DLPU041G April 2016 – July 2024 DLPC230-Q1 , DLPC230S-Q1
Optional non-periodic tests will impact power-up time, and therefore the time to display image content. Table 6-33 provides approximate execution times of non-periodic tests for design consideration. These values are not specifications, and actual execution times will vary.
Flash bandwidth will impact test speed since test data is stored in flash. Bandwidth is calculated as number of read lines multiplied by SPI data rate. For example, quad I/O SPI at 49.41MHz has a bandwidth of 197.64 Mbps.
A test setup time must be accounted for once if any number of tests are performed. Refer to Table 6-34. The formula for execution time is tTest_Setup + ∑tTest. Test setup time does not apply to Boot Application tests, or DAC to ADC Loop BIST.
TEST | TIME (ms) | |
---|---|---|
LOW FLASH BANDWIDTH (50.92 Mbps) | HIGH FLASH BANDWIDTH (197.64 Mbps) | |
DLPC230-Q1 Front End Functional Test | 20 | 18 |
DLPC230-Q1 Back End Functional Test | 10 | 7 |
DLPC230-Q1 Memory BISTs | 47 | 28 |
TPS99000-Q1 Signal Interface Test | 3 | 2 |
DAC to ADC Loop BIST | 27 | 26 |
DMD Memory Test | 42 | 38 |
Flash Data Verification (Boot) | 180 | |
DLPC230-Q1 Command and Flash Interface Memory Test (Boot) | 1 |
TEST | TIME (ms) | |
---|---|---|
LOW FLASH BANDWIDTH (50.92 Mbps) | HIGH FLASH BANDWIDTH (197.64 Mbps) | |
Test Setup | 2 | 1 |