to ensure that there is a 60-µs overlap with a valid clock.