Figure 8-1 LVDS Output DC Configuration During Device Test
Figure 8-2 LVDS
Output AC Configuration During Device Test
Figure 8-3 DC-Coupled LVCMOS Input During Device Test
Figure 8-4 Output Voltage and Rise/Fall Time
A. Output skew is calculated as the greater of the following: the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn (n = 0, 1, 2, ..7)
B. Part to part skew is calculated as the greater of the following: the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn across multiple devices (n = 0, 1, 2, ..7)