JAJSDF7A
January 2017 – May 2017
LMK61E0M
PRODUCTION DATA.
1
特長
2
アプリケーション
3
概要
Device Images
ピン配列と単純なブロック図
4
改訂履歴
5
Pin Configuration and Functions
Pin Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Electrical Characteristics - Power Supply
6.6
3.3-V LVCMOS Output Characteristics
6.7
OE Input Characteristics
6.8
ADD Input Characteristics
6.9
Frequency Tolerance Characteristics
6.10
Frequency Margining Characteristics
6.11
Power-On/Reset Characteristics (VDD)
6.12
I2C-Compatible Interface Characteristics (SDA, SCL)
6.13
Other Characteristics
6.14
PLL Clock Output Jitter Characteristics
6.15
Additional Reliability and Qualification
6.16
Typical Characteristics
7
Parameter Measurement Information
7.1
Device Output Configurations
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Device Block-Level Description
8.3.2
Device Configuration Control
8.3.3
Register File Reference Convention
8.3.4
Configuring the PLL
8.3.5
Integrated Oscillator
8.3.6
Reference Divider and Doubler
8.3.7
Phase Frequency Detector
8.3.8
Feedback Divider (N)
8.3.9
Fractional Engine
8.3.10
Charge Pump
8.3.11
Loop Filter
8.3.12
VCO Calibration
8.3.13
High-Speed Output Divider
8.3.14
High-Speed Clock Output
8.3.15
Device Status
8.3.15.1
Loss of Lock
8.4
Device Functional Modes
8.4.1
Interface and Control
8.4.2
DCXO Mode and Frequency Margining
8.4.2.1
DCXO Mode
8.4.2.2
Fine Frequency Margining
8.4.2.3
Coarse Frequency Margining
8.5
Programming
8.5.1
I2C Serial Interface
8.5.2
Block Register Write
8.5.3
Block Register Read
8.5.4
Write SRAM
8.5.5
Write EEPROM
8.5.6
Read SRAM
8.5.7
Read EEPROM
8.6
Register Maps
8.6.1
Register Descriptions
8.6.1.1
VNDRID_BY1 Register; R0
8.6.1.2
VNDRID_BY0 Register; R1
8.6.1.3
PRODID Register; R2
8.6.1.4
REVID Register; R3
8.6.1.5
SLAVEADR Register; R8
8.6.1.6
EEREV Register; R9
8.6.1.7
DEV_CTL Register; R10
8.6.1.8
XO_CAPCTRL_BY1 Register; R16
8.6.1.9
XO_CAPCTRL_BY0 Register; R17
8.6.1.10
CMOSCTL Register; R20
8.6.1.11
DIFFCTL Register; R21
8.6.1.12
OUTDIV_BY1 Register; R22
8.6.1.13
OUTDIV_BY0 Register; R23
8.6.1.14
RDIVCMOSCTL Register; R24
8.6.1.15
PLL_NDIV_BY1 Register; R25
8.6.1.16
PLL_NDIV_BY0 Register; R26
8.6.1.17
PLL_FRACNUM_BY2 Register; R27
8.6.1.18
PLL_FRACNUM_BY1 Register; R28
8.6.1.19
PLL_FRACNUM_BY0 Register; R29
8.6.1.20
PLL_FRACDEN_BY2 Register; R30
8.6.1.21
PLL_FRACDEN_BY1 Register; R31
8.6.1.22
PLL_FRACDEN_BY0 Register; R32
8.6.1.23
PLL_MASHCTRL Register; R33
8.6.1.24
PLL_CTRL0 Register; R34
8.6.1.25
PLL_CTRL1 Register; R35
8.6.1.26
PLL_LF_R2 Register; R36
8.6.1.27
PLL_LF_C1 Register; R37
8.6.1.28
PLL_LF_R3 Register; R38
8.6.1.29
PLL_LF_C3 Register; R39
8.6.1.30
PLL_CALCTRL Register; R42
8.6.1.31
NVMSCRC Register; R47
8.6.1.32
NVMCNT Register; R48
8.6.1.33
NVMCTL Register; R49
8.6.1.34
MEMADR Register; R51
8.6.1.35
NVMDAT Register; R52
8.6.1.36
RAMDAT Register; R53
8.6.1.37
NVMUNLK Register; R56
8.6.1.38
INT_LIVE Register; R66
8.6.1.39
SWRST Register; R72
9
Application and Implementation
9.1
Application Information
9.2
Typical Application
9.2.1
Design Requirements
9.2.2
Detailed Design Procedure
9.2.2.1
PLL Loop Filter Design
9.2.2.2
Spur Mitigation Techniques
9.2.2.2.1
Phase Detection Spur
9.2.2.2.2
Integer Boundary Fractional Spur
9.2.2.2.3
Primary Fractional Spur
9.2.2.2.4
Sub-Fractional Spur
9.2.2.3
Device Programming
9.2.3
Application Curves
10
Power Supply Recommendations
11
Layout
11.1
Layout Guidelines
11.1.1
Ensured Thermal Reliability
11.1.2
Best Practices for Signal Integrity
11.1.3
Recommended Solder Reflow Profile
11.2
Layout Example
12
デバイスおよびドキュメントのサポート
12.1
ドキュメントのサポート
12.1.1
関連資料
12.2
ドキュメントの更新通知を受け取る方法
12.3
コミュニティ・リソース
12.4
商標
12.5
静電気放電に関する注意事項
12.6
Glossary
13
メカニカル、パッケージ、および注文情報
11
Layout