SBAS897C March 2018 – June 2022 AMC1311-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tr | Output signal rise time | 1.3 | µs | |||
tf | Output signal fall time | 1.3 | µs | |||
IN to OUTx signal delay (50% – 10%) | Unfiltered output, AMC1311-Q1 | 1.5 | 2.5 | µs | ||
Unfiltered output, AMC1311B-Q1 | 1.0 | 1.5 | ||||
IN to OUTx signal delay (50% – 50%) | Unfiltered output, AMC1311-Q1 | 2.1 | 3.1 | µs | ||
Unfiltered output, AMC1311B-Q1 | 1.6 | 2.1 | ||||
IN to OUTx signal delay (50% – 90%) | Unfiltered output, AMC1311-Q1 | 3.0 | 4.0 | µs | ||
Unfiltered output, AMC1311B-Q1 | 2.5 | 3.0 | ||||
tAS | Analog settling time | VDD1 step to 3.0 V with VDD2 ≥ 3.0 V, to VOUTP, VOUTN valid, 0.1% settling | 50 | 100 | µs | |
tEN | Device enable time | SHTDN high to low | 50 | 100 | µs | |
tSHTDN | Device shutdown time | SHTDN low to high | 3 | 10 | µs |