改訂履歴
リビジョン C からリビジョン D への変更点
Changes from March 6, 2019 to December 10, 2019
- Figure 1-1、「MSP430FR235x の機能ブロック図」および Figure 1-2、「MSP430FR215x の機能ブロック図」で ROM サイズを訂正Go
- Added a note on all VQFN pinouts to indicate that the thermal pad should be connected to VSSGo
- Corrected Figure 3-4, 32-Pin RSM (VQFN) (Top View) – MSP430FR235xGo
- Changed the note that begins "Supply voltage changes faster than 0.2 V/µs can trigger a BOR reset..." in Section 4.3, Recommended Operating ConditionsGo
- Added the note that begins "TI recommends that power to the DVCC pin must not exceed the limits..." in Section 4.3, Recommended Operating ConditionsGo
- Changed the note that begins "A capacitor tolerance of ±20% or better is required..." in Section 4.3, Recommended Operating ConditionsGo
- Combined former sections 5.8 and 5.10 into Section 4.9, Production Distribution of LPM Supply CurrentsGo
- Corrected the "SVS disabled" condition for Figure 4-1Go
- Added the note "See MSP430 32-kHz Crystal Oscillators for details on crystal section, layout, and testing" to Table 4-3, XT1 Crystal Oscillator (Low Frequency)Go
- Changed the note that begins "Requires external capacitors at both terminals..." in Table 4-3, XT1 Crystal Oscillator (Low Frequency)Go
- Corrected the test conditions for the RI parameter in Table 4-20, ADC, Power Supply and Input Range ConditionsGo
- Removed ADCDIV from the equation for the ADC conversion time because ADCCLK is after division in Table 4-21, ADC, Timing ParametersGo
- Added the note that begins "tSample = ln(2n+1) × τ ..." in Table 4-21, ADC, Timing ParametersGo
- Changed the unit from "nV" to "µV" for the "Input noise voltage" in the Table 4-25, SAC, OAGo
- Changed the unit from "nv/Hz" to "nV/√Hz" for the "Input noise voltage density" in the Table 4-25, SAC, OAGo
- Changed the bitfield name from RTCCLK to RTCCKSEL in the table note on Table 5-9, Clock DistributionGo
- Added Section 5.10.17, Cross-Chip Interconnection (SACx are MSP430FR235x Devices Only)Go
- Added P1SELC information in Table 5-41, Port P1, P2 Registers (Base Address: 0200h)Go
- Added P2SELC information in Table 5-41, Port P1, P2 Registers (Base Address: 0200h)Go
- Added P3SELC information in Table 5-42, Port P3, P4 Registers (Base Address: 0220h)Go
- Added P4SELC information in Table 5-42, Port P3, P4 Registers (Base Address: 0220h)Go
- Added P5SELC information in Table 5-43, Port P5, P6 Registers (Base Address: 0240h)Go
- Added P6SELC information in Table 5-43, Port P5, P6 Registers (Base Address: 0240h)Go
- Changed CRC covered end address to 0x1AF7 in table note (1) in Table 5-70, Device DescriptorsGo
Changes from July 3, 2018 to March 5, 2019
- Section 1.1、「特長」に 32 ピン VQFN (RSM) パッケージの情報を追加Go
- Section 1.3、「概要」の「製品情報」表に、32 ピン VQFN (RSM) パッケージの情報を追加Go
- Added 32-pin VQFN (RSM) package information in Table 2-1, Device ComparisonGo
- Added Figure 3-4, 32-Pin RSM (VQFN) (Top View) – MSP430FR235xGo
- Added Figure 3-8, 32-Pin RSM (VQFN) (Top View) – MSP430FR215xGo
- Added 32-pin VQFN (RSM) package information in Section 3.2, Pin AttributesGo
- Added 32-pin VQFN (RSM) package information in Section 3.3, Signal DescriptionsGo
- Added 32-pin VQFN (RSM) package information in Section 4.11, Thermal Resistance CharacteristicsGo
Changes from June 20, 2018 to July 2, 2018
- Section 7.3、「ツールとソフトウェア」を更新Go
- Section 7.4、「ドキュメントのサポート」に正誤表を追加Go
Changes from May 11, 2018 to June 19, 2018
- ドキュメント・ステータスを量産データに変更Go
- Added missing UCB0SCL signal to P1.3/UCB0SOMI/UCB0SCL/OA0+/A3 in pinout figuresGo
- Added row for "Driver library and FFT library" in Table 5-4, Memory OrganizationGo
- Added Section 6.3, ROM LibrariesGo
- Corrected the title and link to reference design in Table 6-1, Tools and Reference DesignsGo