JAJSVI4 October   2024 ADS127L21B

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements (1.65V ≤ IOVDD ≤ 2V)
    7. 5.7  Switching Characteristics (1.65V ≤ IOVDD ≤ 2V)
    8. 5.8  Timing Requirements (2V < IOVDD ≤ 5.5V)
    9. 5.9  Switching Characteristics (2V < IOVDD ≤ 5.5V)
    10. 5.10 Timing Diagrams
    11. 5.11 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1  Offset Error Measurement
    2. 6.2  Offset Drift Measurement
    3. 6.3  Gain Error Measurement
    4. 6.4  Gain Drift Measurement
    5. 6.5  NMRR Measurement
    6. 6.6  CMRR Measurement
    7. 6.7  PSRR Measurement
    8. 6.8  SNR Measurement
    9. 6.9  INL Error Measurement
    10. 6.10 THD Measurement
    11. 6.11 IMD Measurement
    12. 6.12 SFDR Measurement
    13. 6.13 Noise Performance
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog Input (AINP, AINN)
        1. 7.3.1.1 Input Range
      2. 7.3.2 Reference Voltage (REFP, REFN)
        1. 7.3.2.1 Reference Voltage Range
      3. 7.3.3 Clock Operation
        1. 7.3.3.1 Internal Oscillator
        2. 7.3.3.2 External Clock
      4. 7.3.4 Modulator
      5. 7.3.5 Digital Filter
        1. 7.3.5.1 Wideband Filter
          1. 7.3.5.1.1 Wideband Filter Options
          2. 7.3.5.1.2 Sinc5 Filter Stage
          3. 7.3.5.1.3 FIR1 Filter Stage
          4. 7.3.5.1.4 FIR2 Filter Stage
          5. 7.3.5.1.5 FIR3 Filter Stage
          6. 7.3.5.1.6 FIR3 Default Coefficients
          7. 7.3.5.1.7 IIR Filter Stage
            1. 7.3.5.1.7.1 IIR Filter Stability
        2. 7.3.5.2 Low-Latency Filter (Sinc)
          1. 7.3.5.2.1 Sinc3 and Sinc4 Filters
          2. 7.3.5.2.2 Sinc3 + Sinc1 and Sinc4 + Sinc1 Cascade Filter
      6. 7.3.6 Power Supplies
        1. 7.3.6.1 AVDD1 and AVSS
        2. 7.3.6.2 AVDD2
        3. 7.3.6.3 IOVDD
        4. 7.3.6.4 Power-On Reset (POR)
        5. 7.3.6.5 CAPA and CAPD
      7. 7.3.7 VCM Output Voltage
    4. 7.4 Device Functional Modes
      1. 7.4.1 Speed Modes
      2. 7.4.2 Idle Mode
      3. 7.4.3 Standby Mode
      4. 7.4.4 Power-Down Mode
      5. 7.4.5 Reset
        1. 7.4.5.1 RESET Pin
        2. 7.4.5.2 Reset by SPI Register Write
        3. 7.4.5.3 Reset by SPI Input Pattern
      6. 7.4.6 Synchronization
        1. 7.4.6.1 Synchronized Control Mode
        2. 7.4.6.2 Start/Stop Control Mode
        3. 7.4.6.3 One-Shot Control Mode
      7. 7.4.7 Conversion-Start Delay Time
      8. 7.4.8 Calibration
        1. 7.4.8.1 OFFSET2, OFFSET1, OFFSET0 Calibration Registers (Addresses 0Ch, 0Dh, 0Eh)
        2. 7.4.8.2 GAIN2, GAIN1, GAIN0 Calibration Registers (Addresses 0Fh, 10h, 11h)
        3. 7.4.8.3 Calibration Procedure
    5. 7.5 Programming
      1. 7.5.1 Serial Interface (SPI)
        1. 7.5.1.1  Chip Select (CS)
        2. 7.5.1.2  Serial Clock (SCLK)
        3. 7.5.1.3  Serial Data Input (SDI)
        4. 7.5.1.4  Serial Data Output/Data Ready (SDO/DRDY)
        5. 7.5.1.5  SPI Frame
        6. 7.5.1.6  Full-Duplex Operation
        7. 7.5.1.7  Device Commands
          1. 7.5.1.7.1 No-Operation
          2. 7.5.1.7.2 Read Register Command
          3. 7.5.1.7.3 Write Register Command
        8. 7.5.1.8  Read Conversion Data
          1. 7.5.1.8.1 Conversion Data
          2. 7.5.1.8.2 Data Ready
            1. 7.5.1.8.2.1 DRDY
            2. 7.5.1.8.2.2 SDO/DRDY
            3. 7.5.1.8.2.3 DRDY Bit
            4. 7.5.1.8.2.4 Clock Counting
          3. 7.5.1.8.3 STATUS Byte
        9. 7.5.1.9  Daisy-Chain Operation
        10. 7.5.1.10 3-Wire SPI Mode
          1. 7.5.1.10.1 3-Wire SPI Mode Frame Reset
        11. 7.5.1.11 SPI CRC
      2. 7.5.2 Register Memory CRC
        1. 7.5.2.1 Main Program Memory CRC
        2. 7.5.2.2 FIR Filter Coefficient CRC
        3. 7.5.2.3 IIR Filter Coefficient CRC
  9. 8 Register Map
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 SPI Operation
      2. 9.1.2 Input Driver
      3. 9.1.3 Antialias Filter
      4. 9.1.4 Reference Voltage
      5. 9.1.5 Simultaneous-Sampling Systems
    2. 9.2 Typical Applications
      1. 9.2.1 A-Weighting Filter Design
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curve
      2. 9.2.2 PGA855 Programmable Gain Amplifier
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
        3. 9.2.2.3 Application Curves
      3. 9.2.3 THS4551 Antialias Filter Design
        1. 9.2.3.1 Design Requirements
        2. 9.2.3.2 Detailed Design Procedure
        3. 9.2.3.3 Application Curves
    3. 9.3 Power Supply Recommendations
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 ドキュメントの更新通知を受け取る方法
    3. 10.3 サポート・リソース
    4. 10.4 Trademarks
    5. 10.5 静電気放電に関する注意事項
    6. 10.6 用語集
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

6.3 Gain Error Measurement

Gain error is defined as the difference between the actual and the ideal slopes of the ADC transfer function. Gain error is measured by applying dc test voltages at –95% and 95% of FSR. The error is calculated by subtracting the difference of the dc test voltages (ideal slope) from the difference in the ADC output voltages (actual slope). The difference in the slopes is divided by the ideal slope and multiplied by 106 to convert the error to ppm of FSR. Error resulting from the ADC reference voltage is excluded from the gain error measurement. The gain error is specified at TA = 25°C. Equation 12 shows the calculation of gain error:

Equation 2. Gain Error (ppm of FSR) = 106 · (ΔVOUT – ΔVIN) / ΔVIN

where:

  • ΔVOUT = Difference of two ADC output voltages
  • ΔVIN = Difference of two input test voltages