JAJU878 November   2022 ADS117L11 , ADS127L11

 

  1.   概要
  2.   リソース
  3.   特長
  4.   アプリケーション
  5.   5
  6. 1System Description
    1. 1.1 Key System Specification
  7. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
      1. 2.2.1 Signal-Chain Voltage Levels
        1.       12
      2. 2.2.2 ADC Configuration
      3. 2.2.3 ADC Clocking and Synchronization
      4. 2.2.4 Differential Low-Pass Filter
      5. 2.2.5 Current Source
      6. 2.2.6 Gain Stage and High-Pass Filter
    3. 2.3 Highlighted Products
      1. 2.3.1 ADS127L11
      2. 2.3.2 THS4551
  8. 3System Design Theory
    1. 3.1 IEPE Sensor
      1. 3.1.1 IEPE Sensor Parameters
        1. 3.1.1.1 Sensitivity and Measurement Range
        2. 3.1.1.2 Excitation, Output Bias Voltage, and Output Impedance
        3. 3.1.1.3 Linearity and Temperature Variance
        4. 3.1.1.4 Frequency Response
        5. 3.1.1.5 Noise and Dynamic Range
  9. 4Hardware, Software, Testing, and Test Results
    1. 4.1 Hardware Description
      1. 4.1.1 Board Interface
      2. 4.1.2 Power Configuration
        1. 4.1.2.1 Power Sequence
        2. 4.1.2.2 Analog Supply
        3. 4.1.2.3 Digital Supply
        4. 4.1.2.4 Excitation Current Supply
        5. 4.1.2.5 SPI Connectivity Modes and Their Assembly Variants
          1. 4.1.2.5.1 Daisy-Chain Mode
          2. 4.1.2.5.2 Parallel SDO Mode
          3. 4.1.2.5.3 Parallel SDI Mode and Parallel SDO Mode
          4. 4.1.2.5.4 Clocking Modes
    2. 4.2 Software Requirements
    3. 4.3 Test Setup and Procedure
      1. 4.3.1 Noise Floor and SNR
      2. 4.3.2 Gain and Input Range
      3. 4.3.3 Crosstalk
      4. 4.3.4 Total Harmonic Distortion
      5. 4.3.5 Clock Image Rejection
      6. 4.3.6 Synchronization of the ADCs
      7. 4.3.7 Fault Detection Circuit
    4. 4.4 Test Results
      1. 4.4.1 Noise Floor and Dynamic Range
      2. 4.4.2 Gain and Input Range
      3. 4.4.3 Crosstalk
      4. 4.4.4 Total Harmonic Distortion
      5. 4.4.5 Clock Image Rejection
      6. 4.4.6 Synchronization of the ADCs
      7. 4.4.7 Fault Detection Circuit
      8. 4.4.8 Test With Actual IEPE Sensor
      9. 4.4.9 Measurement Results Summary
  10. 5Design and Documentation Support
    1. 5.1 Design Files
      1. 5.1.1 Schematics
      2. 5.1.2 BOM
    2. 5.2 Software
    3. 5.3 Documentation Support
    4. 5.4 サポート・リソース
    5. 5.5 Trademarks
  11. 6About the Author

4.3.5 Clock Image Rejection

Use the following steps to evaluate the signal-chain image rejection:

  • Use a high-frequency sinusoidal source (able to produce clean 16-MHz signal)
  • Set the source with fin = 16.002 MHz and –6 dBFS
  • Capture ADC data in frequency-domain view. The highest spur is monitored in the noise spectrum and image rejection is calculated as the image spur referred to the input level. (A good target is for the spur to be 2 kHz, but complex intermodulation can result in different tones.)