SBAK019A July 2024 – November 2024 ADC3683-SP
- 1
- 2
- Trademarks
- 1 Introduction
- 2 Single-Event Effects
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- 11References
- 12Revision History
8.1 Single Event Transients
SETs are defined as heavy-ion-induced transients upsets on the DCLK of the ADC3683-SP. SET testing was performed at room temperature with no external temperature control applied. DCLK SEUs were characterized using a positive edge trigger. The devices were characterized with input voltages AVDD/IOVDD = 1.85V. To capture the event, the NI-PXI-5172 Scope Card was continuously monitoring the DCLK. The DCLK was monitored by using USER_LED3 that is located on the TSW1400EVM. The scope was attached to the LED which goes high upon because the FPGA was not receiving a valid clock signal. The scope triggering from DCLK was programmed to record 20K samples with a sample rate of 5M samples per second (S/s) in case of an event (trigger).
The scope was programmed to record 20% of the data before (pre-) the trigger happened. Events were seen on DCLK. The results were analyzed and categorized into short and long events based on DCLK recovery time. A short event is defined by a transient, which lasted less than 500ns while a long event lasts more than 500ns. An example of the events are shown Figure 8-2 and Figure 8-1. Table 8-1 lists the SET test condition and results for all the data.
| Run Number | Run Type | Unit Number | Temp | Ion | Angle | LETEFF (MeV.cm2/mg) | Flux (ions·cm2/s) | Fluence (ions·cm2) | Count DCLK Events | Count of Short Events | Count of Long Events |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 1 | SEU | 1 | Room | 141Pr | 30 | 78.67 | 1.00 × 104 | 1.00 × 106 | 14 | 8 | 6 |
| 2 | SEU | 1 | Room | 141Pr | 30 | 78.67 | 1.00 × 102 | 1.00 × 105 | 1 | 0 | 1 |
| 3 | SEU | 1 | Room | 141Pr | 0 | 67.45 | 1.00 × 104 | 1.00 × 106 | 8 | 5 | 3 |
| 4 | SEU | 1 | Room | 141Pr | 0 | 67.45 | 1.00 × 102 | 1.00 × 105 | 1 | 1 | 0 |
| 5 | SEU | 1 | Room | 109Ag | 30 | 59.82 | 1.00 × 105 | 1.00 × 107 | 114 | 82 | 32 |
| 6 | SEU | 1 | Room | 109Ag | 30 | 59.82 | 1.00 × 104 | 1.00 × 106 | 7 | 6 | 1 |
| 7 | SEU | 1 | Room | 109Ag | 30 | 59.82 | 1.00 × 102 | 1.00 × 105 | 1 | 0 | 1 |
| 8 | SEU | 1 | Room | 109Ag | 0 | 51.12 | 1.00 × 102 | 1.00 × 105 | 1 | 1 | 0 |
| 9 | SEU | 1 | Room | 109Ag | 0 | 51.12 | 1.00 × 104 | 1.00 × 106 | 6 | 4 | 2 |
| 10 | SEU | 1 | Room | 63Cu | 0 | 21.44 | 1.00 × 102 | 1.00 × 105 | 3 | 1 | 2 |
| 11 | SEU | 1 | Room | 63Cu | 0 | 21.44 | 1.00 × 104 | 1.00 × 106 | 5 | 5 | 0 |
| 12 | SEU | 1 | Room | 63Cu | 0 | 21.44 | 1.00 × 105 | 1.00 × 107 | 50 | 43 | 7 |
Figure 8-1 Example of a Short Event from Run 12
Figure 8-2 Example of a Long Event from Run 12
Figure 8-3 FFT Capture of Nominal Operating Conditions