JAJSQ94C january 2019 – may 2023 UCC21710-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
VCC UVLO THRESHOLD AND DELAY | |||||||
VVCC_ON | VCC–GND | 2.55 | 2.7 | 2.85 | V | ||
VVCC_OFF | 2.35 | 2.5 | 2.65 | ||||
VVCC_HYS | 0.2 | ||||||
tVCCFIL | VCC UVLO Deglitch time | 10 | µs | ||||
tVCC+ to OUT | VCC UVLO on delay to output high | IN+ = VCC, IN– = GND | 28 | 37.8 | 50 | ||
tVCC– to OUT | VCC UVLO off delay to output low | 5 | 10 | 15 | |||
tVCC+ to RDY | VCC UVLO on delay to RDY high | RST/EN = VCC | 30 | 37.8 | 50 | ||
tVCC– to RDY | VCC UVLO off delay to RDY low | 5 | 10 | 15 | |||
VDD UVLO THRESHOLD AND DELAY | |||||||
VVDD_ON | VDD–COM | 10.5 | 12.0 | 12.8 | V | ||
VVDD_OFF | 9.9 | 10.7 | 11.8 | ||||
VVDD_HYS | 0.8 | ||||||
tVDDFIL | VDD UVLO Deglitch time | 5 | µs | ||||
tVDD+ to OUT | VDD UVLO on delay to output high | IN+ = VCC, IN– = GND | 2 | 5 | 8 | ||
tVDD– to OUT | VDD UVLO off delay to output low | 5 | 10 | ||||
tVDD+ to RDY | VDD UVLO on delay to RDY high | RST/EN = FLT=High | 10 | 15 | |||
tVDD– to RDY | VDD UVLO off delay to RDY low | 10 | 15 | ||||
VCC, VDD QUIESCENT CURRENT | |||||||
IVCCQ | VCC quiescent current | OUT(H) = High, fS = 0Hz, AIN=2V | 2.5 | 3 | 4 | mA | |
OUT(L) = Low, fS = 0Hz, AIN=2V | 1.45 | 2 | 2.75 | ||||
IVDDQ | VDD quiescent current | OUT(H) = High, fS = 0Hz, AIN=2V | 3.6 | 4 | 5.9 | mA | |
OUT(L) = Low, fS = 0Hz, AIN=2V | 3.1 | 3.7 | 5.3 | ||||
LOGIC INPUTS — IN+, IN– and RST/EN | |||||||
VINH | Input high threshold | VCC=3.3V | 1.85 | 2.31 | V | ||
VINL | Input low threshold | VCC=3.3V | 0.99 | 1.52 | V | ||
VINHYS | Input threshold hysteresis | VCC=3.3V | 0.33 | V | |||
IIH | Input high level input leakage current | VIN = VCC | 90 | µA | |||
IIL | Input low level input leakage | VIN = GND | –90 | µA | |||
RIND | Input pins pull down resistance | see Detailed Description for more information | 28.5 | 55 | 113 | kΩ | |
RINU | Input pins pull up resistance | see Detailed Description for more information | 28.5 | 55 | 113 | ||
TINFIL | IN+, IN– and RST/EN deglitch (ON and OFF) filter time | fS = 50kHz | 28 | 40 | 60 | ns | |
TRSTFIL | Deglitch filter time to reset /FLT | 400 | 650 | 800 | ns | ||
GATE DRIVER STAGE | |||||||
IOUT, IOUTH | Peak source current | CL=0.18µF, fS=1kHz | 10 | A | |||
IOUT, IOUTL | Peak sink current | 10 | A | ||||
ROUTH(3) | Output pull-up resistance | IOUT = –0.1A | 1.5 | 2.5 | 4.9 | Ω | |
ROUTL | Output pull-down resistance | IOUT = 0.1A | 0.1 | 0.3 | 0.7 | Ω | |
VOUTH | High level output voltage | IOUT = –0.2A, VDD=18V | 17.5 | V | |||
VOUTL | Low level output voltage | IOUT = 0.2A | 60 | mV | |||
ACTIVE PULLDOWN | |||||||
VOUTPD | Output active pull down on OUT, OUTL | IOUTL or IOUT = 0.1×IOUT(L)(tpy), VDD=OPEN, VEE=COM | 1.5 | 2 | 2.5 | V | |
INTERNAL ACTIVE MILLER CLAMP | |||||||
VCLMPTH | Miller clamp threshold voltage | Reference to VEE | 1.5 | 2.0 | 2.5 | V | |
VCLMPI | Output low clamp voltage | ICLMPI = 1A | VEE + 0.5 | V | |||
ICLMPI | Output low clamp current | VCLMPI = 0V, VEE = –2.5V | 4 | A | |||
RCLMPI | Miller clamp pull down resistance | ICLMPI = 0.2A | 0.6 | Ω | |||
tDCLMPI | Miller clamp ON delay time | CL = 1.8nF | 15 | 50 | ns | ||
SHORT CIRCUIT CLAMPING | |||||||
VCLP-OUT(H) | VOUT–VDD, VOUTH–VDD | OUT = Low, IOUT(H) = 500mA, tCLP=10us | 0.9 | V | |||
VCLP-OUT(L) | VOUT–VDD, VOUTL–VDD | OUT = High, IOUT(L) = 500mA, tCLP=10us | 1.8 | V | |||
VCLP-CLMPI | VCLMPI–VDD | OUT = High, ICLMPI = 20mA, tCLP=10us | 1.0 | V | |||
OC PROTECTION | |||||||
IDCHG | OC pull down current when | VOC = 1V | 40 | mA | |||
VOCTH | Detection Threshold | 0.63 | 0.7 | 0.77 | V | ||
VOCL | Voltage when OUT(L) = LOW, Reference to COM | IOC = 5mA | 0.13 | V | |||
tOCFIL | OC fault deglitch filter | 95 | 120 | 180 | ns | ||
tOCOFF | OC propagation delay to OUT(L) 90% | 150 | 270 | 400 | ns | ||
tOCFLT | OC to FLT low delay | 300 | 530 | 750 | ns | ||
INTERNAL SOFT TURN-OFF | |||||||
ISTO | Soft turn-off current on fault conditions | VDD-VEE=20V, VOUTL-COM=8V | 250 | 400 | 570 | mA | |
ISOLATED TEMPERATURE SENSE AND MONITOR (AIN–APWM) | |||||||
VAIN | Analog sensing voltage range | 0.6 | 4.5 | V | |||
IAIN | Internal
current source |
VAIN=2.5V, -40°C< TJ< 150°C |
196 | 200 | 209 | µA | |
fAPWM | APWM output frequency | VAIN=2.5V | 380 | 400 | 420 | kHz | |
BWAIN | AIN–APWM bandwidth | 10 | kHz | ||||
DAPWM | APWM Dutycycle | VAIN = 0.6V | 86.5 | 88 | 89.5 | % | |
VAIN = 2.5V | 48.5 | 50 | 51.5 | ||||
VAIN = 4.5V | 7.5 | 10 | 11.5 | ||||
FLT AND RDY REPORTING | |||||||
tRDYHLD | VDD UVLO RDY low minimum holding time | 0.55 | 1 | ms | |||
tFLTMUTE | Output mute time on fault | Reset fault through RST/EN | 0.55 | 1 | ms | ||
RODON | Open drain output on resistance | IODON = 5mA | 30 | Ω | |||
VODL | Open drain low output voltage | IODON = 5mA | 0.3 | V | |||
COMMON MODE TRANSIENT IMMUNITY | |||||||
CMTI | Common-mode transient immunity | 150 | V/ns |