JAJSI70C May   2008  – November 2019 DAC9881

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      ブロック図
  4. 4 改訂履歴
  5. 5 概要（続き）
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics: AVDD = 5 V
    6. 7.6  Electrical Characteristics: AVDD = 2.7 V
    7. 7.7  Timing Requirements—Standalone Operation Without SDO
    8. 7.8  Timing Requirements—Standalone Operation With SDO and Daisy-Chain Mode
    9. 7.9  Typical Characteristics: AVDD = 5 V
    10. 7.10 Typical Characteristics: AVDD = 2.7 V
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Analog Output
      2. 8.3.2  Reference Inputs
      3. 8.3.3  Output Range
      4. 8.3.4  Input Data Format
      5. 8.3.5  Hardware Reset
      6. 8.3.6  Power-On Reset
        1. 8.3.6.1 Program Reset Value
      7. 8.3.7  Power Down
      8. 8.3.8  Double-Buffered Interface
        1. 8.3.8.1 Load DAC Pin (LDAC)
          1. 8.3.8.1.1 Synchronous Mode
          2. 8.3.8.1.2 Asynchronous Mode
      9. 8.3.9  1.8-V to 5-V Logic Interface
      10. 8.3.10 Power-Supply Sequence
    4. 8.4 Device Functional Modes
      1. 8.4.1 Serial Interface
        1. 8.4.1.1 Input Shift Register
          1. 8.4.1.1.1 Stand-Alone Mode
          2. 8.4.1.1.2 Daisy-Chain Mode
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Bipolar Operation Using the DAC9881
    2. 9.2 Typical Application
      1. 9.2.1 DAC9881 Sample-and-Hold Circuit
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
    3. 9.3 System Example
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 ドキュメントのサポート
      1. 12.1.1 関連資料
    2. 12.2 ドキュメントの更新通知を受け取る方法
    3. 12.3 サポート・リソース
    4. 12.4 商標
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 Glossary
  13. 13メカニカル、パッケージ、および注文情報

9.2.1.3 Application Curves

Glitch reduction and total unadjusted error (TUE) plots of the solution presented in Sample and Hold Glitch Reduction for Precision Outputs Design Guide (TIDU022) is shown in the following plots. The glitch area is reduced from 35.11 nVs to 2.01 nVs.

DAC9881 fig_24_sbas337.png
Figure 73. DAC9881 Sample-and-Hold TUE Error %FSR
DAC9881 fig_33_sbas337.png
CH = 8.2 nF RS = 14.7 Ω
Figure 74. Measured Glitch Area (20000h-1FFFFh)
(Top) Digital Signal One-Shot Pulse; (Middle) DAC Output Glitch; (Bottom) S-H Output Glitch