JAJSLO2C March   2021  – January 2024 AWR1843AOP

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
    1. 3.1 機能ブロック図
  5. 4 Device Comparison
    1. 4.1 Related Products
  6. 5 Terminal Configuration and Functions
    1. 5.1 Pin Diagram
    2. 5.2 Pin Attributes
    3. 5.3 Signal Descriptions
      1. 5.3.1 Pin Functions - Digital and Analog [ALP Package]
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Power-On Hours (POH)
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Power Supply Specifications
    6. 6.6  Power Consumption Summary
    7. 6.7  RF Specification
    8. 6.8  CPU Specifications
    9. 6.9  Thermal Resistance Characteristics for FCBGA Package [ALP0180A]
    10. 6.10 Timing and Switching Characteristics
      1. 6.10.1  Antenna Radiation Patterns
        1. 6.10.1.1 Antenna Radiation Patterns for Receiver
        2. 6.10.1.2 Antenna Radiation Patterns for Transmitter
      2. 6.10.2  Antenna Positions
      3. 6.10.3  Power Supply Sequencing and Reset Timing
      4. 6.10.4  Input Clocks and Oscillators
        1. 6.10.4.1 Clock Specifications
      5. 6.10.5  Multibuffered / Standard Serial Peripheral Interface (MibSPI)
        1. 6.10.5.1 Peripheral Description
        2. 6.10.5.2 MibSPI Transmit and Receive RAM Organization
          1. 6.10.5.2.1 SPI Timing Conditions
          2. 6.10.5.2.2 SPI Controller Mode Switching Parameters (CLOCK PHASE = 0, SPICLK = output, SPISIMO = output, and SPISOMI = input)
          3. 6.10.5.2.3 SPI Controller Mode Switching Parameters (CLOCK PHASE = 1, SPICLK = output, SPISIMO = output, and SPISOMI = input)
        3. 6.10.5.3 SPI Peripheral Mode I/O Timings
          1. 6.10.5.3.1 SPI Peripheral Mode Switching Parameters (SPICLK = input, SPISIMO = input, and SPISOMI = output)
        4. 6.10.5.4 Typical Interface Protocol Diagram (Slave Mode)
      6. 6.10.6  LVDS Interface Configuration
        1. 6.10.6.1 LVDS Interface Timings
      7. 6.10.7  General-Purpose Input/Output
        1. 6.10.7.1 Switching Characteristics for Output Timing versus Load Capacitance (CL) #GUID-4685AB93-A014-47EA-9F05-952FFC28DBFA/T4362547-45 #GUID-4685AB93-A014-47EA-9F05-952FFC28DBFA/T4362547-50
      8. 6.10.8  Controller Area Network Interface (DCAN)
        1. 6.10.8.1 Dynamic Characteristics for the DCANx TX and RX Pins
      9. 6.10.9  Controller Area Network - Flexible Data-rate (CAN-FD)
        1. 6.10.9.1 Dynamic Characteristics for the CANx TX and RX Pins
      10. 6.10.10 Serial Communication Interface (SCI)
        1. 6.10.10.1 SCI Timing Requirements
      11. 6.10.11 Inter-Integrated Circuit Interface (I2C)
        1. 6.10.11.1 I2C Timing Requirements #GUID-64613E7E-5DDF-4B01-8FA0-13739060F368/T4362547-185
      12. 6.10.12 Quad Serial Peripheral Interface (QSPI)
        1. 6.10.12.1 QSPI Timing Conditions
        2. 6.10.12.2 Timing Requirements for QSPI Input (Read) Timings #GUID-6A95C194-2C40-46FE-9793-4574200DA2C4/T4362547-210 #GUID-6A95C194-2C40-46FE-9793-4574200DA2C4/T4362547-209
        3. 6.10.12.3 QSPI Switching Characteristics
      13. 6.10.13 ETM Trace Interface
        1. 6.10.13.1 ETMTRACE Timing Conditions
        2. 6.10.13.2 ETM TRACE Switching Characteristics
      14. 6.10.14 Data Modification Module (DMM)
        1. 6.10.14.1 DMM Timing Requirements
      15. 6.10.15 JTAG Interface
        1. 6.10.15.1 JTAG Timing Conditions
        2. 6.10.15.2 Timing Requirements for IEEE 1149.1 JTAG
        3. 6.10.15.3 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Subsystems
      1. 7.3.1 RF and Analog Subsystem
        1. 7.3.1.1 Clock Subsystem
        2. 7.3.1.2 Transmit Subsystem
        3. 7.3.1.3 Receive Subsystem
      2. 7.3.2 Processor Subsystem
      3. 7.3.3 Automotive Interface
      4. 7.3.4 Main Subsystem Cortex-R4F Memory Map
      5. 7.3.5 DSP Subsystem Memory Map
    4. 7.4 Other Subsystems
      1. 7.4.1 ADC Channels (Service) for User Application
        1. 7.4.1.1 GP-ADC Parameter
  9. 8 Monitoring and Diagnostics
    1. 8.1 Monitoring and Diagnostic Mechanisms
      1. 8.1.1 Error Signaling Module
  10. 9 Applications, Implementation, and Layout
    1. 9.1 Application Information
    2. 9.2 Reference Schematic
  11. 10Device and Documentation Support
    1. 10.1 Device Nomenclature
    2. 10.2 Tools and Software
    3. 10.3 Documentation Support
    4. 10.4 サポート・リソース
    5. 10.5 Trademarks
    6. 10.6 静電気放電に関する注意事項
    7. 10.7 用語集
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Packaging Information

10.1 Device Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all microprocessors and support tools. Each device has one of three prefixes: X, P, or null (no prefix) (for example, AWR1843AOP). Texas Instruments recommends two of three possible prefix designators for its support tools: TMDX and TMDS. These prefixes represent evolutionary stages of product development from engineering prototypes (TMDX) through fully qualified production devices and tools (TMDS).

Device development evolutionary flow:

    XExperimental device that is not necessarily representative of the final device's electrical specifications and may not use production assembly flow.
    PPrototype device that is not necessarily the final silicon die and may not necessarily meet final electrical specifications.
    nullProduction version of the silicon die that is fully qualified.

Support tool development evolutionary flow:

    TMDXDevelopment-support product that has not yet completed Texas Instruments internal qualification testing.
    TMDSFully-qualified development-support product.

X and P devices and TMDX development-support tools are shipped against the following disclaimer:

"Developmental product is intended for internal evaluation purposes."

Production devices and TMDS development-support tools have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies.

Predictions show that prototype devices (X or P) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used.

TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package type (for example, ALP0180A), the temperature range (for example, blank is the default commercial temperature range). Figure 10-1 provides a legend for reading the complete device name for any AWR1843AOP device.

For orderable part numbers of AWR1843AOP devices in the ALP0180 package types, see the Package Option Addendum of this document, the TI website (www.ti.com), or contact your TI sales representative.

For additional description of the device nomenclature markings on the die, see the AWR1843AOP Device Errata.

GUID-CA4715E7-8FE7-4400-912C-48D8DC612E7E-low.gif Figure 10-1 Device Nomenclature
Note: The silicon revision information, Rev2.0, is different from the device revision information, ES1.0, mentioned in the Errata document. The device revision information ES1.0 is related to both silicon and package revisions.