SCLK040 December   2023 SN54SC4T32-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data

2.3.1 Bias Diagram

Figure 2-1 shows the bias conditions for each pin during irradiation.

GUID-20231108-SS0I-XL9S-SLDP-1VQFQQSHNBV7-low.jpgFigure 2-1 SN54SC4T32-SEP Bias Diagram