SBOK092 December   2024 OPA4H199-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

8 Single-Event Transients (SET)

The OPA4H199-SP was characterized for SETs from 2.71MeV-cm2 /mg to 65MeV-cm2 /mg (Table 8-3 provides more information) at 40V supply voltage. The device was tested at room temperature for all SETs runs. OPA4H199-SP devices were thinned for proper heavy-ion penetration into the active circuits. Average flux of 105 ions/cm2-s and fluences of 107 ions/cm2 per run were used during the heavy ion characterization. The devices were tested under static (DC) inputs. The SETs discussed on this report were defined as output voltages excursion that exceed a window trigger set on the DPO7104C. The OPA4H199-SP was connected to a 40V supply and configured as a buffer with the comomon-mode input voltage set to 20V (midsupply). The output voltage was monitored directly to detect events. Test conditions used during the testing are provided in Table 8-3. Positive and negative upsets excursions were observed under DC test. The events were divided into short events and long events, based on the length of their duration before resolving back to the expected value. Figure 8-2 and Figure 8-2 are examples of long SET events. Figure 8-2 and Figure 8-2 are examples of long SET events. For each upset the maximum, minimum and transient recovery time was recorded. Weibull-Fit and cross section for the DC tests are shown in Figure 8-1 and Figure 8-2. The Weibull equation used for the fit is shown in Equation 1, and parameters are provided in Table 8-2. To calculate the cross section values at the different supply voltages the total number of upsets (or transients) and the fluences where combined (add together) by LETEFF to calculate the upper bound cross section (as discussed in Appendix B) at 95% confidence interval. The σPERCASE cross section presented on the summary tables, was calculated using the MTBF method at 95%.

Table 8-1 Summary of OPA4H199-SP SET Test Condition and Results
Run # Unit # ION LETEFF (MeV × cm2/mg) Distance (mm) FLUX (ions × cm2/mg) Fluence (Number ions) Temperature (°C) # of Long Events # of Short Events
20 6 141Pr 65 50 1.15 × 105 1.10 × 107 25 67 161
33 6 109Ag 51 75 1.08 × 105 9.95 × 106 25 54 265
34 6 109Ag 47 40 1.06 × 105 9.96 × 106 25 29 272
41 6 84Kr 32 75 1.09 × 105 1.00 × 107 25 31 277
42 6 63Cu 19 30 1.01 × 105 9.97 × 106 25 24 246
49 6 40Ar 8 30 1.01 × 105 1.00 × 107 25 14 95
50 6 20Ne 3 30 1.17 × 105 1.00 × 107 25 3 21
OPA4H199-SP OPA4H199-SP Long SET Cross Section and Weibull-Fit Figure 8-1 OPA4H199-SP Long SET Cross Section and Weibull-Fit
OPA4H199-SP OPA4H199-SP Short SET Cross Section and Weibull-Fit Figure 8-2 OPA4H199-SP Short SET Cross Section and Weibull-Fit
Equation 1. σ   = σ S A T ×   1 - e L E T   -   O n s e t W s
Table 8-2 Weibull-FIT Parameters for DC Test
Parameter Long Short
Onset (MeV-cm2/mg)

1.53

 0.90
σSAT (cm2) 6.09 × 10-6 2.76 × 10-5
W

31.23

 13.14
s

0.94

 1.06
OPA4H199-SP OPA4H199-SP Long SET Event Example (up) Figure 8-3 OPA4H199-SP Long SET Event Example (up)
OPA4H199-SP OPA4H199-SP Long SET Event Example (down) Figure 8-4 OPA4H199-SP Long SET Event Example (down)
OPA4H199-SP OPA4H199-SP Short SET Event Example (up) Figure 8-5 OPA4H199-SP Short SET Event Example (up)
OPA4H199-SP OPA4H199-SP Short SET Event Example (down) Figure 8-6 OPA4H199-SP Short SET Event Example (down)