SBOS974E August   2019  – October 2024

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics VS = 12 V
    6. 5.6 Electrical Characteristics VS = 32 V
    7. 5.7 Timing Requirements
    8. 5.8 Typical Characteristics: VS = 12 V
    9. 5.9 Typical Characteristics: VS = 32 V
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Common-Mode Buffer
      2. 6.3.2 Thermal Protection and Package Power Dissipation
      3. 6.3.3 Output Voltage and Current Drive
      4. 6.3.4 Breakdown Supply Voltage
      5. 6.3.5 Surge Test Results
    4. 6.4 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 Broadband PLC Line Driving
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Design Procedure
        3. 7.2.1.3 Application Curve
    3. 7.3 Best Design Practices
      1. 7.3.1 Do
      2. 7.3.2 Do Not
    4. 7.4 Power Supply Recommendations
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
        1. 7.5.1.1 Wafer and Die Information
      2. 7.5.2 Layout Examples
  9. 8 Device and Documentation Support
    1. 8.1 Development Support
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

6.3.4 Breakdown Supply Voltage

To estimate the margin beyond the maximum supply voltage specified in the Absolute Maximum Ratings table and exercise the robustness of the device, several typical units were tested beyond the specifications in the Absolute Maximum Ratings table. Figure 6-5 shows the configuration used for the test. The supply voltage, VS, was swept manually and quiescent current was recorded at each 0.5-V supply voltage increment. Figure 6-6 shows the results of the single-supply voltage where the typical units started breaking. Under a similar configuration as the one shown in Figure 6-5, a unit was subjected to VS = 42 V for 168 hours and tested for quiescent current at the beginning and at the end of the test. There was no notable difference in the quiescent current before and after the 168 hours of testing and the device did not show any signs of damage or abnormality.

The primary objective of these tests was to estimate the margins of robustness for typical devices and does not imply performance or maximum limits beyond those specified in the Absolute Maximum Ratings and Recommended Operating Conditions tables.

THS6222 Breakdown Supply Voltage Test ConfigurationFigure 6-5 Breakdown Supply Voltage Test Configuration
THS6222 Typical Device Breakdown Supply Voltage (TA = 27°C)Figure 6-6 Typical Device Breakdown Supply Voltage (TA = 27°C)