4 Revision History
Changes from Revision B (February 2019) to Revision C (April 2023)
- タイトル説明を変更Go
- Added Key Device Default Settings Table.Go
- Added clarification to LP pin
description.Go
- Added clarification to ADCIN pin description.Go
- Changed maximum recommended PMID output current.Go
- Changed maximum RON(BAT-PMID) in Electrical Characteristics.Go
- Changed tHW_RESET_WD test conditions and MAX
valueGo
- Changed tRESET_WARN and tHW_RESET
parametersGo
- Changed Input Voltage Based Dynamic Power Management (VINDPM) and Dynamic Power Path Management (DPPM)section to simplify descriptionGo
- Added clarification to ADC functionality when VIN is present.Go
- Added clarification to ADC %ICHARGE readingGo
- Added more details to the ADC Programmable Comparator description.Go
- Deleted incorrect reference to LS_CTRL pin and updated descriptionGo
- Added clarification on LDO voltage programmabilityGo
- Updated Figure 9-3
Go
- Changed tHW_RESET_WARN to tRESET_WARN and VIN
presence to valid VIN presence in Section 9.3.7.2
Go
- Added clarification to TS biasing operationGo
- Deleted as well from Section 9.4.1
descriptionGo
- Added link to BQ25150 Setup Guide and Setup Guide ToolGo
- Changed registers 0x42 to 0x4F from R/W-X to R-X and R/W to R for
typeGo
- Changed IBAT_OCP_ILIM 2b10 setting description from 1500 mA to
DisabledGo
- Added clarification to TS_EN bit functionalityGo
- Changed from TS to ground to from IMAX to ground in Section 10.2.2.3
Go
- Added TS Biasing FigureGo
- Added VINLS bypass capacitor layout guidelineGo
Changes from Revision * (July 2018) to Revision A (October 2018)