SBAK019A July   2024  – November 2024 ADC3683-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
  11. 8 Single-Event Transients (SET)
    1. 8.1 Single Event Transients
  12. 9 Event Rate Calculations
  13. 10Summary
  14. 11References
  15. 12Revision History

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the Single-Event-Effect (SEE) performance of the ADC3683-SP. Heavy-ions with LETEFF up to 79MeV × cm2/ mg were used for the SEE test campaign. Flux of up to 105ions / cm2× s and fluences up to 107 ions / cm2 per run were used for the characterization. The SEE results demonstrated that the ADC3683-SP is SEL and SEFI free up to LETEFF = 79MeV × cm2/ mg. The device is characterized for SETs up to LETEFF = 79MeV × cm2/ mg. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits are presented for reference.