JAJSRP6A October   2023  – May 2024 TPS3762-Q1

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Device Nomenclature
  6. 5 Device Comparison
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Switching Requirements
    7. 7.7 Timing Requirements
  9. 8 Timing Diagrams
  10. 9 Typical Characteristics
  11. 10Detailed Description
    1. 10.1 Overview
    2. 10.2 Functional Block Diagram
    3. 10.3 Feature Description
      1. 10.3.1 Input Voltage (VDD)
        1. 10.3.1.1 Undervoltage Lockout (VPOR < VDD < UVLO)
        2. 10.3.1.2 Power-On Reset (VDD < VPOR )
      2. 10.3.2 SENSE
        1. 10.3.2.1 Reverse Polarity Protection
        2. 10.3.2.2 SENSE Hysteresis
      3. 10.3.3 Output Logic Configurations
        1. 10.3.3.1 Open-Drain
        2. 10.3.3.2 Active-Low (RESET)
        3. 10.3.3.3 Latching
        4. 10.3.3.4 UVBypass
      4. 10.3.4 User-Programmable Reset Time Delay
        1. 10.3.4.1 Reset Time Delay Configuration
      5. 10.3.5 User-Programmable Sense Delay
        1. 10.3.5.1 Sense Time Delay Configuration
      6. 10.3.6 Built-In Self-Test
    4. 10.4 Device Functional Modes
  12. 11Application and Implementation
    1. 11.1 Application Information
    2. 11.2 Adjustable Voltage Thresholds
    3. 11.3 Typical Application
      1. 11.3.1 Design 1: Off-Battery Monitoring
        1. 11.3.1.1 Design Requirements
        2. 11.3.1.2 Detailed Design Procedure
          1. 11.3.1.2.1 Setting Voltage Threshold
          2. 11.3.1.2.2 Meeting the Sense and Reset Delay
          3. 11.3.1.2.3 Setting Supply Voltage
          4. 11.3.1.2.4 Initiating Built-In Self-Test and Clearing Latch
        3. 11.3.1.3 Application Curves
    4. 11.4 Power Supply Recommendations
      1. 11.4.1 Power Dissipation and Device Operation
    5. 11.5 Layout
      1. 11.5.1 Layout Guidelines
      2. 11.5.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 ドキュメントの更新通知を受け取る方法
    2. 12.2 サポート・リソース
    3. 12.3 Trademarks
    4. 12.4 静電気放電に関する注意事項
    5. 12.5 用語集
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information
11.3.1.2.4 Initiating Built-In Self-Test and Clearing Latch

Built-In Self-Test (BIST) is asserted on device power-up, as outlined in Figure 10-10. BIST can also be initiated any time by a rising edge that crosses the voltage logic high input (VBIST_EN or VBIST_EN/LATCH_CLR > 1.3V) on the BIST_EN / LATCH_CLR pin, as outlined in Figure 10-11. Output reset latching is set by the device variant. For the device variant used in this design, TPS3762D02OVDDFRQ1, the output has latch. Device specific output reset latching feature can be found in Device Decoder. To clear the latch a logic high input on the BIST_EN / LATCH_CLR pin is required. When clearing latch, BIST is initiated and the RESET returns logic level high once tBIST + tBIST_recover + tCTR has expired, outlined in Figure 10-6. While VBIST_EN/LATCH_CLR > 1.3V, the device is in latch disabled mode and the RESET does not latch for OV and UV on SENSE pin. While the device is in latch disabled mode the RESET still asserts for OV and UV faults.