JAJSV55 August   2024 BQ2969

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Pin Details
        1. 7.3.1.1 Input Sense Voltage, Vx
        2. 7.3.1.2 Output Drive, OUT
        3. 7.3.1.3 Supply Input, VDD
        4. 7.3.1.4 Regulated Supply Output, REG
      2. 7.3.2 Overvoltage Sensing for OUT
      3. 7.3.3 Regulator Output Voltage
    4. 7.4 Device Functional Modes
      1. 7.4.1 NORMAL Mode
      2. 7.4.2 OVERVOLTAGE Mode
      3. 7.4.3 UNDERVOLTAGE Mode
      4. 7.4.4 CUSTOMER TEST MODE
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  10. 9 Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 サード・パーティ製品に関する免責事項
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 サポート・リソース
    4. 11.4 Trademarks
    5. 11.5 静電気放電に関する注意事項
    6. 11.6 用語集
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information

7.4.4 CUSTOMER TEST MODE

The Customer Test Mode (CTM) helps to reduce test time for checking the overvoltage delay-timer parameter once the circuit is implemented into the battery pack. To enter CTM, the VDD pin must be set at approximately 10V higher than V4 (see Figure 7-4). In this mode, the overvoltage delay timer is reduced to approximately 20ms, considerably shorter than the timer delay in normal operation. To exit CTM, reduce the VDD voltage back to the voltage of V4, which causes the device to exit this mode.

CAUTION:

Avoid exceeding any Absolute Maximum Voltages on any pins when placing the device into CTM. Stressing the pins beyond the rated limits can cause permanent damage to the device.

Figure 7-4 shows the timing for the Customer Test Mode.

BQ2969 Timing for Customer Test Mode Figure 7-4 Timing for Customer Test Mode

Figure 7-5 shows the measurement for current consumption of the product for VDD and the cell input pins.

BQ2969 Configuration for Integrated Circuit Current Consumption Test Figure 7-5 Configuration for Integrated Circuit Current Consumption Test