SBAK019A July   2024  – November 2024 ADC3683-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14. 11References
  15. 12Revision History

7.1 Single-Event Latch-Up (SEL) Results

During SEL characterization, the device was heated using forced hot air, maintaining the DUT temperature at 125°C. The die temperature was monitored prior to radiation using a FLIR IR-camera.

The species used for the SEL testing was Praseodymium (141Pr) ion with an angle-of-incedence of 30° for an LETEFF = 79MeV×cm2/ mgm. Flux of 105 ions / cm2× s and a fluence of 107 ions/cm2 were used for the three runs. Run duration to achieve this fluence was less than two minutes. The device was powered up and exposed to the heavy-ions using voltages up to 1.9V, with 1.85V being the maximum recommended operating voltage. No SEL events were observed during all three runs, indicating that the ADC3683-SP is SEL-free. Table 7-1 shows the SEL test conditions and results. Figure 7-1 shows a typical plot of current versus time for an SEL testing.

Table 7-1 Summary of ADC3683-SP SEL Test Condition and Results
Run NumberTemperatureLETEFF (MeV × cm2/mg)Flux (ions × cm2/s)Fluence (ions × cm2)AVDD/IOVDD (V)
1Room temperature, approximately 25°C51.121.85 × 1041.00 × 1071.9
2125°C51.121.80 × 1041.00 × 1071.9
3125°C78.671.53 × 1041.00 × 1071.9
4125°C78.671.62 × 1041.00 × 1071.9
5125°C78.671.00 × 1051.00 × 1071.85
6125°C78.671.00 × 1051.00 × 1071.85
7125°C78.671.00 × 1051.00 × 1071.9

8

125°C

78.36

1.00 × 105

1.50 × 107

1.9

ADC3683-SP Current Versus Time for ADC3683-SP at T = 125°CFigure 7-1 Current Versus Time for ADC3683-SP at T = 125°C