JAJSDN6C December   2016  – December 2017 LMK60E0-156M , LMK60E0-212M , LMK60E2-100M , LMK60E2-125M , LMK60E2-156M , LMK60I2-100M , LMK60I2-322M

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 改訂履歴
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics - Power Supply
    6. 6.6  LVPECL Output Characteristics
    7. 6.7  LVDS Output Characteristics
    8. 6.8  HCSL Output Characteristics
    9. 6.9  OE Input Characteristics
    10. 6.10 Frequency Tolerance Characteristics
    11. 6.11 Power-On/Reset Characteristics (VDD)
    12. 6.12 PSRR Characteristics
    13. 6.13 PLL Clock Output Jitter Characteristics
    14. 6.14 Additional Reliability and Qualification
  7. 7 Parameter Measurement Information
    1. 7.1 Device Output Configurations
  8. 8 Power Supply Recommendations
  9. 9 Layout
    1. 9.1 Layout Guidelines
      1. 9.1.1 Ensuring Thermal Reliability
      2. 9.1.2 Best Practices for Signal Integrity
      3. 9.1.3 Recommended Solder Reflow Profile
  10. 10デバイスおよびドキュメントのサポート
    1. 10.1 ドキュメントの更新通知を受け取る方法
    2. 10.2 コミュニティ・リソース
    3. 10.3 商標
    4. 10.4 静電気放電に関する注意事項
    5. 10.5 Glossary
  11. 11メカニカル、パッケージ、および注文情報

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD Device supply voltage –0.3 3.6 V
VIN Output voltage for logic inputs –0.3 VDD + 0.3 V
VOUT Output voltage for clock outputs –0.3 VDD + 0.3 V
TJ Junction temperature 150 °C
TSTG Storage temperature –40 125 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute maximum-rated conditions for extended periods may affect device reliability.

6.2 ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±500
(1) JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)
MIN NOM MAX UNIT
VDD Device supply voltage 3.135 3.3 3.465 V
TA Ambient temperature –40 25 85 °C
TJ Junction temperature 105 °C
tRAMP VDD power-up ramp time 0.1 100 ms

6.4 Thermal Information

THERMAL METRIC(1) LMK60EX (2) (3) (4) UNIT
SIA (QFM)
6 PINS
Airflow (LFM) 0
RθJA Junction-to-ambient thermal resistance 74.8 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 46.7 °C/W
RθJB Junction-to-board thermal resistance 49.0 °C/W
ψJT Junction-to-top characterization parameter 14.8 °C/W
ψJB Junction-to-board characterization parameter 48.7 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance n/a °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.
(2) The package thermal resistance is calculated on a 4 layer JEDEC board.
(3) Connected to GND with 2 thermal vias (0.3-mm diameter).
(4) ψJB (junction to board) is used when the main heat flow is from the junction to the GND pad. Please refer to Thermal Considerations section for more information on ensuring good system reliability and quality.

6.5 Electrical Characteristics - Power Supply(1)

VDD = 3.3 V ± 5%, TA = -40C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
IDD Device current consumption LVPECL(2) 95 110 mA
LVDS 85 100
HCSL(3) 90 105
IDD-PD Device current consumption when output is disabled OE = GND 70 mA
(1) Refer to Parameter Measurement Information for relevant test conditions.
(2) On-chip power dissipation should exclude 40 mW, dissipated in the 150 Ω termination resistors, from total power dissipation.
(3) Excludes load current.

6.6 LVPECL Output Characteristics(1)

VDD = 3.3 V ± 5%, TA = -40C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
fOUT Output frequency(2) 400 MHz
VOD Output voltage swing (VOH – VOL)(2) 700 950 1200 mV
VOUT, DIFF, PP Differential output peak-to-peak swing 2 × |VOD| V
VOS Output common-mode voltage VDD – 1.45 V
tR / tF Output rise/fall time (20% to 80%)(3) 260 350 ps
ODC Output duty cycle(3) 45% 55%
(1) Refer to Parameter Measurement Information for relevant test conditions.
(2) An output frequency over fOUT max spec is possible, but output swing may be less than VOD min spec.
(3) Ensured by characterization.

6.7 LVDS Output Characteristics(1)

VDD = 3.3 V ± 5%, TA = -40°C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
fOUT Output frequency(1) 400 MHz
VOD Output voltage swing (VOH – VOL)(1) 300 390 480 mV
VOUT, DIFF, PP Differential output peak-to-peak swing 2 x |VOD| V
VOS Output common-mode voltage 1.2 V
tR / tF Output rise/fall time (20% to 80%)(2) 260 350 ps
ODC Output duty cycle(2) 45% 55%
ROUT Differential output impedance 107 Ω
(1) An output frequency over fOUT max spec is possible, but output swing may be less than VOD min spec.
(2) Ensured by characterization.

6.8 HCSL Output Characteristics(1)

VDD = 3.3 V ± 5%, TA = -40°C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
fOUT Output frequency 400 MHz
VOH Output high voltage 660 900 mV
VOL Output low voltage –100 100 mV
VCROSS Absolute crossing voltage(2)(3) 250 475 mV
VCROSS-DELTA Variation of VCROSS(2)(3) 0 140 mV
dV/dt Slew rate(4) 1 3 V/ns
ODC Output duty cycle(4) 45% 55%
(1) Refer to Parameter Measurement Information for relevant test conditions.
(2) Measured from –150 mV to +150 mV on the differential waveform with the 300 mVpp measurement window centered on the differential zero crossing.
(3) Ensured by design.
(4) Ensured by characterization.

6.9 OE Input Characteristics

VDD = 3.3 V ± 5%, TA = -40°C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VIH Input high voltage 1.4 V
VIL Input low voltage 0.6 V
IIH Input high current VIH = VDD –40 40 µA
IIL Input low current VIL = GND –40 40 µA
CIN Input capacitance 2 pF

6.10 Frequency Tolerance Characteristics(1)

VDD = 3.3 V ± 5%, TA = -40°C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
fT Total frequency tolerance LMK60X2: All output formats, frequency bands and device junction temperature up to 105°C; includes initial freq tolerance, temperature & supply voltage variation, solder reflow and 5-year aging at 40°C –50 50 ppm
LMK60X0: All output formats, frequency bands and device junction temperature up to 105°C; includes initial freq tolerance, temperature & supply voltage variation, solder reflow and 5-year aging at 40°C –25 25 ppm
(1) Ensured by characterization.

6.11 Power-On/Reset Characteristics (VDD)

VDD = 3.3 V ± 5%, TA = -40°C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VTHRESH Threshold voltage(1) 2.85 3 V
VDROOP Allowable voltage droop(2) 0.1 V
tSTARTUP Start-up time (1) Time elapsed from VDD at 3.135 V to output enabled 10 ms
tOE-EN Output enable time(2) Time elapsed from OE at VIH to output enabled 50 µs
tOE-DIS Output disable time(2) Time elapsed from OE at VIL to output disabled 50 µs
(1) Ensured by characterization.
(2) Ensured by design.

6.12 PSRR Characteristics(1)

VDD = 3.3 V, TA = 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
PSRR Spurs induced by 50-mV power supply ripple(2)(3) at 156.25-MHz output, all output types Sine wave at 50 kHz –60 dBc
Sine wave at 100 kHz –60
Sine wave at 500 kHz –60
Sine wave at 1 MHz –60
(1) Refer to Parameter Measurement Information for relevant test conditions.
(2) Measured max spur level with 50 mVpp sinusoidal signal between 50 kHz and 1 MHz applied on VDD pin
(3) DJSPUR (ps, pk-pk) = [2*10(SPUR/20) / (π*fOUT)]*1e6, where PSRR or SPUR in dBc and fOUT in MHz.

6.13 PLL Clock Output Jitter Characteristics(1)(3)

VDD = 3.3 V ± 5%, TA = -40°C to 85°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
RJ RMS phase jitter(2)
(12 kHz – 20 MHz)
 fOUT ≥ 100 MHz, all output types 150 250 fs RMS
(1) Refer to Parameter Measurement Information for relevant test conditions.
(2) Ensured by characterization.
(3) Phase jitter measured with Agilent E5052 signal source analyzer using a differential-to-single ended converter (balun or buffer).

6.14 Additional Reliability and Qualification

PARAMETER CONDITION / TEST METHOD
Mechanical Shock MIL-STD-202, Method 213
Mechanical Vibration MIL-STD-202, Method 204
Moisture Sensitivity Level J-STD-020, MSL3