SBAK019A July   2024  – November 2024 ADC3683-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14. 11References
  15. 12Revision History

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the ADC3683-SP. Heavy-ions with LETEFF (Effective Linear Energy Transfer) of up to 79MeV × cm2/ mg were used to irradiate the device. Tests were run across a range of flux and fluences for the characterization. Flux was between 102 ions / (cm2 × s) and 105 ions / (cm2 × s) and fluence between 105 ions / cm2 and 107 ions / cm2 per run. The results demonstrated that the ADC3683-SP is single event latch-up free at T = 125°C. Single event upsets are characterized at 25°C and no functional interrupts (power-cycle events) were seen up to 79MeV × cm2/ mg. See Section 8 for more details.