JAJSF53E July   2015  – July 2024 TUSB4020BI

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings #GUID-E9510BAC-794F-43CD-A047-0D0FFB7C50BE/ABSMAXNOTE
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 3.3V I/O Electrical Characteristics
    6. 5.6 Hub Input Supply Current
    7. 5.7 Power-Up Timing Requirements
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Battery Charging Features
      2. 6.3.2 USB Power Management
      3. 6.3.3 Clock Generation
      4. 6.3.4 Power-Up and Reset
    4. 6.4 Device Functional Modes
      1. 6.4.1 External Configuration Interface
    5. 6.5 Programming
      1. 6.5.1 One-Time Programmable (OTP) Configuration
      2. 6.5.2 I2C EEPROM Operation
      3. 6.5.3 SMBus Target Operation
    6. 6.6 Register Maps
      1. 6.6.1 Configuration Registers
        1. 6.6.1.1  ROM Signature Register (offset = 0h) [reset = 0h]
        2. 6.6.1.2  Vendor ID LSB Register (offset = 1h) [reset = 51h]
        3. 6.6.1.3  Vendor ID MSB Register (offset = 2h) [reset = 4h]
        4. 6.6.1.4  Product ID LSB Register (offset = 3h) [reset = 25h]
        5. 6.6.1.5  Product ID MSB Register (offset = 4h) [reset = 80h]
        6. 6.6.1.6  Device Configuration Register (offset = 5h) [reset = 1Xh]
        7. 6.6.1.7  Battery Charging Support Register (offset = 6h) [reset = 0Xh]
        8. 6.6.1.8  Device Removable Configuration Register (offset = 7h) [reset = 0Xh]
        9. 6.6.1.9  Port Used Configuration Register (offset = 8h) [reset = 0h]
        10. 6.6.1.10 PHY Custom Configuration Register (offset = 9h) [reset = 0h]
        11. 6.6.1.11 Device Configuration Register 2 (offset = Ah)
        12. 6.6.1.12 UUID Registers (offset = 10h to 1Fh)
        13. 6.6.1.13 Language ID LSB Register (offset = 20h)
        14. 6.6.1.14 Language ID MSB Register (offset = 21h)
        15. 6.6.1.15 Serial Number String Length Register (offset = 22h)
        16. 6.6.1.16 Manufacturer String Length Register (offset = 23h)
        17. 6.6.1.17 Product String Length Register (offset = 24h)
        18. 6.6.1.18 Serial Number Registers (offset = 30h to 4Fh)
        19. 6.6.1.19 Manufacturer String Registers (offset = 50h to 8Fh)
        20. 6.6.1.20 Product String Registers (offset = 90h to CFh)
        21. 6.6.1.21 Additional Feature Configuration Register (offset = F0h)
        22. 6.6.1.22 Charging Port Control Register (offset = F2h)
        23. 6.6.1.23 Device Status and Command Register (offset = F8h)
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Crystal Requirements
      2. 7.1.2 Input Clock Requirements
    2. 7.2 Typical Applications
      1. 7.2.1 Upstream Port Implementation
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Design Procedure
        3. 7.2.1.3 Application Curves
      2. 7.2.2 Downstream Port 1 Implementation
      3. 7.2.3 Downstream Port 2 Implementation
      4. 7.2.4 VBUS Power Switch Implementation
      5. 7.2.5 Clock, Reset, and Miscellaneous
      6. 7.2.6 Power Implementation
    3. 7.3 Power Supply Recommendations
      1. 7.3.1 Power Supply
      2. 7.3.2 Downstream Port Power
      3. 7.3.3 Ground
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
        1. 7.4.1.1 Placement
        2. 7.4.1.2 Package Specific
        3. 7.4.1.3 Differential Pairs
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Documentation Support
      1. 8.1.1 Related Documentation
    2. 8.2 ドキュメントの更新通知を受け取る方法
    3. 8.3 サポート・リソース
    4. 8.4 Trademarks
    5. 8.5 静電気放電に関する注意事項
    6. 8.6 用語集
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

8.5 静電気放電に関する注意事項

TUSB4020BI この IC は、ESD によって破損する可能性があります。テキサス・インスツルメンツは、IC を取り扱う際には常に適切な注意を払うことを推奨します。正しい取り扱いおよび設置手順に従わない場合、デバイスを破損するおそれがあります。
ESD による破損は、わずかな性能低下からデバイスの完全な故障まで多岐にわたります。精密な IC の場合、パラメータがわずかに変化するだけで公表されている仕様から外れる可能性があるため、破損が発生しやすくなっています。